Characteristics and mechanisms of single event upset induced by atmospheric neutrons in charge trap 3D NAND flash memory

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LI Hongde; ZHANG Hong; JIAO Yang; LEI Zhifeng; YANG Weikun; LI Hui; LU Guoguang; ZHANG Zhangang

doi:10.7498/aps.75.20251123

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LI Hongde, ZHANG Hong, JIAO Yang, LEI Zhifeng, YANG Weikun, LI Hui, LU Guoguang, ZHANG Zhangang. Characteristics and mechanisms of single event upset induced by atmospheric neutrons in charge trap 3D NAND flash memoryJ. Acta Physica Sinica, 2026, 75(3): 030817. DOI: 10.7498/aps.75.20251123

Citation:

LI Hongde, ZHANG Hong, JIAO Yang, LEI Zhifeng, YANG Weikun, LI Hui, LU Guoguang, ZHANG Zhangang. Characteristics and mechanisms of single event upset induced by atmospheric neutrons in charge trap 3D NAND flash memoryJ. Acta Physica Sinica, 2026, 75(3): 030817. DOI: 10.7498/aps.75.20251123

Citation:

LI Hongde, ZHANG Hong, JIAO Yang, LEI Zhifeng, YANG Weikun, LI Hui, LU Guoguang, ZHANG Zhangang. Characteristics and mechanisms of single event upset induced by atmospheric neutrons in charge trap 3D NAND flash memoryJ. Acta Physica Sinica, 2026, 75(3): 030817. DOI: 10.7498/aps.75.20251123