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Lin Ming-Yue, Ju Bo, Li Yan, Chen Xue-Lian.Performance of 2-bromoterephthalic acid passivated all-inorganic perovskite cells. Acta Physica Sinica, 2021, 70(12): 128803.doi:10.7498/aps.70.20202005 |
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Du Jian-Bin, Wu De-Qi, Tang Yan-Lin, Long Zheng-Wen.Molecular structure and spectrum of dibutyl phthalate in an external electric field. Acta Physica Sinica, 2015, 64(7): 073101.doi:10.7498/aps.64.073101 |
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Liu Hui-Qiang, Ren Yu-Qi, Zhou Guang-Zhao, He You, Xue Yan-Ling, Xiao Ti-Qiao.Investigation on the application of phase-attenuation duality to X-ray mixed contrast quantitative micro-tomography. Acta Physica Sinica, 2012, 61(7): 078701.doi:10.7498/aps.61.078701 |
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Sun Yun, Wang Sheng-Lai, Gu Qing-Tian, Xu Xin-Guang, Ding Jian-Xu, Liu Wen-Jie, Liu Guang-Xia, Zhu Sheng-Jun.Study of KDP crystal lattice strain and stress by high resolution X-ray diffraction. Acta Physica Sinica, 2012, 61(21): 210203.doi:10.7498/aps.61.210203 |
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Wei Lai, Zhou Lan-Lan, Lu Gui-Hua, Zhang Wen, Zhang Wu-Zhi, Zhang Shang, Feng Yong-Hong, Zhou Heng-Wei, Zhang Jin-Lu, Huang Yi-Neng.Measuring and analyzing the cooling dielectric spectra of the -relaxation in dimethyl phthalate series materials. Acta Physica Sinica, 2012, 61(1): 017701.doi:10.7498/aps.61.017701 |
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Zhang Xiang-Zhi, Xu Zi-Jian, Zhen Xiang-Jun, Wang Yong, Guo Zhi, Yan Rui, Chang Rui, Zhou Ran-Ran, Tai Ren-Zhong.Soft X-ray spectromicroscopy dual-energy contrast image for element spatial distribution analysis. Acta Physica Sinica, 2010, 59(7): 4535-4541.doi:10.7498/aps.59.4535 |
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Guo Xiu-Zhen, Zhou Heng-Wei, Zhang Li-Li, Wu Wen-Hui, Zhang Jin-Lu, Huang Yi-Neng.Investigation on the crack healing effect in dimethyl phthalate series glassy materials. Acta Physica Sinica, 2010, 59(1): 417-421.doi:10.7498/aps.59.417 |
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Zhou Heng-Wei, Wang Li-Na, Guo Xiu-Zhen, Wu Na-Na, Zhang Li, Zhang Jin-Lu, Huang Yi-Neng.Study of crack healing effect in dimethyl phthalate crystals by mechanical spectroscopy. Acta Physica Sinica, 2010, 59(3): 2120-2125.doi:10.7498/aps.59.2120 |
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Zhou Heng-Wei, Zhang Jin-Lu, Huang Yi-Neng, Ying Xue-Nong, Zhang Liang, Wu Wen-Hui, Shen Yi-Fan.Measurements of dimethyl phthalate series by the reed-vibration mechanical spectroscopy for liquids. Acta Physica Sinica, 2007, 56(11): 6547-6551.doi:10.7498/aps.56.6547 |
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HUANG YI-SEN, ZHAO QING-LAN.EFFECTS OF STRUCTURE IN RUBIDIUM ACID PHTHALATE (RAP) ON ITS SINGLE CRYSTAL GROWTH HABIT AND DEFECT FORMATION. Acta Physica Sinica, 1991, 40(12): 1960-1965.doi:10.7498/aps.40.1960 |
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ZHAO QING-LAN, HUANG YI-SEN.STUDY OF DEFECTS IN CRYSTAL OF TRIHYDROXYME-THYLAMINOMETHANE BY X-RAY TOPOGRAPHY. Acta Physica Sinica, 1990, 39(9): 1418-1423.doi:10.7498/aps.39.1418 |
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ZHAO QING-LAN, HUANG YI-SEN.X-RAY TOPOGRAPHIC CONTRAST OF INCLUSIONS IN THE CRYSTAL OF LOW TEMPERATURE FORM BARIUM BORIC OXIDE. Acta Physica Sinica, 1990, 39(9): 1424-1428.doi:10.7498/aps.39.1424 |
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HUANG YI-SEN, ZHAO QING-LAN.A STUDY OF FORMATION OF CHARACTERISTIC LAYERED INCLUSION IN THE CRYSTAL OF RUBIDIUM ACID PHTHALATE AND THEIR RELATIONSHIP WITH THE STRUCTURE. Acta Physica Sinica, 1990, 39(8): 78-83.doi:10.7498/aps.39.78 |
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HUANG YI-SEN, ZHAO QING-LAN.DEFECTS IN RUBIDIUM ACID PHTHALATE (RAP) CRYSTALS. Acta Physica Sinica, 1989, 38(5): 869-872.doi:10.7498/aps.38.869 |
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ZHAO QING-LAN.THE SECTION TOPOGRAPHY OF SYNCHROTRON RADIATION (SST) ON THE CRYSTAL OF POTASSIUM ACID PHTHALATE (KAP). Acta Physica Sinica, 1988, 37(8): 1345-1349.doi:10.7498/aps.37.1345 |
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CHU XI, MAI ZHEN-HONG, DAI DAO-YANG, CUI SHU-FAN, GE PEI-WEN.STUDY ON A PLANE-LIKE PRECIPITATE IN SILICON SINGLE CRYSTAL BY X-RAY TOPOGRAPHIC METHOD. Acta Physica Sinica, 1987, 36(3): 408-410.doi:10.7498/aps.36.408 |
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GE CHUAN-ZHENG, JIANG SHU-SHENG, MING NAI-BEN, FENG DUAN.A STUDY OF INCLUSIONS AND DISLOCATIONS IN LiNbO3 CRYSTALS BY X-RAY TOPOGRAPHY. Acta Physica Sinica, 1987, 36(4): 490-494.doi:10.7498/aps.36.490 |
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ZHAO QING-LAN, CHEN JIN-ZHANG, HUANG YI-SEN.THE EFFECT OF THE MICROSCOPIC STRUCTURE ON FORMATION OF CHARACTERISTIC LAYERED INCLUSIONS IN THE SINGLE CRYSTAL OF POTASSIUM ACID PHTHALATE (KAP). Acta Physica Sinica, 1983, 32(3): 294-300.doi:10.7498/aps.32.294 |
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