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Zhong Xiao-Yan, Li Zhuo.Atomic scale characterization of three-dimensional structure, magnetic properties and dynamic evolutions of materials by transmission electron microscopy. Acta Physica Sinica, 2021, 70(6): 066801.doi:10.7498/aps.70.20202072 |
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Lü Hao-Chang, Zhao Yun-Chi, Yang Guang, Dong Bo-Wen, Qi Jie, Zhang Jing-Yan, Zhu Zhao-Zhao, Sun Yang, Yu Guang-Hua, Jiang Yong, Wei Hong-Xiang, Wang Jing, Lu Jun, Wang Zhi-Hong, Cai Jian-Wang, Shen Bao-Gen, Yang Feng, Zhang Shen-Jin, Wang Shou-Guo.High resolution imaging based on photo-emission electron microscopy excited by deep ultraviolet laser. Acta Physica Sinica, 2020, 69(9): 096801.doi:10.7498/aps.69.20200083 |
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Li Dong-Dong, Zhou Wu.Low voltage scanning transmission electron microscopy for two-dimensional materials. Acta Physica Sinica, 2017, 66(21): 217303.doi:10.7498/aps.66.217303 |
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Shen Wei-Min, Jin Yong-Xing, Shao Zhong-Xing.Reflection and refraction on the surface of a biaxial crystal. Acta Physica Sinica, 2003, 52(12): 3049-3054.doi:10.7498/aps.52.3049 |
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WANG ZHEN-XIA, RUAN MEI-LING, YANG JIN-QING, WANG WEN-MIN, YU GUO-QING.INVESTIGATION OF THE NOVEL CARBON NANOSTRUCTURES BY HIGH RESOLUTION ELECTRON MICROSCOPY. Acta Physica Sinica, 1999, 48(11): 2092-2097.doi:10.7498/aps.48.2092 |
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LI YI-JIE, XIONG GUANG-CHENG, GAN ZI-ZHAO, REN CONG-XIN, ZOU SHI-CHANG.TEM STUDY OF MICROSTRUCTURAL CHANGES INDUCED BY AR ION IMPLANTATION IN YBa2Cu3O7-x SUPERCONDUCTING FILMS. Acta Physica Sinica, 1993, 42(3): 482-487.doi:10.7498/aps.42.482 |
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LI LONG, LI FANG-HUA, YANG DA-YU, TIAN LING-HUA, LIN ZHEN-JIN.ELECTRON DIFFRACTION AND HIGH RESOLUTION MICRO-SCOPY STUDY ON INCOMMENSURATE MODULATED STRUCTURE IN Ce1+εFe4B4 ALLOY. Acta Physica Sinica, 1990, 39(5): 788-792.doi:10.7498/aps.39.788 |
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XU HUI-FANG, LUO GU-FENG, HU MEI-SHENG, CHEN JUN.HRTEM STUDY OF THE SUPERLATTICE ORTHOCLASE. Acta Physica Sinica, 1989, 38(9): 1527-1529.doi:10.7498/aps.38.1527 |
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ZHAO JIAN-GUO, LI FANG-HUA, CHEN WEI, XIE SI-SHEN, CAO NING, ZHENG JIA-QI.HIGH RESOLUTION ELECTRON MICROSCOPY STUDY ON HIGH Tc SUPERCONDUCTOR Nd-Ba-Cu-O. Acta Physica Sinica, 1989, 38(3): 508-510.doi:10.7498/aps.38.508 |
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ZHANG JING, LIU AN-SHENG, WU ZI-QIN, GUO KE-XIN.A TEM STUDY OF Pd-Si THIN FILM SOLID-PHASE REACTION. Acta Physica Sinica, 1986, 35(7): 965-968.doi:10.7498/aps.35.965 |
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FENG GUO-GUANG, YANG CUI-YING, ZHOU YU-QING, TANG DI-SHENG.STRUCTURAL ANALYSIS OF Li2O·14Nb2O5 BY COMBINED CONVERGENT-BEAM ELECTRON DIFFRACTION AND HIGH RESOLUTION ELECTRON MICROSCOPY. Acta Physica Sinica, 1984, 33(11): 1581-1585.doi:10.7498/aps.33.1581 |
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Kang Zhen-chuan.A STUDY OF SYNTHETIC DIAMOND SURFACE USING REFLECTION ELECTRON MICROSCOPY. Acta Physica Sinica, 1983, 32(6): 808-811.doi:10.7498/aps.32.808 |
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KANG ZHEN-CHUAN.THE DIRECT DETERMINATION OF STACKING FAULTS SEQUENCE IN ZnS POLYTYPE BY HIGH RESOLUTION ELECTRON MICROSCOPY. Acta Physica Sinica, 1982, 31(5): 664-667.doi:10.7498/aps.31.664 |
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Cheng Wan-rong, Wu Zi-qin.THE TEM AND SEM OBSERVATIONS OF THE HIGH TEMPERATURE BEHAVIOURS OF COPPER ALLOY FILMS. Acta Physica Sinica, 1982, 31(10): 1387-1394.doi:10.7498/aps.31.1387 |
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CHENG PENG-ZHU, MA XIAO-HUA, LUO QI-GUANG, YANG DA-YU.THE PREPARATION OF TRANSMISSION ELECTRON MICROSCOPE SPECIMEN BY ELECTROLYTIC POLISHING METHOD. Acta Physica Sinica, 1981, 30(2): 286-290.doi:10.7498/aps.30.286 |
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WU ZI-QIN, GAO QIAO-JUN, LI YONG-HONG, TANG XIAN-DE.A HVEM OBSERVATION OF THE Nb/Nb3Sn COMPOSITE SUPERCONDUCTING MATERIALS. Acta Physica Sinica, 1980, 29(9): 1226-1230.doi:10.7498/aps.29.1226 |
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LIAO QIAN-CHU, WANG YUN, WANG HONG-JUN, LAN FEN-LAN.ANOMOLOUS PATTERNS OF TUNGSTEN SAMPLES OBSERVED WITH SCANNING ELECTRON MICROSCOPE. Acta Physica Sinica, 1980, 29(1): 131-137.doi:10.7498/aps.29.131 |
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GUO KE-XIN, LIN BAO-JUN.A TEM STUDY OF PARTIAL DISLOCATIONS IN A NICKEL-CHROMIUM ALLOY. Acta Physica Sinica, 1980, 29(4): 494-499.doi:10.7498/aps.29.494 |
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Li Fang-hua.DETERMINATION OF CRYSTAL STRUCTURES BY HIGH RESOLUTION ELECTRON MICROSCOPY. Acta Physica Sinica, 1977, 26(3): 193-198.doi:10.7498/aps.26.193 |
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Qian Lin-zhao;He Shou-an;Yang Da-yu.THE GLIDE OF ALUMINIUM SINGLE CRYSTALS OBSERVED BY ELECTRON MICROSCOPE (III). Acta Physica Sinica, 1956, 12(6): 643-646.doi:10.7498/aps.12.643 |
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