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Hua Ying-Xin, Chen Xiao-Hui, Li Jun, Hao Long, Sun Yi, Wang Yu-Feng, Geng Hua-Yun.In situX-ray diffraction measurement of shock melting in vanadium. Acta Physica Sinica, 2022, 71(7): 076201.doi:10.7498/aps.71.20212065 |
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Wang Bi-Han, Li Bing, Liu Xu-Qiang, Wang Hao, Jiang Sheng, Lin Chuan-Long, Yang Wen-Ge.Millisecond time-resolved synchrotron radiation X-ray diffraction and high-pressure rapid compression device and its application. Acta Physica Sinica, 2022, 71(10): 100702.doi:10.7498/aps.71.20212360 |
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Yang Jun-Liang, Li Zhong-Liang, Li Tang, Zhu Ye, Song Li, Xue Lian, Zhang Xiao-Wei.Characteristics of multi-crystals monfiguration X-ray diffraction and application in characterizing synchrotron beamline bandwidth. Acta Physica Sinica, 2020, 69(10): 104101.doi:10.7498/aps.69.20200165 |
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Fan Jia-Dong, Jiang Huai-Dong.Coherent X-ray diffraction imaging and its applications in materials science and biology. Acta Physica Sinica, 2012, 61(21): 218702.doi:10.7498/aps.61.218702 |
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Li Hong-Tao, Luo Yi, Xi Guang-Yi, Wang Lai, Jiang Yang, Zhao Wei, Han Yan-Jun, Hao Zhi-Biao, Sun Chang-Zheng.Thickness measurement of GaN films by X-ray diffraction. Acta Physica Sinica, 2008, 57(11): 7119-7125.doi:10.7498/aps.57.7119 |
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WANG YU-TIAN, ZHUANG YAN, JIANG DE-SHENG, YANG XIAO-PING, JIANG XIAO-MING, WU JIA-YANG, XIU LI-SONG, ZHENG WEN-LI.STUDY OF DOUBLE-BARRIER SUPERLATTICE BY SYNCHROTRON RADIATION AND DOUBLE-CRYSTAL X-RAY DIFFRACTION. Acta Physica Sinica, 1996, 45(10): 1709-1716.doi:10.7498/aps.45.1709 |
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PENG LIAN-MAO, REN GANG.THE ANALYTIC DOYLE-TURNER REPRESENTATION OF HIGH ENERGY ELECTRON ABSORPTIVE STRUCTURE FACTORS. Acta Physica Sinica, 1996, 45(8): 1344-1349.doi:10.7498/aps.45.1344 |
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HE XIAN-CHANG, WU ZI-QIN, ZHAO TE-XIU, Lü ZHI-HUI, WANG XIAO-PING, SUN GUO-XI.INVESTIGATION OF LATTICE DEFORMATION OF POROUS SILICON FILMS BY X-RAY DOUBLE CRYSTAL DIFFRACTION. Acta Physica Sinica, 1993, 42(6): 954-962.doi:10.7498/aps.42.954 |
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LI JIAN-HUA, MAI ZHEN-HONG, CUI SHU-FAN.X-RAY DOUBLE-CRYSTAL DIFFRACTION AND TOPOGRAPHY STUDY OF STRAIN RELAXED InGaAs/GaAs SUPERLATTICES. Acta Physica Sinica, 1993, 42(9): 1485-1490.doi:10.7498/aps.42.1485 |
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YANG PING.BEHAVIOUR OF X-RAY DIFFRACTION FROM UNIFORMLY BENT Si CRYSTAL. Acta Physica Sinica, 1992, 41(2): 267-271.doi:10.7498/aps.41.267 |
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MAI ZHEN-HONG, GUI SHU-FAN, WANG CHAO-YING, WU LAN-SHENG.STUDY OF AlGaAs/GaAs WAVEGUIDE STRUCTURE BY X-RAY DOUBLE CRYSTAL DIFFRACTION. Acta Physica Sinica, 1991, 40(6): 969-977.doi:10.7498/aps.40.969 |
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ZHU NAN-CHANG, LI RUN-SHEN, CHEN JING-YI, XU SHUN-SHENG.INVESTIGATION OF THE SURFACE DISTORTED CRYSTALS BY DYNAMICAL X-RAY DOUBLE-CRYSTAL DIFFRACTION. Acta Physica Sinica, 1990, 39(5): 770-777.doi:10.7498/aps.39.770 |
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ZHANG JIAN-ZHONG, CAO YAN-NI.SIMULATION STUDY OF DIVERGENT BEAM X-RAY DIFFRACTION BY CRYSTALS. Acta Physica Sinica, 1990, 39(1): 124-128.doi:10.7498/aps.39.124 |
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MA DE-LU, SHANG DE-YING, YU JIN-HUA.XRD STUDY OF N2+ IMPLANTED Si. Acta Physica Sinica, 1989, 38(4): 579-585.doi:10.7498/aps.38.579 |
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JIANG XIAO-MING, WU ZI-QIN, QIAN LIN-ZHAO.X-RAY HUANG DIFFUSE SCATTERING FROM DEFECTS IN γ IRRADIATED LiF CRYSTAL. Acta Physica Sinica, 1989, 38(4): 529-533.doi:10.7498/aps.38.529 |
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JIANG XIAO-MING, WU ZI-QIN.SIMULATION OF X-RAY DIFFRACTION PEAK PROFILE OF ONE DIMENSIONAL FIBONACCI SERIES. Acta Physica Sinica, 1988, 37(11): 1900-1905.doi:10.7498/aps.37.1900 |
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SUN ZhANG-DE.SOLVING THE EQUATION OF X-RAY DIFFRACTION BY GREEN'S FUNCTION. Acta Physica Sinica, 1983, 32(8): 982-989.doi:10.7498/aps.32.982 |
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XU JI-AN, HU JING-ZHU.X-RAY DIFFRACTION UNDER HIGH PRESSURE. Acta Physica Sinica, 1977, 26(6): 521-525.doi:10.7498/aps.26.521 |
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SHAW NAN, LIU YI-HUAN.X-RAY MEASUREMENT OF THE THERMAL EXPANSION OF GERMANIUM, SILICON, INDIUM ANTIMONIDE AND GALLIUM ARSENIDE. Acta Physica Sinica, 1964, 20(8): 699-704.doi:10.7498/aps.20.699 |
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CHEN CHI.THE INFLUENCE OF WORKING CONDITIONS OF X-RAY DIFFRACTOMETER ON THE POSITION OF THE CENTRE OF GRAVITY,THE MEAN-SQUARE WIDTH AND THE PROFILE OF INTERFERENCE LINES. Acta Physica Sinica, 1961, 17(10): 465-481.doi:10.7498/aps.17.465 |
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