Acta Physica Sinica //www.getgobooth.com/ 必威体育下载 daily 15 2024-08-20 10:33:39 apsoffice@iphy.ac.cn apsoffice@iphy.ac.cn 2024-08-20 10:33:39 zh Copyright ©Acta Physica Sinica All Rights Reserved. 京ICP备05002789号-1 Address: PostCode:100190 Phone: 010-82649829,82649241,82649863 Email: apsoffice@iphy.ac.cn Copyright ©Acta Physica Sinica All Rights Reserved apsoffice@iphy.ac.cn 1000-3290 <![CDATA[]]> //www.getgobooth.com/en/article/doi/10.7498/aps.22.849 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1966 22(8): 849-854. Published 1966-04-05 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1966 22(8): 849-854. Published 1966-04-05 1966-04-05 Personal use only, all commercial or other reuse prohibited Acta Physica Sinica. 1966 22(8): 849-854. article doi:10.7498/aps.22.849 10.7498/aps.22.849 Acta Physica Sinica 22 8 1966-04-05 //www.getgobooth.com/en/article/doi/10.7498/aps.22.849 849-854 <![CDATA[]]> //www.getgobooth.com/en/article/doi/10.7498/aps.22.855 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1966 22(8): 855-858. Published 1966-04-05 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1966 22(8): 855-858. Published 1966-04-05 1966-04-05 Personal use only, all commercial or other reuse prohibited Acta Physica Sinica. 1966 22(8): 855-858. article doi:10.7498/aps.22.855 10.7498/aps.22.855 Acta Physica Sinica 22 8 1966-04-05 //www.getgobooth.com/en/article/doi/10.7498/aps.22.855 855-858 <![CDATA[]]> //www.getgobooth.com/en/article/doi/10.7498/aps.22.859 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1966 22(8): 859-867. Published 1966-04-05 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1966 22(8): 859-867. Published 1966-04-05 1966-04-05 Personal use only, all commercial or other reuse prohibited Acta Physica Sinica. 1966 22(8): 859-867. article doi:10.7498/aps.22.859 10.7498/aps.22.859 Acta Physica Sinica 22 8 1966-04-05 //www.getgobooth.com/en/article/doi/10.7498/aps.22.859 859-867 <![CDATA[]]> //www.getgobooth.com/en/article/doi/10.7498/aps.22.868 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1966 22(8): 868-871. Published 1966-04-05 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1966 22(8): 868-871. Published 1966-04-05 1966-04-05 Personal use only, all commercial or other reuse prohibited Acta Physica Sinica. 1966 22(8): 868-871. article doi:10.7498/aps.22.868 10.7498/aps.22.868 Acta Physica Sinica 22 8 1966-04-05 //www.getgobooth.com/en/article/doi/10.7498/aps.22.868 868-871 <![CDATA[]]> //www.getgobooth.com/en/article/doi/10.7498/aps.22.872 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1966 22(8): 872-873. Published 1966-04-05 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1966 22(8): 872-873. Published 1966-04-05 1966-04-05 Personal use only, all commercial or other reuse prohibited Acta Physica Sinica. 1966 22(8): 872-873. article doi:10.7498/aps.22.872 10.7498/aps.22.872 Acta Physica Sinica 22 8 1966-04-05 //www.getgobooth.com/en/article/doi/10.7498/aps.22.872 872-873 <![CDATA[]]> //www.getgobooth.com/en/article/doi/10.7498/aps.22.874 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1966 22(8): 874-876. Published 1966-04-05 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1966 22(8): 874-876. Published 1966-04-05 1966-04-05 Personal use only, all commercial or other reuse prohibited Acta Physica Sinica. 1966 22(8): 874-876. article doi:10.7498/aps.22.874 10.7498/aps.22.874 Acta Physica Sinica 22 8 1966-04-05 //www.getgobooth.com/en/article/doi/10.7498/aps.22.874 874-876 <![CDATA[МЕТОД ЗФФЕКТА ХОЛЛА ОПРЕДЕЛЕНИИЮ ПОВЕРХНОСТНОЙ КОНЦЕНТРАЦИИ НА ДИФФУЗИОННОМ СЛОЕПЛУПРОВОД-НИКА,ГЛУБИНЫ ЭЛЕКТРОННО-ДЫРОЧНОГО ПЕРЕ-]]> //www.getgobooth.com/en/article/doi/10.7498/aps.22.877 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1966 22(8): 877-885. Published 1966-04-05 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1966 22(8): 877-885. Published 1966-04-05 МЕТОД ЗФФЕКТА ХОЛЛА ОПРЕДЕЛЕНИИЮ ПОВЕРХНОСТНОЙ КОНЦЕНТРАЦИИ НА ДИФФУЗИОННОМ СЛОЕПЛУПРОВОД-НИКА,ГЛУБИНЫ ЭЛЕКТРОННО-ДЫРОЧНОГО ПЕРЕ- 1966-04-05 Personal use only, all commercial or other reuse prohibited Acta Physica Sinica. 