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Liu Hua-Song, Yang Xiao, Wang Li-Shuan, Jiang Cheng-Hui, Liu Dan-Dan, Ji Yi-Qin, Zhang Feng, Chen De-Ying.Gaussian oscillator model of the dielectric constant of SiO2 thin film in infrared range. Acta Physica Sinica, 2017, 66(5): 054211.doi:10.7498/aps.66.054211 |
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Liu Hua-Song, Ji Yi-Qin, Jiang Yu-Gang, Wang Li-Shuan, Leng Jian, Sun Peng, Zhuang Ke-Wen.Study on internal short-range order microstructure characteristic of SiO2 thin film. Acta Physica Sinica, 2013, 62(18): 187801.doi:10.7498/aps.62.187801 |
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Li Wei-Qin, Zhang Hai-Bo, Lu Jun.Charging effects of SiO2 thin films under defocused electron beam irradiation. Acta Physica Sinica, 2012, 61(2): 027302.doi:10.7498/aps.61.027302 |
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Zhou Hong-Juan, Zhen Cong-Mian, Zhang Yong-Jin, Zhao Cui-Lian, Ma Li, Hou Deng-Lu.Preparation and magnetism of the N doped SiO2 thin film. Acta Physica Sinica, 2010, 59(5): 3499-3503.doi:10.7498/aps.59.3499 |
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Sun Xiao-Fei, Wei Chang-Ping, Li Qi-Yuan.Preparation and characterization of Ag-Au alloys/SiO2 composite thin films. Acta Physica Sinica, 2009, 58(8): 5816-5820.doi:10.7498/aps.58.5816 |
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Wang Qiao-Zhan, Yu Run-Sheng, Qin Xiu-Bo, Li Yu-Xiao, Wang Bao-Yi, Jia Quan-Jie.Pore structure determination of mesoporous SiO2 thin films by slow positron annihilation spectroscopy. Acta Physica Sinica, 2009, 58(12): 8478-8483.doi:10.7498/aps.58.8478 |
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Weng Wei-Xiang, Yan Wen-Sheng, Sun Zhi-Hu, Yao Tao, Guo Yu-Xian, Wang Feng, Wei Shi-Qiang, Zhang Guo-Bin, Xu Peng-Shou.Structural and magnetic properties of Ni1-xFex O thin films synthesized by pulsed laser deposition. Acta Physica Sinica, 2008, 57(9): 5788-5792.doi:10.7498/aps.57.5788 |
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Ren Peng, Liu Zhong-Liang, Ye Jian, Jiang Yong, Liu Jin-Feng, Sun Yu, Xu Peng-Shou, Sun Zhi-Hu, Pan Zhi-Yun, Yan Wen-Sheng, Wei Shi-Qiang.Structural study of MnxSi1-x magnetic semiconductor thin films. Acta Physica Sinica, 2008, 57(7): 4322-4327.doi:10.7498/aps.57.4322 |
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Zhang Yun, Zhang Bo-Ping, Jiao Li-Shi, Zhang Hai-Long, Li Xiang-Yang.Preparation and characterization of Au/SiO2 nano-composite multilayer films. Acta Physica Sinica, 2006, 55(7): 3730-3735.doi:10.7498/aps.55.3730 |
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Gou Jie, He Zhi-Wei, Pan Guo-Hui, Wang Yin-Yue.Density of defect states in low-k porous SiO2:F film researched by SCLC method. Acta Physica Sinica, 2006, 55(6): 2936-2940.doi:10.7498/aps.55.2936 |
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Jiang Hai-Qing, Yao Xi, Che Jun, Wang Min-Qiang.Luminescence and optical constant of ZnSe/SiO2 composite thin films. Acta Physica Sinica, 2006, 55(4): 2084-2091.doi:10.7498/aps.55.2084 |
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Zhang Yun, Zhang Bo-Ping, Jiao Li-Shi, Li Xiang-Yang.Microstructure and photoabsorption of Au/SiO2 nano-composite films. Acta Physica Sinica, 2006, 55(4): 2078-2083.doi:10.7498/aps.55.2078 |
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Gu Pei-Fu, Zheng Zhen-Rong, Zhao Yong-Jiang, Liu Xu.Study on the mechanism and measurement of stress of TiO2 and SiO2 thin-films. Acta Physica Sinica, 2006, 55(12): 6459-6463.doi:10.7498/aps.55.6459 |
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He Zhi-Wei, Zhen Cong-Mian, Lan Wei, Wang Yin-Yue.Deposition of nanoporous silica thin films by sol-gel. Acta Physica Sinica, 2003, 52(12): 3130-3134.doi:10.7498/aps.52.3130 |
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