| [1] |
Hu Yi-Shan, Yuan Qing-Hong.Theoretical study on the nucleation control of WS2on Au(111) surfaces. Acta Physica Sinica, 2024, 73(13): 133101.doi:10.7498/aps.73.20240417 |
| [2] |
Vasiliy Pelenovich, Zeng Xiao-Mei, Luo Jin-Bao, Rakhim Rakhimov, Zuo Wen-Bin, Zhang Xiang-Yu, Tian Can-Xin, Zou Chang-Wei, Fu De-Jun, Yang Bing.Double-step gas cluster ion beam smoothing. Acta Physica Sinica, 2021, 70(5): 053601.doi:10.7498/aps.70.20201454 |
| [3] |
Wang Jian-Guo, Yang Song-Lin, Ye Yong-Hong.Effect of silver film roughness on imaging property of BaTiO3 microsphere. Acta Physica Sinica, 2018, 67(21): 214209.doi:10.7498/aps.67.20180823 |
| [4] |
Song Yan-Song, Yang Jian-Feng, Li Fu, Ma Xiao-Long, Wang Hong.Method of controlling optical surface roughness based on stray light requirements. Acta Physica Sinica, 2017, 66(19): 194201.doi:10.7498/aps.66.194201 |
| [5] |
Cheng Guang-Gui, Zhang Zhong-Qiang, Ding Jian-Ning, Yuan Ning-Yi, Xu Duo.Wetting behaviors of the molten silicon on graphite surface. Acta Physica Sinica, 2017, 66(3): 036801.doi:10.7498/aps.66.036801 |
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Song Yong-Feng, Li Xiong-Bing, Shi Yi-Wei, Ni Pei-Jun.Effects of surface roughness on diffuse ultrasonic backscatter in the solids. Acta Physica Sinica, 2016, 65(21): 214301.doi:10.7498/aps.65.214301 |
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Chen Su-Ting, Hu Hai-Feng, Zhang Chuang.Surface roughness modeling based on laser speckle imaging. Acta Physica Sinica, 2015, 64(23): 234203.doi:10.7498/aps.64.234203 |
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Wang Yu-Xiang, Chen Shuo.Drops on microstructured surfaces: A numerical study using many-body dissipative particle dynamics. Acta Physica Sinica, 2015, 64(5): 054701.doi:10.7498/aps.64.054701 |
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Ma Jing-Jie, Xia Hui, Tang Gang.Dynamic scaling behavior of the space-fractional stochastic growth equation with correlated noise. Acta Physica Sinica, 2013, 62(2): 020501.doi:10.7498/aps.62.020501 |
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Cao Hong, Huang Yong, Chen Su-Fen, Zhang Zhan-Wen, Wei Jian-Jun.Influence of pulse tapping technology on surface roughness of polyimide capsule. Acta Physica Sinica, 2013, 62(19): 196801.doi:10.7498/aps.62.196801 |
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Gao Hai-Bo, Li Rui, Lu Jing-Xiao, Wang Guo, Li Xin-Lin, Jiao Yue-Chao.High-rate deposition of microcrystalline silicon thin film by multi-step method. Acta Physica Sinica, 2012, 61(1): 018101.doi:10.7498/aps.61.018101 |
| [12] |
Li Xin-Li, Gu Jin-Hua, Gao Hai-Bo, Chen Yong-Sheng, Gao Xiao-Yong, Yang Shi-E, Lu Jing-Xiao, Li Rui, Jiao Yue-Chao.Real time and ex situ spectroscopic ellipsometry analysis microcrystalline silicon thin films growth. Acta Physica Sinica, 2012, 61(3): 036802.doi:10.7498/aps.61.036802 |
| [13] |
Ding Yan-Li, Zhu Zhi-Li, Gu Jin-Hua, Shi Xin-Wei, Yang Shi-E, Gao Xiao-Yong, Chen Yong-Sheng, Lu Jing-Xiao.Effect of deposition rate on the scaling behavior of microcrystalline silicon films prepared by very high frequency-plasma enhanced chemical vapor deposition. Acta Physica Sinica, 2010, 59(2): 1190-1195.doi:10.7498/aps.59.1190 |
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Han Xiao-Yan, Geng Xin-Hua, Hou Guo-Fu, Zhang Xiao-Dan, Li Gui-Jun, Yuan Yu-Jie, Wei Chang-Chun, Sun Jian, Zhang De-Kun, Zhao Ying.An optical emission spectroscopy study on the high rate growth of microcrystalline silicon films. Acta Physica Sinica, 2009, 58(2): 1344-1347.doi:10.7498/aps.58.1344 |
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Guo Xue-Jun, Lu Jing-Xiao, Chen Yong-Sheng, Zhang Qing-Feng, Wen Shu-Tang, Zheng Wen, Shen Chen-Hai, Chen Qing-Dong.Research on the high-rate deposition of μc-Si:H by VHF-PECVD. Acta Physica Sinica, 2008, 57(9): 6002-6006.doi:10.7498/aps.57.6002 |
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Zhou Bing-Qing, Liu Feng-Zhen, Zhu Mei-Fang, Zhou Yu-Qin, Wu Zhong-Hua, Chen Xing.Studies on surface roughness and growth mechanisms of microcrystalline silicon films by grazing incidence X-ray reflectivity. Acta Physica Sinica, 2007, 56(4): 2422-2427.doi:10.7498/aps.56.2422 |
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Hou Hai-Hong, Sun Xi-Lian, Shen Yan-Ming, Shao Jian-Da, Fan Zheng-Xiu, Yi Kui.Roughness and light scattering properties of ZrO2 thin films deposited by electron beam evaporation. Acta Physica Sinica, 2006, 55(6): 3124-3127.doi:10.7498/aps.55.3124 |
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Zhou Bing-Qing, Liu Feng-Zhen, Zhu Mei-Fang, Gu Jin-Hua, Zhou Yu-Qin, Liu Jin-Long, Dong Bao-Zhong, Li Guo-Hua, Ding Kun.The microstructure of hydrogenated microcrystalline silicon thin films studied by small-angle x-ray scattering. Acta Physica Sinica, 2005, 54(5): 2172-2175.doi:10.7498/aps.54.2172 |
| [19] |
Gu Jin-Hua, Zhou Yu-Qin, Zhu Mei-Fang, Li Guo-Hua, Ding Kun, Zhou Bing-Qing, Liu Feng-Zhen, Liu Jin-Long, Zhang Qun-Fang.Study on growth mechanism of low-temperature prepared microcrystalline Si thin f ilms. Acta Physica Sinica, 2005, 54(4): 1890-1894.doi:10.7498/aps.54.1890 |
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Zhang Chen-Hui, Luo Jian-Bin, Li Wen-Zhi, Chen Da-Rong.The study on the microstructure of TiN and Ti1-xSixNy coatings. Acta Physica Sinica, 2004, 53(1): 182-188.doi:10.7498/aps.53.182 |
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