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Liu Yu, Tian Qiang, Wang Xin-Yan, Guan Xue-Fei.Efficient grain size evaluation based on single direction measurement of ultrasonic backscattering coefficient. Acta Physica Sinica, 2024, 73(7): 074301.doi:10.7498/aps.73.20231959 |
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Huo Zhi-Sheng, Pu Hong-Bin, Li Wei-Qin.Charging effect of polymer thin film under irradiation of high-energy transmission electron beam. Acta Physica Sinica, 2019, 68(23): 230201.doi:10.7498/aps.68.20191112 |
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Wang Dan, He Yong-Ning, Ye Ming, Cui Wan-Zhao.Secondary electron emission characteristics of gold nanostructures. Acta Physica Sinica, 2018, 67(8): 087902.doi:10.7498/aps.67.20180079 |
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Xiao Jia-Xing, Lu Jun, Zhu Li-Jun, Zhao Jian-Hua.Perpendicular magnetic properties of ultrathin L10-Mn1.67Ga films grown by molecular-beam epitaxy. Acta Physica Sinica, 2016, 65(11): 118105.doi:10.7498/aps.65.118105 |
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Liu Yun-Chuan, Zhou Yan-Ping, Wang Xue-Rong, Meng Xiang-Yan, Duan Jian, Zheng Hui-Bao.Accurate Rutherford backscattering spectrocsopy measurement of aluminium composition in AlxGa1-xN crystal film. Acta Physica Sinica, 2013, 62(16): 162901.doi:10.7498/aps.62.162901 |
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Zhang Zhao-Hui, Han Kui, Cao Juan, Wang Fan, Yang Li-Juan.The influence of the structure of the organic ultra-film on friction. Acta Physica Sinica, 2012, 61(2): 028701.doi:10.7498/aps.61.028701 |
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Sun Xuan, Huang Xu, Wang Ya-Zhou, Feng Qing-Rong.Properties of MgB2 ultra-thin films grown by hybrid physical-chemical vapor deposition. Acta Physica Sinica, 2011, 60(8): 087401.doi:10.7498/aps.60.087401 |
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Song Shu-Fang, Zhou Sheng-Qiang, Chen Wei-De, Zhu Jian-Jun, Chen Chang-Yong, Xu Zhen-Jia.RBS/channeling study and photoluminscence properties of Er-implanted GaN. Acta Physica Sinica, 2003, 52(10): 2558-2562.doi:10.7498/aps.52.2558 |
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Ren Li-Ming, Chen Bao-Qin, Tan Zhen-Yu.. Acta Physica Sinica, 2002, 51(3): 512-518.doi:10.7498/aps.51.512 |
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Ye Jian-Song, Hu Xiao-Jun.. Acta Physica Sinica, 2002, 51(5): 1108-1112.doi:10.7498/aps.51.1108 |
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LIU SHUANG, NING YONG-GONG, ZHANG YI, ZHANG HUAI-WU, CHEN AI, LIU JUN-GANG, YANG JIA-DE, LI KUN.STUDY ON A METHOD OF THE THICKNESS MEASUREMENT OF ULTRA-THIN PtSi FILM. Acta Physica Sinica, 2001, 50(8): 1447-1450.doi:10.7498/aps.50.1447 |
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Wei He-Lin, Liu Zu-Li, Wei Kai-Lun.. Acta Physica Sinica, 2000, 49(4): 791-796.doi:10.7498/aps.49.791 |
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Liu Bo, Jiang Lei, Zhou Zhu－ying, He Mian－hong, Zhao Guo－qing, Zong Xiang－fu.In Situ Analysis of High Energetic Ion RBS Combined with Low Energetic Ion Sputtering for Thin Films. Acta Physica Sinica, 2000, 49(1): 164-169.doi:10.7498/aps.49.164 |
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WU FENG-MIN, ZHU QI-PENG, WU ZI-QIN.COMPUTER SIMULATION OF THE EPITAXY GROWTH IN ULTRA-THIN FILMS. Acta Physica Sinica, 1998, 47(9): 1427-1435.doi:10.7498/aps.47.1427 |
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JIANG WEI-LIN, WANG RUI-LAN, ZHU FBI-RAN, WANG CHANG-AN, XU TIAN-BING, LI HONG-CHENG, ZHAI YONG-LIANG, REN MENG-MEI, ZHOU JUN-SI.RBS STUDY ON YBCO AMORPHOUS FILMS PREPARED BY D. C. MAGNETRON SPUTTERING. Acta Physica Sinica, 1994, 43(4): 660-666.doi:10.7498/aps.43.660 |
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REN MENG-MEI, JIANG WEI-LIN, ZHU PEI-RAN.COMPOSITION ANALYSIS AND OXYGEN CONTENT DETERMINATION OF HIGH T SUPERCONDUCTING FILMS BY RBS AND EBS METHODS. Acta Physica Sinica, 1994, 43(2): 340-344.doi:10.7498/aps.43.340 |
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CHENG HUAN-SHENG, YANG FU-JIA, LI XIANG-YANG.HEAVY-ION BACKSCATTERING——A NEW METHOD FOR DETERMINATION OF TRACE HEAVY ELEMENTS ON THE SURFACE AND NEAR SURFACE. Acta Physica Sinica, 1991, 40(4): 522-526.doi:10.7498/aps.40.522 |
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ZHANG JING, LIU AN-SHENG, WU ZI-QIN, GUO KE-XIN.A TEM STUDY OF Pd-Si THIN FILM SOLID-PHASE REACTION. Acta Physica Sinica, 1986, 35(7): 965-968.doi:10.7498/aps.35.965 |
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WANG QIAN, ZHANG QIANG-JI, HUA ZHONG-YI.A NEW METHOD TO DETERMINE BACKSCATTERING FACTORS FOR QUANTITATIVE AUGER ANALYSIS. Acta Physica Sinica, 1986, 35(7): 914-921.doi:10.7498/aps.35.914 |
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QU ZHEN-YUAN, MA TIA-LIANG, GAO NAI-FEI, ZHANG HONG-TAO, XIONG JIA-JIONG.A STUDY OF CONCENTRATION PROFILE OF LOW-MASS IONS IMPLANTED IN METALS BY R. B. S.. Acta Physica Sinica, 1984, 33(12): 1733-1739.doi:10.7498/aps.33.1733 |
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