Temperature dependence of the electrical resistivity of Fe100-xBx,Fe87-xSixB13,(Fe1-xCox)78Si9.5B12.5,(Fe1-xMx)80-84B16-20(M = Zr, V, Nb, Ta, Cr, Mo, W, Mn) amorphous alloys in the range of 4.2-300 K has been studied in this work. The experimental results demonstrated that the resistivity minima phenomena appear in all these samples. The temperature of resistivity minim Tmin increases with increaing Si or B content in the amorphous FeB and FeSiB alloys. It has been shown that as transition metal elements on the right of Fe in the periodic table are added to the Febased amorphous alloys, lower Tmin are observed, and on the other hand, as transition elements on the left of Fe are added, Tmin are shift to higher temperatures. The dependence of the added elements on Tmin of the Febased amorphous alloys shows clear regularities. Below temperature Tmin, their resistivty can be described by alogarithmic temperature dependence and a discussion of this phenomenon is given in terms of the Kondo-like scattering. Above Tmin, a T2 temperature dependence of resistivity can be explained by extended Zi-man theory for FeB, FeSiB and FeCoSiB amorphous alloys and may be originated from both, electron-phonon and localized spin-fluctuation scattering for the Fe-based amorphous alloys with addition of transition elements on the left of Fe.