[1] |
Wang Fei, Li Quan-Jun, Hu Kuo, Liu Bing-Bing.Electron microscopic study on high-pressure induced deformation of nano-TiO2. Acta Physica Sinica, 2023, 72(3): 036201.doi:10.7498/aps.72.20221656 |
[2] |
Zhong Xiao-Yan, Li Zhuo.Atomic scale characterization of three-dimensional structure, magnetic properties and dynamic evolutions of materials by transmission electron microscopy. Acta Physica Sinica, 2021, 70(6): 066801.doi:10.7498/aps.70.20202072 |
[3] |
Li Chao, Yao Yuan, Yang Yang, Shen Xi, Gao Bin, Huo Zong-Liang, Kang Jin-Feng, Liu Ming, Yu Ri-Cheng.In situ transmission electron microscopy studies on nanomaterials and HfO2-based storage nanodevices. Acta Physica Sinica, 2018, 67(12): 126802.doi:10.7498/aps.67.20180731 |
[4] |
Li Dong-Dong, Zhou Wu.Low voltage scanning transmission electron microscopy for two-dimensional materials. Acta Physica Sinica, 2017, 66(21): 217303.doi:10.7498/aps.66.217303 |
[5] |
Liu Meng-Xi, Zhang Yan-Feng, Liu Zhong-Fan.Scanning tunneling microscopy study of in-plane graphene-hexagonal boron nitride heterostructures. Acta Physica Sinica, 2015, 64(7): 078101.doi:10.7498/aps.64.078101 |
[6] |
Wang Jiang-Jing, Shao Rui-Wen, Deng Qing-Song, Zheng Kun.Study on electrical transport properties of strained Si nanowires by in situ transmission electron microscope. Acta Physica Sinica, 2014, 63(11): 117303.doi:10.7498/aps.63.117303 |
[7] |
Feng Wei, Zhao Ai-Di.STM study of single cobalt atoms and clusters adsorbed on Rh (111) and Pd (111). Acta Physica Sinica, 2012, 61(17): 173601.doi:10.7498/aps.61.173601 |
[8] |
Wen Cai, Li Fang-Hua, Zou Jin, Chen Hong.High-resolution electron microscopy of misfit dislocations in AlSb/GaAs(001) system. Acta Physica Sinica, 2010, 59(3): 1928-1937.doi:10.7498/aps.59.1928 |
[9] |
Wang Qi, Zhao Hua-Bo, Zhang Zhao-Hui.Conductance enhancement phenomenon of graphene ribbons on highly oriented pyrolytic graphite surfaces studied by scanning probe microscopy. Acta Physica Sinica, 2008, 57(5): 3059-3063.doi:10.7498/aps.57.3059 |
[10] |
Wan Wei, Tang Chun-Yan, Wang Yu-Mei, Li Fang-Hua.A study on the stacking fault in GaN crystals by high-resolution electron microscope imaging. Acta Physica Sinica, 2005, 54(9): 4273-4278.doi:10.7498/aps.54.4273 |
[11] |
Guo Hai-Ming, Liu Hong-Wen, Wang Ye-Liang, Xie Hui-Min, Dai Fu-Long, Gao Hong-Jun.Moiré fringes of HOPG and mica in scanning probe microscopy. Acta Physica Sinica, 2003, 52(10): 2514-2519.doi:10.7498/aps.52.2514 |
[12] |
CHEN HUI-YU, LI ZHI-CHAO, FU SHAO-JUN, JIN SI-ZHAO, LIANG REN-YOU.THE STUDY OF FERROMAGNETIC RESQNANCE IN WIRE ARRAY OF MULTILAYER Fe/[NiFe/Cu]30. Acta Physica Sinica, 1999, 48(5): 936-941.doi:10.7498/aps.48.936 |
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FANG RUI-YI, YU YING-LEI, CHEN TING-YONG, DAI DAO-SHENG.MAGNETORESISTANCE,COERCIVITY AND STABILITY FOR THE SPIN VALVE [NiFe/Cu/Co/Cu] MULTILAYERS. Acta Physica Sinica, 1997, 46(9): 1841-1848.doi:10.7498/aps.46.1841 |
[14] |
WANG ZHI-CHAO, TENG MIN-KANG, LIU YIN-CHUN.ATUDY OF INTERFACE PROPERTIES OF a-Si:H/a-SiNx:H MULTILAYERS BY PAT. Acta Physica Sinica, 1991, 40(12): 1973-1979.doi:10.7498/aps.40.1973 |
[15] |
KONG QING-PING, WANG XIANG, ZHOU HAO, NI QUN-HUI.ELECTRON MICROSCOPY STUDIES ON THE INTERACTION BETWEEN CREEP AND FATIGUE. Acta Physica Sinica, 1986, 35(8): 1091-1094.doi:10.7498/aps.35.1091 |
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LI FANG-HUA, TANG DONG.PSEUDO WEAK PHASE OBJECT APPROXIMATION IN HIGH RESOLUTION ELECTRON MICROSCOPY. Acta Physica Sinica, 1984, 33(8): 1196-1197.doi:10.7498/aps.33.1196 |
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ZHANG XIU-MU, YANG QI-BING, CHANG XIN, GUO KE-XIN.OBSERUATION AND CALCULATION OF FRINGE IMAGES OF OVERLAPPING MICRO-TWIN BOUNDARIES. Acta Physica Sinica, 1983, 32(12): 1479-1488.doi:10.7498/aps.32.1479 |
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Kang Zhen-chuan.A STUDY OF SYNTHETIC DIAMOND SURFACE USING REFLECTION ELECTRON MICROSCOPY. Acta Physica Sinica, 1983, 32(6): 808-811.doi:10.7498/aps.32.808 |
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YANG CUI-YING, ZHOU YU-QING, ZHAO JIAN-GAO.AN ELECTRON MICROSCOPIC STUDY ON AMORPHOUS Tb-Fe THIN FILMS. Acta Physica Sinica, 1982, 31(2): 180-184.doi:10.7498/aps.31.180 |
[20] |
LI FANG-HUA, FAN HAN-JIE, YANG DA-YU, FU PING-QIU, KONG YOU-HUA.ELECTRON MICROSCOPY OF HUANGHOITE. Acta Physica Sinica, 1982, 31(5): 571-576.doi:10.7498/aps.31.571 |