Redundancy hardening design for single event upset tolerance in a dual interlocked storage cell flip-flop

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LIU Ye; GUO Hongxia; ZHANG Hong; LIU Xiangyuan; DING Lili; LIU Zeteng; LAI Shankun; LI Yunfei

doi:10.7498/aps.75.20251574

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LIU Ye, GUO Hongxia, ZHANG Hong, LIU Xiangyuan, DING Lili, LIU Zeteng, LAI Shankun, LI Yunfei. Redundancy hardening design for single event upset tolerance in a dual interlocked storage cell flip-flopJ. Acta Physica Sinica, 2026, 75(8): 080810. DOI: 10.7498/aps.75.20251574

Citation:

LIU Ye, GUO Hongxia, ZHANG Hong, LIU Xiangyuan, DING Lili, LIU Zeteng, LAI Shankun, LI Yunfei. Redundancy hardening design for single event upset tolerance in a dual interlocked storage cell flip-flopJ. Acta Physica Sinica, 2026, 75(8): 080810. DOI: 10.7498/aps.75.20251574

Citation:

LIU Ye, GUO Hongxia, ZHANG Hong, LIU Xiangyuan, DING Lili, LIU Zeteng, LAI Shankun, LI Yunfei. Redundancy hardening design for single event upset tolerance in a dual interlocked storage cell flip-flopJ. Acta Physica Sinica, 2026, 75(8): 080810. DOI: 10.7498/aps.75.20251574