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Ge Zhen-Jie, Su Xu, Bai Li-Hua.Nonsequential double ionization of Ar atoms in counter-rotating two-color elliptically polarized laser fields. Acta Physica Sinica, 2024, 73(9): 093201.doi:10.7498/aps.73.20231583 |
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Liang Ling-Ling, Zhao Yan, Feng Chao.Fabrication and ultraviolet-visible-near infrared absorption properties of silver nano arrays based on aluminum. Acta Physica Sinica, 2020, 69(6): 065201.doi:10.7498/aps.69.20191522 |
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Zhang Jin-Fang, Ren Ya-Na, Wang Jun-Min, Yang Bao-Dong.Investigation of the two-color polarization spectroscopy between the excited states based on cesium atoms. Acta Physica Sinica, 2019, 68(11): 113201.doi:10.7498/aps.68.20181872 |
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Wang Pan-Pan, Zhang Yu-Zhi, Peng Ming-Dong, Zhang Yun-Long, Wu Ling-Nan, Cao Yun-Zhen, Song Li-Xin.Spectroscopic ellipsometry analysis of vanadium oxide film in Vis-NIR and NIR-MIR. Acta Physica Sinica, 2016, 65(12): 127201.doi:10.7498/aps.65.127201 |
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Zhou Ya, Wu Zheng-Mao, Fan Li, Sun Bo, He Yang, Xia Guang-Qiong.Two channel photonic microwave generation based on period-one oscillations of two orthogonally polarized modes in a vertical-cavity surface-emitting laser subjected to an elliptically polarized optical injection. Acta Physica Sinica, 2015, 64(20): 204203.doi:10.7498/aps.64.204203 |
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Chen Ren-Gang, Deng Jin-Xiang, Chen Liang, Kong Le, Cui Min, Gao Xue-Fei, Pang Tian-Qi, Miao Yi-Ming.Spectroscopic ellipsometry study of the Zn3N2 films prepared by radio-frequency sputtering. Acta Physica Sinica, 2014, 63(13): 137701.doi:10.7498/aps.63.137701 |
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Liu Chao, Cen Zhao-Feng, Li Xiao-Tong, Xu Wei-Cai, Shang Hong-Bo, Neng Fen, Chen Li.Ray ellipse method of analyzing the power and polarization state of partially polarized light. Acta Physica Sinica, 2012, 61(13): 134201.doi:10.7498/aps.61.134201 |
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Yu Ben-Hai, Li Ying-Bin, Tang Qing-Bin.The nonsequential double ionization of argon atoms with elliptically polarized laser pulse. Acta Physica Sinica, 2012, 61(20): 203201.doi:10.7498/aps.61.203201 |
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Ma Jiao-Min, Liang Yan, Gao Xiao-Yong, Chen Chao, Zhao Meng-Ke, Lu Jing-Xiao.Spectroscopic ellipsometry study of the Ag2O film deposited by radio-frequency reactive magnetron sputtering. Acta Physica Sinica, 2012, 61(5): 056106.doi:10.7498/aps.61.056106 |
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Wu Chen-Yang, Gu Jin-Hua, Feng Ya-Yang, Xue Yuan, Lu Jing-Xiao.The characterization of hydrogenated amorphous silicon and epitaxial silicon thin films grown on crystalline silicon substrates by using spectroscopic ellipsometry. Acta Physica Sinica, 2012, 61(15): 157803.doi:10.7498/aps.61.157803 |
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Li Xin-Li, Gu Jin-Hua, Gao Hai-Bo, Chen Yong-Sheng, Gao Xiao-Yong, Yang Shi-E, Lu Jing-Xiao, Li Rui, Jiao Yue-Chao.Real time and ex situ spectroscopic ellipsometry analysis microcrystalline silicon thin films growth. Acta Physica Sinica, 2012, 61(3): 036802.doi:10.7498/aps.61.036802 |
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Xu Kai, Yang Yan-Fang, He Ying, Han Xiao-Hong, Li Chun-Fang.Study on the tight focusing of the local elliptically polarized beam. Acta Physica Sinica, 2010, 59(9): 6125-6130.doi:10.7498/aps.59.6125 |
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Gu Jin-Hua, Ding Yan-Li, Yang Shi-E, Gao Xiao-Yong, Chen Yong-Sheng, Lu Jing-Xiao.A spectroscopic ellipsometry study of the abnormal scaling behavior of high-rate-deposited microcrystalline silicon films by VHF-PECVD technique. Acta Physica Sinica, 2009, 58(6): 4123-4127.doi:10.7498/aps.58.4123 |
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Shen Hu-Jiang, Wang Lin-Jun, Fang Zhi-Jun, Zhang Ming-Long, Yang Ying, Wang Lin, Xia Yi-Ben.Study on optical properties of diamond films by means of infrared spectroscopic ellipsometry. Acta Physica Sinica, 2004, 53(6): 2009-2013.doi:10.7498/aps.53.2009 |
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Wang Qi, Chen Jian-Xin, Xia Yuan-Qin, Chen De-Ying.. Acta Physica Sinica, 2002, 51(5): 1035-1039.doi:10.7498/aps.51.1035 |
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TONG SONG, LIU XIANG-NA, WANG LU-CHUN, YAN FENG, BAO XI-MAO.VISIBLE ELECTROLUMINESCENCE FROM SILICONNANOCRYSTALLITES PREPARED BY PLASMAENHANCED CHEMICAL VAPOR DEPOSITION. Acta Physica Sinica, 1997, 46(6): 1217-1222.doi:10.7498/aps.46.1217 |
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ZHU MEI-FANG, CHEN GUO, XU HUAI-ZHE, HAN YI-QIN, XIE KAN, LIU ZHEN-XIANG, TANG YONG, CHEN PEI-YI.GREEN/BLUE LIGHT EMISSION AND LUMINESCENT-MECHANISM OF NANOCRYSTALLINE SILICON-EMBEDDED IN SILICON OXIDE THIN FILM. Acta Physica Sinica, 1997, 46(8): 1645-1651.doi:10.7498/aps.46.1645 |
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ZHU WEI-WEN, ZHU WEN-YU, WANG WEI-YUAN.STUDY OF Si SOI OPTICAL PROPERTIES BY USING ELLIPSOMETRIC FOUR-PHASE MODEL. Acta Physica Sinica, 1986, 35(6): 797-802.doi:10.7498/aps.35.797 |
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MO DANG, YE XIAN-JING.ELLIPSOMETRIC SPECTRUM AND OPTICAL PROPERTIES OF ION IMPLANTED SILICON. Acta Physica Sinica, 1981, 30(10): 1287-1294.doi:10.7498/aps.30.1287 |
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MO DANG, CHEN SHU-GUANG, YU YU-ZHEN, HUANG BING-ZHONG.ELLIPSOMETRIC SPECTRA OF SiO2FILMS ON SILICON. Acta Physica Sinica, 1980, 29(5): 673-676.doi:10.7498/aps.29.673 |