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Luo Chang-Wei, Qiu Meng-Lin, Wang Guang-Fu, Wang Ting-Shun, Zhao Guo-Qiang, Hua Qing-Song.Ions beam induced luminescence study of variation of defects in zinc oxide during ion implant and after annealing. Acta Physica Sinica, 2020, 69(10): 102901.doi:10.7498/aps.69.20200029 |
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Gao Cheng-Hao, Xu Feng, Zhang Li, Zhao De-Sheng, Wei Xing, Che Ling-Juan, Zhuang Yong-Zhang, Zhang Bao-Shun, Zhang Jing.Ion implantation isolation based micro-light-emitting diode device array properties. Acta Physica Sinica, 2020, 69(2): 027802.doi:10.7498/aps.69.20191418 |
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Wang Ya-Ning, Chen Shao-Ping, Fan Wen-Hao, Guo Jing-Yun, Wu Yu-Cheng, Wang Wen-Xian.Interface performance of PbTe-based thermoelectric joints. Acta Physica Sinica, 2020, 69(24): 246801.doi:10.7498/aps.69.20201080 |
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Yuan Guo-Cai, Chen Xi, Huang Yu-Yang, Mao Jun-Xi, Yu Jin-Qiu, Lei Xiao-Bo, Zhang Qin-Yong.Comparative study of thermoelectric properties of Mg2Si0.3Sn0.7doped by Ag or Li. Acta Physica Sinica, 2019, 68(11): 117201.doi:10.7498/aps.68.20190247 |
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Jiang Mei-Yan, Zhu Zheng-Jie, Chen Cheng-Ke, Li Xiao, Hu Xiao-Jun.Microstructural and electrochemical properties of sulfur ion implanted nanocrystalline diamond films. Acta Physica Sinica, 2019, 68(14): 148101.doi:10.7498/aps.68.20190394 |
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Liu Huan, Li Gong-Ping, Xu Nan-Nan, Lin Qiao-Lu, Yang Lei, Wang Cang-Long.A simulation study of structural and optical properties in Cu ions implantation single-crystal rutile. Acta Physica Sinica, 2016, 65(20): 206102.doi:10.7498/aps.65.206102 |
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Guo Hong-Yan, Xia Min, Yan Qing-Zhi, Guo Li-Ping, Chen Ji-Hong, Ge Chang-Chun.Microstructure of medium energy and high density helium ion implanted tungsten. Acta Physica Sinica, 2016, 65(7): 077803.doi:10.7498/aps.65.077803 |
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Wang Rui, Hu Xiao-Jun.The microstructural and electrochemical properties of oxygen ion implanted nanocrystalline diamond films. Acta Physica Sinica, 2014, 63(14): 148102.doi:10.7498/aps.63.148102 |
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Wang Feng-Hao, Hu Xiao-Jun.Microstructural and photoelectrical properties of oxygen-ion-implanted microcrystalline diamond films. Acta Physica Sinica, 2013, 62(15): 158101.doi:10.7498/aps.62.158101 |
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Peng Shu-Ming, Shen Hua-Hai, Long Xing-Gui, Zhou Xiao-Song, Yang Li, Zu Xiao-Tao.The influence of deuteration and helium-implantation on the surface morphology and phase structure of scandium thick film. Acta Physica Sinica, 2012, 61(17): 176106.doi:10.7498/aps.61.176106 |
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Wang Chong, Yang Yu, Yang Rui-Dong, Li Liang, Wei Dong, Jin Ying-Xia, Bao Ji-Ming.Manipulations of properties of the W-line emitting from the Si+ Self-ion-implanted Si thin films on insulated oxide layer. Acta Physica Sinica, 2011, 60(10): 106104.doi:10.7498/aps.60.106104 |
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Hu Xiao-Jun, Hu Heng, Chen Xiao-Hu, Xu Bei.The n-type conduction and microstructural properties of phosphorus ion implanted nanocrystalline diamond films. Acta Physica Sinica, 2011, 60(6): 068101.doi:10.7498/aps.60.068101 |
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Yang Xin-An, Li Jian-Qi, Ding Peng, Liu Fa-Min.Microstructure and magnetic properties of the cobalt ions implanted TiO2 films. Acta Physica Sinica, 2011, 60(3): 036803.doi:10.7498/aps.60.036803 |
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Li Tian-Jing, Li Gong-Ping, Ma Jun-Ping, Gao Xing-Xin.Effect of Co+ implantation on structural and optical properties in single-crystal TiO2. Acta Physica Sinica, 2011, 60(11): 116102.doi:10.7498/aps.60.116102 |
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Su Hai-Qiao, Xue Shu-Wen, Chen Meng, Li Zhi-Jie, Yuan Zhao-Lin, Fu Yu-Jun, Zu Xiao-Tao.Effects of Ti ion implantation and post-thermal annealing on the structural and optical properties of ZnS films. Acta Physica Sinica, 2009, 58(10): 7108-7113.doi:10.7498/aps.58.7108 |
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Hu Liang-Jun, Chen Yong-Hai, Ye Xiao-Ling, Wang Zhan-Guo.Electrical and optical properties of InAs/GaAs quantum dots doped by high energy Mn implantation. Acta Physica Sinica, 2007, 56(8): 4930-4935.doi:10.7498/aps.56.4930 |
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Gao Peng, Xu Jun, Deng Xin-Lu, Wang De-He, Dong Chuang.Structure and tribology properties of diamond-like carbon films prepared by microwave electron cyclotron resonance plasma source ion implantation. Acta Physica Sinica, 2005, 54(7): 3241-3246.doi:10.7498/aps.54.3241 |
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YU YUE-HUI, LIN CHENG-LU, ZHANG SHUN-KAI, FANG ZI-ZEI, ZOU SHI-CHANG.AUGER ELECTRON SPECTROSCOPIC STUDIES OF INTERFA CE AND BURIED LAYER OF SOI STRUCTURE FORMED BY ION IMPLANTATION. Acta Physica Sinica, 1989, 38(12): 1996-2002.doi:10.7498/aps.38.1996 |