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Wang Jian-Guo, Yang Song-Lin, Ye Yong-Hong.Effect of silver film roughness on imaging property of BaTiO3 microsphere. Acta Physica Sinica, 2018, 67(21): 214209.doi:10.7498/aps.67.20180823 |
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Zhang Yong-Jian, Ye Fang-Xia, Dai Jun, He Bin-Feng, Zang Du-Yang.Influence of nano-scaled roughness on evaporation patterns of colloidal droplets. Acta Physica Sinica, 2017, 66(6): 066101.doi:10.7498/aps.66.066101 |
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Song Yan-Song, Yang Jian-Feng, Li Fu, Ma Xiao-Long, Wang Hong.Method of controlling optical surface roughness based on stray light requirements. Acta Physica Sinica, 2017, 66(19): 194201.doi:10.7498/aps.66.194201 |
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Li Xia-Zhi, Zou De-Bin, Zhou Hong-Yu, Zhang Shi-Jie, Zhao Na, Yu De-Yao, Zhuo Hong-Bin.Effect of plasma grating roughness on high-order harmonic generation. Acta Physica Sinica, 2017, 66(24): 244209.doi:10.7498/aps.66.244209 |
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Wu Cheng-Feng, Du Ya-Nan, Wang Jin-Dong, Wei Zheng-Jun, Qin Xiao-Juan, Zhao Feng, Zhang Zhi-Ming.Analysis on performance optimization in measurement-device-independent quantum key distribution using weak coherent states. Acta Physica Sinica, 2016, 65(10): 100302.doi:10.7498/aps.65.100302 |
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Song Yong-Feng, Li Xiong-Bing, Shi Yi-Wei, Ni Pei-Jun.Effects of surface roughness on diffuse ultrasonic backscatter in the solids. Acta Physica Sinica, 2016, 65(21): 214301.doi:10.7498/aps.65.214301 |
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Du Ya-Nan, Xie Wen-Zhong, Jin Xuan, Wang Jin-Dong, Wei Zheng-Jun, Qin Xiao-Juan, Zhao Feng, Zhang Zhi-Ming.Analysis on quantum bit error rate in measurement-device-independent quantum key distribution using weak coherent states. Acta Physica Sinica, 2015, 64(11): 110301.doi:10.7498/aps.64.110301 |
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Chen Su-Ting, Hu Hai-Feng, Zhang Chuang.Surface roughness modeling based on laser speckle imaging. Acta Physica Sinica, 2015, 64(23): 234203.doi:10.7498/aps.64.234203 |
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Dong Chen, Zhao Shang-Hong, Zhang Ning, Dong Yi, Zhao Wei-Hu, Liu Yun.Measurement-device-independent quantum key distribution with odd coherent state. Acta Physica Sinica, 2014, 63(20): 200304.doi:10.7498/aps.63.200304 |
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Man Tian-Long, Wan Yu-Hong, Jiang Zhu-Qing, Wang Da-Yong, Tao Shi-Quan.Measurement of the spatial coherence of extended light source by twin beams-interference method. Acta Physica Sinica, 2013, 62(21): 214203.doi:10.7498/aps.62.214203 |
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Huang Jin, Zhong Zhong, Guo Wei-Dong, Lu Wei.Statistical features of aerodynamic effective roughness length over heterogeneous terrain. Acta Physica Sinica, 2013, 62(5): 054204.doi:10.7498/aps.62.054204 |
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Cao Hong, Huang Yong, Chen Su-Fen, Zhang Zhan-Wen, Wei Jian-Jun.Influence of pulse tapping technology on surface roughness of polyimide capsule. Acta Physica Sinica, 2013, 62(19): 196801.doi:10.7498/aps.62.196801 |
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Fan Dan-Dan, Wu Feng-Tie, Cheng Zhi-Ming, Zhu Jian-Qiang.Reconstruction of incoherent source Bessel beam. Acta Physica Sinica, 2013, 62(10): 104219.doi:10.7498/aps.62.104219 |
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Zhang Cheng-Bin, Chen Yong-Ping, Shi Ming-Heng, Fu Pan-Pan, Wu Jia-Feng.Fractal characteristics of surface roughness and its effect on laminar flow in microchannels. Acta Physica Sinica, 2009, 58(10): 7050-7056.doi:10.7498/aps.58.7050 |
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Ma Rui-Qiong, Li Yong-Fang, Shi Jian.Measurement of quantum states with incoherent light. Acta Physica Sinica, 2008, 57(9): 5593-5599.doi:10.7498/aps.57.5593 |
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Li Zhi-Hua, Wang Wen-Xin, Liu Lin-Sheng, Jiang Zhong-Wei, Gao Han-Chao, Zhou Jun-Ming.As-soak dependence of interface roughness of AlSb/InAs superlattice. Acta Physica Sinica, 2007, 56(3): 1785-1789.doi:10.7498/aps.56.1785 |
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Zhou Bing-Qing, Liu Feng-Zhen, Zhu Mei-Fang, Zhou Yu-Qin, Wu Zhong-Hua, Chen Xing.Studies on surface roughness and growth mechanisms of microcrystalline silicon films by grazing incidence X-ray reflectivity. Acta Physica Sinica, 2007, 56(4): 2422-2427.doi:10.7498/aps.56.2422 |
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Hou Hai-Hong, Sun Xi-Lian, Shen Yan-Ming, Shao Jian-Da, Fan Zheng-Xiu, Yi Kui.Roughness and light scattering properties of ZrO2 thin films deposited by electron beam evaporation. Acta Physica Sinica, 2006, 55(6): 3124-3127.doi:10.7498/aps.55.3124 |
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ZHANG XI-QING, ZHAO JIA-LONG, QIN WEI-PING, DOU KAI, HUANG SHI-HUA.MEASUREMENT OF THE AMBIPOLAR DIFFUSION COEFFICIENT USING TIME-DELAYED FOUR-WAVE MIXING WITH INCOHERENT LIGHT. Acta Physica Sinica, 1993, 42(3): 417-421.doi:10.7498/aps.42.417 |
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HUANG BING-ZHONG, YU YU-ZHEN, HONG GUO-GUANG.THE ROUGHNESS OF THE Si-SiO2 INTERFACE. Acta Physica Sinica, 1987, 36(7): 829-837.doi:10.7498/aps.36.829 |
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