1966 22(8): 877-885. article doi:10.7498/aps.22.877 10.7498/aps.22.877 Acta Physica Sinica 22 8 1966-04-05 //www.getgobooth.com/en/article/doi/10.7498/aps.22.877 877-885 <![CDATA[THE DESIGN OF POWER TRANSISTOR EMITTER]]> //www.getgobooth.com/en/article/doi/10.7498/aps.22.886 Author(s): YANG CHU-LIANG <br/><p>In the design of an emitter of power transistors, the main problem is to attain good current amplification factor β for a given injection level. At a higher injection level, the current amplification factor drops off as the emitter current density is increased. One of the commonly used methods to reduce this fall-off is by increasing the emitter area. On account of the socalled "base region self-crowding effect", this would make the emitter current density not uniform over the emitter junction area, the current density dropping off rapidly at regions far from the base contact. In this paper, this effect is analyzed quantitatively for nearly all injection levels both for circular and comb structures of the junction. An "exponential decay" for the emitter current density distribution, and an effective emitter area are obtained. These results may give some reference for the design of power transistors.</p> <br/>Acta Physica Sinica. 1966 22(8): 886-904. Published 1966-04-05 Author(s): YANG CHU-LIANG <br/><p>In the design of an emitter of power transistors, the main problem is to attain good current amplification factor β for a given injection level. At a higher injection level, the current amplification factor drops off as the emitter current density is increased. One of the commonly used methods to reduce this fall-off is by increasing the emitter area. On account of the socalled "base region self-crowding effect", this would make the emitter current density not uniform over the emitter junction area, the current density dropping off rapidly at regions far from the base contact. In this paper, this effect is analyzed quantitatively for nearly all injection levels both for circular and comb structures of the junction. An "exponential decay" for the emitter current density distribution, and an effective emitter area are obtained. These results may give some reference for the design of power transistors.</p> <br/>Acta Physica Sinica. 1966 22(8): 886-904. Published 1966-04-05 THE DESIGN OF POWER TRANSISTOR EMITTER YANG CHU-LIANG 1966-04-05 Personal use only, all commercial or other reuse prohibited Acta Physica Sinica. 1966 22(8): 886-904. article doi:10.7498/aps.22.886 10.7498/aps.22.886 Acta Physica Sinica 22 8 1966-04-05 //www.getgobooth.com/en/article/doi/10.7498/aps.22.886 886-904 <![CDATA[САМОПИШУЩИЙ СПЕКТРОМЕТР С ИНТЕРФЕРОМЕТРОМ ФАБРИ-ПЕРОПРИ ПОМОЩИ СКАНИРОВАНИЯ ДАВЛЕНИЯ]]> //www.getgobooth.com/en/article/doi/10.7498/aps.22.905 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1966 22(8): 905-910. Published 1966-04-05 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1966 22(8): 905-910. Published 1966-04-05 САМОПИШУЩИЙ СПЕКТРОМЕТР С ИНТЕРФЕРОМЕТРОМ ФАБРИ-ПЕРОПРИ ПОМОЩИ СКАНИРОВАНИЯ ДАВЛЕНИЯ 1966-04-05 Personal use only, all commercial or other reuse prohibited Acta Physica Sinica. 