Characterization of synchrotron radiation source properties using a single-grating interferometer

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XUE Lian; ZHANG Haipeng; SI Shangyu; LI Zhongliang

doi:10.7498/aps.74.20250824

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XUE Lian, ZHANG Haipeng, SI Shangyu, LI Zhongliang. Characterization of synchrotron radiation source properties using a single-grating interferometerJ. Acta Physica Sinica, 2025, 74(20): 200702. DOI: 10.7498/aps.74.20250824

Citation:

XUE Lian, ZHANG Haipeng, SI Shangyu, LI Zhongliang. Characterization of synchrotron radiation source properties using a single-grating interferometerJ. Acta Physica Sinica, 2025, 74(20): 200702. DOI: 10.7498/aps.74.20250824

Citation:

XUE Lian, ZHANG Haipeng, SI Shangyu, LI Zhongliang. Characterization of synchrotron radiation source properties using a single-grating interferometerJ. Acta Physica Sinica, 2025, 74(20): 200702. DOI: 10.7498/aps.74.20250824