[1] |
Zhu Meng-Long, Yang Jun, Dong Yu-Lan, Zhou Yuan, Shao Yan, Hou Hai-Liang, Chen Zhi-Hui, He Jun.Atomic and electronic structure of monolayer ferroelectric GeS on Cu(111). Acta Physica Sinica, 2024, 73(1): 010701.doi:10.7498/aps.73.20231246 |
[2] |
Xu Si-Wei, Wang Xun-Si, Shen Xiang.Structure of GexGa8S92–xglasses studied by high-resolution X-ray photoelectron spectroscopy and Raman scattering. Acta Physica Sinica, 2023, 72(1): 017101.doi:10.7498/aps.72.20221653 |
[3] |
Liu Jun-Hang, Zhu Zhao-Zhao, Bi Lin-zhu, Wang Peng-Ju, Cai Jian-Wang.Magnetic properties and thermal stability of ultrathin TbFeCo films encapsulated by heavy metals Pt and W. Acta Physica Sinica, 2023, 72(7): 077501.doi:10.7498/aps.72.20222239 |
[4] |
Wang Xiao-Bo, Li Ke-Wei, Gao Li-Juan, Cheng Xu-Dong, Jiang Rong.Preparation and thermal stability of CrAlON based spectrally selective absorbing coatings. Acta Physica Sinica, 2021, 70(2): 027103.doi:10.7498/aps.70.20200845 |
[5] |
Zhu Xiao-Qin, Hu Yi-Feng.Application of Ge50Te50/Zn15Sb85nanocomposite multilayer films in high thermal stability and low power phase change memory. Acta Physica Sinica, 2020, 69(14): 146101.doi:10.7498/aps.69.20200502 |
[6] |
Yang Meng-Sheng, Yi Tai-Min, Zheng Feng-Cheng, Tang Yong-Jian, Zhang Lin, Du Kai, Li Ning, Zhao Li-Ping, Ke Bo, Xing Pi-Feng.Surface oxidation of as-deposit uranium film characterized by X-ray photoelectron spectroscopy. Acta Physica Sinica, 2018, 67(2): 027301.doi:10.7498/aps.67.20172055 |
[7] |
Lu Shun-Shun, Zhang Jin-Min, Guo Xiao-Tian, Gao Ting-Hong, Tian Ze-An, He Fan, He Xiao-Jin, Wu Hong-Xian, Xie Quan.Thermal stability of compound stucture of silicon nanowire encapsulated in carbon nanotubes. Acta Physica Sinica, 2016, 65(11): 116501.doi:10.7498/aps.65.116501 |
[8] |
Xu Si-Wei, Wang Li, Shen Xiang.Raman scattering and X-ray photoelectron spectra of GexSb20Se80-x Glasses. Acta Physica Sinica, 2015, 64(22): 223302.doi:10.7498/aps.64.223302 |
[9] |
Yan Jian-Cheng, He Zhi-Bing, Yang Zhi-Lin, Zhang Ying, Tang Yong-Jian, Wei Jian-Jun.Influence of RF power on the structure and properties of glow discharge polymer. Acta Physica Sinica, 2011, 60(3): 036501.doi:10.7498/aps.60.036501 |
[10] |
Zhang Wang, Xu Fa-Qiang, Wang Guo-Dong, Zhang Wen-Hua, Li Zong-Mu, Wang Li-Wu, Chen Tie-Xin.Thickness dependence of the interfacial interaction for the Fe/ZnO (0001) system studied by photoemission. Acta Physica Sinica, 2011, 60(1): 017104.doi:10.7498/aps.60.017104 |
[11] |
Yan Jian-Cheng, Tang Yong-Jian, Li Ping, He Zhi-Bing, Zhang Ying.Influence of pressure on structure and properties of Si-doped glow discharge polymer film. Acta Physica Sinica, 2011, 60(6): 066803.doi:10.7498/aps.60.066803 |
[12] |
Han Lu-Hui, Zhang Chong-Hong, Zhang Li-Qing, Yang Yi-Tao, Song Yin, Sun You-Mei.X-ray photoelectron spectroscopy study on GaN crystal irradiated by slow highly charged ions. Acta Physica Sinica, 2010, 59(7): 4584-4590.doi:10.7498/aps.59.4584 |
[13] |
Xu Xue-Qin, Tang Chen-Yi, Wang Xuan, Cheng Ling, Yao Xin.In-plane and out-of-plane orientation influence on thermal stabilities of RBa2Cu3Oz thin film. Acta Physica Sinica, 2010, 59(2): 1294-1301.doi:10.7498/aps.59.1294 |
[14] |
Yan Jian-Cheng, He Zhi-Bing, Yang Zhi-Lin, Chen Zhi-Mei, Tang Yong-Jian, Wei Jian-Jun.Thermal stability of glow discharge polymer coatings on glass microspheres. Acta Physica Sinica, 2010, 59(11): 8005-8009.doi:10.7498/aps.59.8005 |
[15] |
Li Yong-Hua, Liu Chang-Sheng, Meng Fan-Ling, Wang Yu-Ming, Zheng Wei-Tao.X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films. Acta Physica Sinica, 2009, 58(4): 2742-2745.doi:10.7498/aps.58.2742 |
[16] |
Ou Gu-Ping, Song Zhen, Gui Wen-Ming, Zhang Fu-Jia.Surface analysis of LiBq4/ITO and LiBq4/CuPc/ITO using atomic force microscopy and x-ray photoelectron spectroscopy. Acta Physica Sinica, 2005, 54(12): 5717-5722.doi:10.7498/aps.54.5717 |
[17] |
Feng Yu-Qing, Zhao Kun, Zhu Tao, Zhan Wen-Shan.Thermal stability of magnetic tunnel junctions investigated by x-ray photoelectron spectroscopy. Acta Physica Sinica, 2005, 54(11): 5372-5376.doi:10.7498/aps.54.5372 |
[18] |
Yang Shen-Dong, Ning Zhao-Yuan, Huang Feng, Cheng Shan-Hua, Ye Chao.. Acta Physica Sinica, 2002, 51(6): 1321-1325.doi:10.7498/aps.51.1321 |
[19] |
LI LIU-HE, ZHANG HAI-QUAN, CUI XU-MING, ZHANG YAN-HUA, XIA LI-FANG, MA XIN-XIN, SUN YUE.COMPARATIVE ANALYSIS OF DLC FLIM FINE STRUCTURE BY RAMAN SPECTRA AND X-RAY PHOTOELECTRON SPECTROSCOPY. Acta Physica Sinica, 2001, 50(8): 1549-1554.doi:10.7498/aps.50.1549 |
[20] |
YUAN JIN-SHE, CHEN GUANG-DE, QI MING, LI AI-ZHEN, XU ZHUO.XPS AND AES INVESTIGATION OF GaN FILMS GROWN BY MBE. Acta Physica Sinica, 2001, 50(12): 2429-2433.doi:10.7498/aps.50.2429 |