1966 22(8): 905-910. article doi:10.7498/aps.22.905 10.7498/aps.22.905 Acta Physica Sinica 22 8 1966-04-05 //www.getgobooth.com/en/article/doi/10.7498/aps.22.905 905-910 <![CDATA[A METHOD OF DYNAMIC MEASUREMENT OF THE PIEZOELECTRIC PROPERTY OF ADP CRYSTAL]]> //www.getgobooth.com/en/article/doi/10.7498/aps.22.911 Author(s): HUANG ZHAO-MING, ZHUANG PEI-GI, JIANG ZU-TAO, YU GUI-FANG <br/><p>In this paper, a method of measuring the piezoelectric properties of ADP crystal by introducing a dynamic capacitance as well as increasing the capacitance CT in series with the vibrator and correcting the static capacitance C0 is described. The results of measurement are satisfactory.</p> <br/>Acta Physica Sinica. 1966 22(8): 911-918. Published 1966-04-05 Author(s): HUANG ZHAO-MING, ZHUANG PEI-GI, JIANG ZU-TAO, YU GUI-FANG <br/><p>In this paper, a method of measuring the piezoelectric properties of ADP crystal by introducing a dynamic capacitance as well as increasing the capacitance CT in series with the vibrator and correcting the static capacitance C0 is described. The results of measurement are satisfactory.</p> <br/>Acta Physica Sinica. 1966 22(8): 911-918. Published 1966-04-05 A METHOD OF DYNAMIC MEASUREMENT OF THE PIEZOELECTRIC PROPERTY OF ADP CRYSTAL HUANG ZHAO-MING, ZHUANG PEI-GI, JIANG ZU-TAO, YU GUI-FANG 1966-04-05 Personal use only, all commercial or other reuse prohibited Acta Physica Sinica. 1966 22(8): 911-918. article doi:10.7498/aps.22.911 10.7498/aps.22.911 Acta Physica Sinica 22 8 1966-04-05 //www.getgobooth.com/en/article/doi/10.7498/aps.22.911 911-918 <![CDATA[THE DIRECT ANALOGUE METHOD FOR THE SOLUTION OF STATIC FIELD COMPONENTS]]> //www.getgobooth.com/en/article/doi/10.7498/aps.22.919 Author(s): SHANG J <br/><p>A general principle of the direct analogue simulation of static field components was searched for. As an application of this method, the simulation of the field of a semi-infinite solid solenoid was investigated. The results obtained show that, for several special static systems, it is able to accomplish direct simulations and it has considerable advantages. The simulating solution of the above cited solenoid was given by Bz and ψ curves. With these graphs, the solution of the distribution of field strengths and force lines of any solenoid can be facilitated.</p> <br/>Acta Physica Sinica. 1966 22(8): 919-929. Published 1966-04-05 Author(s): SHANG J <br/><p>A general principle of the direct analogue simulation of static field components was searched for. As an application of this method, the simulation of the field of a semi-infinite solid solenoid was investigated. The results obtained show that, for several special static systems, it is able to accomplish direct simulations and it has considerable advantages. The simulating solution of the above cited solenoid was given by Bz and ψ curves. With these graphs, the solution of the distribution of field strengths and force lines of any solenoid can be facilitated.</p> <br/>Acta Physica Sinica. 1966 22(8): 919-929. Published 1966-04-05 THE DIRECT ANALOGUE METHOD FOR THE SOLUTION OF STATIC FIELD COMPONENTS SHANG J 1966-04-05 Personal use only, all commercial or other reuse prohibited Acta Physica Sinica. 1966 22(8): 919-929. article doi:10.7498/aps.22.919 10.7498/aps.22.919 Acta Physica Sinica 22 8 1966-04-05 //www.getgobooth.com/en/article/doi/10.7498/aps.22.919 919-929 <![CDATA[AN ANALYSIS FOR THE OPERATION CURRENT RANGE OF INJECTION LASER]]> //www.getgobooth.com/en/article/doi/10.7498/aps.22.930 Author(s): CHANG PEI-KUNG, SHIUH GEN-TWEN <br/><p>An analysis is made for the initial current, the operation current limit, and the critical threshold current of the injection laser at continuous and pulse operation conditions. Both the heat generated at junction and bulk heat generation have been taken into account simultaneously, the later can be characterized with a normalized equivalent bulk heating resistance r. For the continuous operation case, it is shown that the bulk heat generation cannot often be neglected. In