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Ding Zhao, Wei Jun, Yang Zai-Rong, Luo Zi-Jiang, He Ye-Quan, Zhou Xun, He Hao, Deng Chao-Yong.Study on temperature calibration and surface phase transition of GaAs crystal substrate in MBE growth by RHEED real-time monitoring. Acta Physica Sinica, 2011, 60(1): 016109.doi:10.7498/aps.60.016109 |
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Liang Wen-Xi, Zhu Peng-Fei, Wang Xuan, Nie Shou-Hua, Zhang Zhong-Chao, Cao Jian-Ming, Sheng Zheng-Ming, Zhang Jie.Development and optimization on spatiotemporal resolution of ultrafast electron diffraction. Acta Physica Sinica, 2009, 58(8): 5539-5545.doi:10.7498/aps.58.5539 |
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Tian Jin-Shou, Zhao Bao-Sheng, Wu Jian-Jun, Zhao Wei, Hou Xun, Liu Yun-Quan, Zhang Jie.Transfer property of electron pulse in a femto-second electron diffraction system. Acta Physica Sinica, 2007, 56(1): 123-128.doi:10.7498/aps.56.123 |
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Liu Yun-Quan, Liang Wen-Xi, Zhang Jie, Wu Jian-Jun, Tian Jin-Shou, Wang Jun-Feng, Zhao Bao-Sheng.Static properties of a femtosecond electron diffraction system. Acta Physica Sinica, 2006, 55(12): 6500-6505.doi:10.7498/aps.55.6500 |
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Xu Peng-Shou, Deng Rui, Pan Hai-Bin, Xu Fa-Qiang, Xie Chang-Kun, Li Yong-Hua, Liu Feng-Qin, K. Yibulaxin.Photoelectron diffraction study on the polarity of GaN surface. Acta Physica Sinica, 2004, 53(4): 1171-1176.doi:10.7498/aps.53.1171 |
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GUI QIAN, HUANG QI, CHEN HONG, ZHOU JUN-MING.Si AND GexSi1-x GROWTH MODE STUDY BY RHEED ON H-TERMINATED VICINAL Si SUBSTRATE. Acta Physica Sinica, 1996, 45(4): 647-654.doi:10.7498/aps.45.647 |
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ZHAO RU-GUANG, YANG WEI-SHENG.TUNABLE-SAMPLING-DEPTH ELECTRON ENERGY LOSS SPECTROSCOPY AND AUGER ELECTRON SPECTROSC-OPY STUDIES OF Pb/Ni(001) INTERFACE. Acta Physica Sinica, 1992, 41(7): 1125-1131.doi:10.7498/aps.41.1125 |
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JIA JIN-FENG, LI YAN-FANG, ZHAO RU-GUANG, YANG WEI-SHENG.AN IMPROVED KLEED/CMTA METHOD AND ITS APPLICATION ON Cu(001)1×1 SURFACE. Acta Physica Sinica, 1992, 41(5): 819-826.doi:10.7498/aps.41.819 |
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CHEN KE-MING, JIN GAO-LONG, SHENG CHI, ZHOU GAO-LIANG, JIANO WEI-DONG, ZHANG XIANG-JIU, YU MING-REN.RHEED INTENSITY OSCILLATIONS IN THE PROCESS OF MOLECULAR BEAM EPITAXY GROWTH OF Ge AND Si ON Si SUBSTRATES. Acta Physica Sinica, 1990, 39(2): 237-244.doi:10.7498/aps.39.237 |
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WU BAI-MEI, CHEN ZHAO-JIA, BAO SHI-NING, BAO DE-SONG, JI ZHEN-GUO, LIU GU.UPS STUDIES OF Nb-Ni GLASSES DURING CRYSTALLIZATION. Acta Physica Sinica, 1989, 38(4): 675-678.doi:10.7498/aps.38.675 |
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FENG GUO-GUANG.CONVERGENT-BEAM ELECTRON DIFFRACTION STUDY OF TRANSVERSE BASAL STACKING FAULTS IN LAYER STRUCTURES. Acta Physica Sinica, 1986, 35(2): 274-278.doi:10.7498/aps.35.274 |
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FENG GUO-GUANG.CONVERGENT-BEAM ELECTRON DIFFRACTION STUDY OF DISLOCATIONS. Acta Physica Sinica, 1986, 35(2): 279-282.doi:10.7498/aps.35.279 |
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FENG KE-AN, HUANG YI, TANG JING-CHANG.STUDIES OF FOURIER-TRANSFORM ANALYSIS METHOD FOR ENERGY-DEPENDENT PHOTOELECTRON DIFFRACTION (II)——THE SYSTEMS OF Se-Ni (111) AND S-Ni(111). Acta Physica Sinica, 1986, 35(4): 467-474.doi:10.7498/aps.35.467 |
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FENG GUO-GUANG.A NEW METHOD FOR OBTAINING LARGE-ANGLE CONVERGENT-BEAM ELECTRON DIFFRACTION. Acta Physica Sinica, 1984, 33(9): 1287-1290.doi:10.7498/aps.33.1287 |
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HE YUAN-JIN, CAO BI-SONG.THE FOURIER TRANSFORM METHOD FOR THE ANALYSIS OF POSITRON LIFETIME SPECTRA. Acta Physica Sinica, 1984, 33(12): 1745-1752.doi:10.7498/aps.33.1745 |
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TANG JING-CHANG, S. Y. TONG.NORMAL ONE BEAM MODEL FOR FOURIER TRANSFORM ANALYSIS METHOD OF PHOTOELECTRON DIFFRACTION SPECTRUM. Acta Physica Sinica, 1984, 33(3): 362-369.doi:10.7498/aps.33.362 |
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LI FANG-HUA, WANG YIN-JUN, GAO JUN-JIE, TENG CHEN-MING, CHANG LONG-CUN.ELECTRON DIFFRACTION INVESTIGATION OF AMORPHOUS Gd-Co ALLOY FILMS. Acta Physica Sinica, 1980, 29(2): 199-204.doi:10.7498/aps.29.199 |
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LI CHUN-ZHI.A USEFUL METHOD FOR INDEXING ELECTRON DIFFRACTION PATTERNS. Acta Physica Sinica, 1979, 28(3): 314-323.doi:10.7498/aps.28.314 |
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WU CHUAN-TEH.INITIAL ENERGY DISTRIBUTION AND ANGULAR DISTRIBUTION OF PHOTOELECTRONS. Acta Physica Sinica, 1958, 14(2): 139-152.doi:10.7498/aps.14.139 |
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