[1] |
Wang Yi, Guo Zhe, Zhu Li-Da, Zhou Hong-Xian, Ma Zhen-He.Nanoscale surface topography imaging using phase-resolved spectral domain optical coherence tomography. Acta Physica Sinica, 2017, 66(15): 154202.doi:10.7498/aps.66.154202 |
[2] |
Pan Xiao, Ju Huan-Xin, Feng Xue-Fei, Fan Qi-Tang, Wang Chia-Hsin, Yang Yaw-Wen, Zhu Jun-Fa.Surface morphology of F8BT films and interface structures and reactions of Al on F8BT films. Acta Physica Sinica, 2015, 64(7): 077304.doi:10.7498/aps.64.077304 |
[3] |
Li Jiang, Tang Jing-You, Pei Wang, Wei Xian-Hua, Huang Feng.Accurate determination of thickness values and optical constants of absorbing thin films on opaque substrates with spectroscopic ellipsometry. Acta Physica Sinica, 2015, 64(11): 110702.doi:10.7498/aps.64.110702 |
[4] |
Jiang Jin-Long, Huang Hao, Wang Qiong, Wang Shan-Min, Wei Zhi-Qiang, Yang Hua, Hao Jun-Ying.Effect of deposition temperature on growth, structure and mechanical properties of diamond-like carbon films co-doped by titanium and silicon. Acta Physica Sinica, 2014, 63(2): 028104.doi:10.7498/aps.63.028104 |
[5] |
Jing Wei-Xuan, Wang Bing, Niu Ling-Ling, Qi Han, Jiang Zhuang-De, Chen Lu-Jia, Zhou Fan.Relationships between synthesizing parameters, morphology, and contact angles of ZnO nanowire films. Acta Physica Sinica, 2013, 62(21): 218102.doi:10.7498/aps.62.218102 |
[6] |
Cao Yue-Hua, Di Guo-Qing.Analysis of Y2O3 doped TiO2 films topography prepared by radio frequency magnetron sputtering. Acta Physica Sinica, 2011, 60(3): 037702.doi:10.7498/aps.60.037702 |
[7] |
Liao Guo-Jin, Luo Hong, Yan Shao-Feng, Dai Xiao-Chun, Chen Ming.Determination of the optical constants of the magnetron sputtered aluminum oxide films from the transmission spectra. Acta Physica Sinica, 2011, 60(3): 034201.doi:10.7498/aps.60.034201 |
[8] |
Di Guo-Qing.Surface morphology and optical properties of Ta2O5 films prepared by radio frequency sputtering. Acta Physica Sinica, 2011, 60(3): 038101.doi:10.7498/aps.60.038101 |
[9] |
Zhou Yi, Wu Guo-Song, Dai Wei, Li Hong-Bo, Wang Ai-Ying.Accurate determination of optical constants and thickness of absorbing thin films by a combined ellipsometry and spectrophotometry approach. Acta Physica Sinica, 2010, 59(4): 2356-2363.doi:10.7498/aps.59.2356 |
[10] |
Jiang Yang, Luo Yi, Xi Guang-Yi, Wang Lai, Li Hong-Tao, Zhao Wei, Han Yan-Jun.Effect of AlGaN intermediate layer on residual stress control and surface morphology of GaN grown on 6H-SiC substrate by metal organic vapour phase epitaxy. Acta Physica Sinica, 2009, 58(10): 7282-7287.doi:10.7498/aps.58.7282 |
[11] |
Wang Xiao-Dong, Shen Jun, Wang Sheng-Zhao, Zhang Zhi-Hua.Optical constants of sol-gel derived TiO2 films characterized by spectroscopic ellipsometry. Acta Physica Sinica, 2009, 58(11): 8027-8032.doi:10.7498/aps.58.8027 |
[12] |
Zhong Zheng-Xiang, Zheng Jia-Gui, Zhong Yong-Qiang, Yang Fan, Feng Liang-Huan, Cai Wei, Cai Ya-Ping, Zhang Jing-Quan, Li Bing, Lei Zhi, Li Wei, Wu Li-Li.The influence of doposition conditions on the structrure of ZnTe/ZnTe:Cu thin films and the properties of CdTe cells. Acta Physica Sinica, 2009, 58(7): 4920-4924.doi:10.7498/aps.58.4920 |
[13] |
Liang Li-Ping, Hao Jian-Ying, Qin Mei, Zheng Jian-Jun.Determination of the optical constants of sol-gel derived ZrO2 films simply form the transmission spectra. Acta Physica Sinica, 2008, 57(12): 7906-7911.doi:10.7498/aps.57.7906 |
[14] |
.The surface mapping and crystal orientation of body-centered cubic thin metal tungsten films of different thickness. Acta Physica Sinica, 2007, 56(12): 7248-7254.doi:10.7498/aps.56.7248 |
[15] |
Su Wei_Tao, Li Bin, Liu Ding_Quan, Zhang Feng_Shan.The relation between crystal structure and infrared optical properties of ErF3 film. Acta Physica Sinica, 2007, 56(5): 2541-2546.doi:10.7498/aps.56.2541 |
[16] |
Gu Jian-Feng, Fu Wei-Jia, Liu Ming, Liu Zhi-Wen, Ma Chun-Yu, Zhang Qing-Yu.Highly c-axis textured ZnO thin films grown by electrochemical deposition and their optical properties. Acta Physica Sinica, 2007, 56(10): 5979-5985.doi:10.7498/aps.56.5979 |
[17] |
Sun Cheng-Wei, Liu Zhi-Wen, Qin Fu-Wen, Zhang Qing-Yu, Liu Kun, Wu Shi-Fa.Influences of growth temperature on the crystalline characteristics and optical properties for ZnO films deposited by reactive magnetron sputtering. Acta Physica Sinica, 2006, 55(3): 1390-1397.doi:10.7498/aps.55.1390 |
[18] |
Wang Cheng-Wei, Wang Jian, Li Yan, Liu Wei-Min, Xu Tao, Sun Xiao-Wei, Li Hu-Lin.Determination of the optical constants of porous anodic aluminum oxide films. Acta Physica Sinica, 2005, 54(1): 439-444.doi:10.7498/aps.54.439 |
[19] |
Wang Yuan, Bai Xuan-Yu, Xu Ke-Wei.Morphological characterization and nanoindentation hardness scatter evaluation for Cu-W thin films based on wavelet transform. Acta Physica Sinica, 2004, 53(7): 2281-2286.doi:10.7498/aps.53.2281 |
[20] |
LIAO MEI-YONG, QIN FU-GUANG, CHAI CHUN-LIN, LIU ZHI-KAI, YANG SHAO-YAN, YAO ZHEN-YU, WANG ZHAN-GUO.INFLUENCE OF ION ENERGY AND DEPOSITION TEMPERATURE ON THE SURFACE MORPHOLOGY OF CARBON FILMS DEPOSITED BY ION BEAMS. Acta Physica Sinica, 2001, 50(7): 1324-1328.doi:10.7498/aps.50.1324 |