the analysis for pulse operation case, the effect of pulse duration and that of repetition frequency have been considered respectively. It is indicated that when both the high power and high repetition frequency operation are desirable, it will be optimum to choose the duty cycle approach to 0.03. In some applications where the repetition frequency is not an important factor, to make the repetition period just three times larger than the thermal relaxation time of lasers is suitable. As the repetition frequency increased sufficiently, the performance of lasers is determined by the duty cycle mainly. Examples of the analysis applied to some typical cases have been illustrated and the emission spectral band broadening originated from junction temperature variation during pulse operation is briefly discussed.</p> <br/>Acta Physica Sinica. 1966 22(8): 930-944. Published 1966-04-05 Author(s): CHANG PEI-KUNG, SHIUH GEN-TWEN <br/><p>An analysis is made for the initial current, the operation current limit, and the critical threshold current of the injection laser at continuous and pulse operation conditions. Both the heat generated at junction and bulk heat generation have been taken into account simultaneously, the later can be characterized with a normalized equivalent bulk heating resistance r. For the continuous operation case, it is shown that the bulk heat generation cannot often be neglected. In the analysis for pulse operation case, the effect of pulse duration and that of repetition frequency have been considered respectively. It is indicated that when both the high power and high repetition frequency operation are desirable, it will be optimum to choose the duty cycle approach to 0.03. In some applications where the repetition frequency is not an important factor, to make the repetition period just three times larger than the thermal relaxation time of lasers is suitable. As the repetition frequency increased sufficiently, the performance of lasers is determined by the duty cycle mainly. Examples of the analysis applied to some typical cases have been illustrated and the emission spectral band broadening originated from junction temperature variation during pulse operation is briefly discussed.</p> <br/>Acta Physica Sinica. 1966 22(8): 930-944. Published 1966-04-05 AN ANALYSIS FOR THE OPERATION CURRENT RANGE OF INJECTION LASER CHANG PEI-KUNG, SHIUH GEN-TWEN 1966-04-05 Personal use only, all commercial or other reuse prohibited Acta Physica Sinica. 1966 22(8): 930-944. article doi:10.7498/aps.22.930 10.7498/aps.22.930 Acta Physica Sinica 22 8 1966-04-05 //www.getgobooth.com/en/article/doi/10.7498/aps.22.930 930-944 <![CDATA[INTERMEDIATE VECTOR BOSON EFFECTS IN HIGH-ENERGY νN "ELASTIC" REACTIONS]]> //www.getgobooth.com/en/article/doi/10.7498/aps.22.945 Author(s): ZHU XI-WEN, HE XIANG-SHENG, ZENG XI-ZHI <br/><p>Using the intermediate vector boson (IVB) theory and Cabibbo's SU3 model for the weak interaction, the analytical expressions and numerical results for the differential cross-sections and the longitudinal polarizations of the final state particles of several νN "elastic" reactions have been obtained. The results show that, for the given set of form factors usually assumed, the IVB effects on the longitudinal polarizations of the leptons and the hyperons are substantial near certain outgoing angles when the neutrino energy is high enough. The results also show that some informations about the form factors and the mass of the IVB can be obtained from the experimental results of the differential cross-section and the longitudinal polarization taken together if they are accurate enough. The nuclear effects and the effect of the neutrino beam energy spectrum on the longitudinal polarization of the muon have also been estimated for the process νμ + [ Z, A ] →μ- + [Z + 1, A].</p> <br/>Acta Physica Sinica. 1966 22(8): 945-951. Published 1966-04-05 Author(s): ZHU XI-WEN, HE XIANG-SHENG, ZENG XI-ZHI <br/><p>Using the intermediate vector boson (IVB) theory and Cabibbo's SU3 model for the weak interaction, the analytical expressions and numerical results for the differential cross-sections and the longitudinal polarizations of the final state particles of several νN "elastic" reactions have been obtained. The results show that, for the given set of form factors usually assumed, the IVB effects on the longitudinal polarizations of the leptons and the hyperons are substantial near certain outgoing angles when the neutrino energy is high enough. The results also show that some informations about the form factors and the mass of the IVB can be obtained from the experimental results of the differential cross-section and the longitudinal polarization taken together if they are accurate enough. The nuclear effects and the effect of the neutrino beam energy spectrum on the longitudinal polarization of the muon have also been estimated for the process νμ + [ Z, A ] →μ- + [Z + 1, A].</p> <br/>Acta Physica Sinica. 1966 22(8): 945-951. Published 1966-04-05 INTERMEDIATE VECTOR BOSON EFFECTS IN HIGH-ENERGY νN "ELASTIC" REACTIONS ZHU XI-WEN, HE XIANG-SHENG, ZENG XI-ZHI 1966-04-05 Personal use only, all commercial or other reuse prohibited Acta Physica Sinica. 1966 22(8): 945-951. article doi:10.7498/aps.22.945 10.7498/aps.22.945 Acta Physica Sinica 22 8 1966-04-05 //www.getgobooth.com/en/article/doi/10.7498/aps.22.945 945-951 <![CDATA[]]> //www.getgobooth.com/en/article/doi/10.7498/aps.22.952 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1966 22(8): 952-954. Published 1966-04-05 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1966 22(8): 952-954. Published 1966-04-05 1966-04-05 Personal use only, all commercial or other reuse prohibited Acta Physica Sinica. 1966 22(8): 952-954. article doi:10.7498/aps.22.952 10.7498/aps.22.952 Acta Physica Sinica 22 8 1966-04-05 //www.getgobooth.com/en/article/doi/10.7498/aps.22.952 952-954 <![CDATA[]]> //www.getgobooth.com/en/article/doi/10.7498/aps.22.955 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1966 22(8): 955-957. Published 1966-04-05 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1966 22(8): 955-957. Published 1966-04-05 1966-04-05 Personal use only, all commercial or other reuse prohibited Acta Physica Sinica. 1966 22(8): 955-957. article doi:10.7498/aps.22.955 10.7498/aps.22.955 Acta Physica Sinica 22 8 1966-04-05 //www.getgobooth.com/en/article/doi/10.7498/aps.22.955 955-957 <![CDATA[]]> //www.getgobooth.com/en/article/doi/10.7498/aps.22.958 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1966 22(8): 958-960. Published 1966-04-05 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1966 22(8): 958-960. Published 1966-04-05 1966-04-05 Personal use only, all commercial or other reuse prohibited Acta Physica Sinica. 1966 22(8): 958-960. article doi:10.7498/aps.22.958 10.7498/aps.22.958 Acta Physica Sinica 22 8 1966-04-05 //www.getgobooth.com/en/article/doi/10.7498/aps.22.958 958-960 <![CDATA[]]> //www.getgobooth.com/en/article/doi/10.7498/aps.22.961 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1966 22(8): 961-966. Published 1966-04-05 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1966 22(8): 961-966. Published 1966-04-05 1966-04-05 Personal use only, all commercial or other reuse prohibited Acta Physica Sinica. 1966 22(8): 961-966. article doi:10.7498/aps.22.961 10.7498/aps.22.961 Acta Physica Sinica 22 8 1966-04-05 //www.getgobooth.com/en/article/doi/10.7498/aps.22.961 961-966
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