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Zhang Fu-Ping, Li Xi-Qin, Du Jin-Mei, Liu Yu-Sheng, Ye Fu-Qing.Failure distribution and reliable analysis of ferroelectric ceramics under pulsed electric field. Acta Physica Sinica, 2024, 73(10): 107701.doi:10.7498/aps.73.20231354 |
[2] |
Shen Jian-Xin, Shang Da-Shan, Sun Young.Fundamental circuit element and nonvolatile memory based on magnetoelectric effect. Acta Physica Sinica, 2018, 67(12): 127501.doi:10.7498/aps.67.20180712 |
[3] |
Huang Fei-Hu, Peng Jian, You Ming-Yang.Analyses of characetristics of air passenger group mobility behaviors. Acta Physica Sinica, 2016, 65(22): 228901.doi:10.7498/aps.65.228901 |
[4] |
Zhou Hang, Cui Jiang-Wei, Zheng Qi-Wen, Guo Qi, Ren Di-Yuan, Yu Xue-Feng.Reliability of partially-depleted silicon-on-insulator n-channel metal-oxide-semiconductor field-effect transistor under the ionizing radiation environment. Acta Physica Sinica, 2015, 64(8): 086101.doi:10.7498/aps.64.086101 |
[5] |
Jiang Xian-Wei, Dai Guang-Zhen, Lu Shi-Bin, Wang Jia-Yu, Dai Yue-Hua, Chen Jun-Ning.Effect of Al doping on the reliability of HfO2 as a trapping layer: First-principles study. Acta Physica Sinica, 2015, 64(9): 091301.doi:10.7498/aps.64.091301 |
[6] |
Wang Tian-Shu, Zhang Rui-De, Guan Zhe, Ba Ke, Zu Yun-Xiao.Properties of memristor in RLC circuit and diode circuit. Acta Physica Sinica, 2014, 63(17): 178101.doi:10.7498/aps.63.178101 |
[7] |
Li Ri, Wang Jian, Zhou Li-Ming, Pan Hong.The reliability analysis of using the volume averaging method to simulate the solidification process in a ingot. Acta Physica Sinica, 2014, 63(12): 128103.doi:10.7498/aps.63.128103 |
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Wang Xiu-Zhi, Gao Jin-Song, Xu Nian-Xi.Quick analysis of miniaturized-element frequency selective surface that loaded with lumped elements by using an equivalent circuit model. Acta Physica Sinica, 2013, 62(20): 207301.doi:10.7498/aps.62.207301 |
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Wang Xin-Hua, Wang Jian-Hui, Pang Lei, Chen Xiao-Juan, Yuan Ting-Ting, Luo Wei-Jun, Liu Xin-Yu.Reliability of SiN-based MIM capacitors in GaN MMIC. Acta Physica Sinica, 2012, 61(17): 177302.doi:10.7498/aps.61.177302 |
[10] |
Song Wei-Cai, Zhang Yong-Jin.Reliability of multi-state and multi-subsystem below stress-strength interference. Acta Physica Sinica, 2011, 60(2): 021201.doi:10.7498/aps.60.021201 |
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Zhang Yong-Jin, Wang Zhong-Zhi.Cumulative damage model and parameter estimate about a kind of time-sharing redundant system. Acta Physica Sinica, 2009, 58(9): 6074-6079.doi:10.7498/aps.58.6074 |
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Luan Su-Zhen, Liu Hong-Xia, Jia Ren-Xu.The dynamic reliability of ultra-thin gate oxide and its breakdown characteristics. Acta Physica Sinica, 2008, 57(4): 2524-2528.doi:10.7498/aps.57.2524 |
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Zhang Yi-Min, Zhang Xu-Fang.Reliability analysis of double random Duffing system. Acta Physica Sinica, 2008, 57(7): 3989-3995.doi:10.7498/aps.57.3989 |
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Wang Yong-Long, Li Zi-Ping, Xu Chang-Tan.Fractional spins and fractional statistics of composite Boson field. Acta Physica Sinica, 2006, 55(5): 2149-2151.doi:10.7498/aps.55.2149 |
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Hu Jin, Du Lei, Zhuang Yi-Qi, Bao Jun-Lin, Zhou Jiang.Noise as a representation for reliability of light emitting diode. Acta Physica Sinica, 2006, 55(3): 1384-1389.doi:10.7498/aps.55.1384 |
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Zhao Yi, Wan Xing-Gong.Substrate and process dependence of gate oxide reliability of 0.18μm dual gate CMOS process. Acta Physica Sinica, 2006, 55(6): 3003-3006.doi:10.7498/aps.55.3003 |
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Liu Hong-Xia, Zheng Xue-Feng, Han Xiao-Liang, Hao Yue, Z hang Mian.A new method to evaluate reliability in GaAs PHEMT's. Acta Physica Sinica, 2003, 52(10): 2576-2579.doi:10.7498/aps.52.2576 |
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ZHOU CHUAN-HONG, WANG LEI, WANG ZHI-HENG.APPROACHES TO IMPROVE THE CALCULATING CONVERGENCE OF GRATING DIFFRACTION. Acta Physica Sinica, 2001, 50(6): 1046-1051.doi:10.7498/aps.50.1046 |
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ZHU CHUAN-GUI, XUE MING-QIU, LIU DE-SEN, GAO YING-JUN.DIFFRACTION THEORY ANALYSIS OF THE OPTICAL ELEMENT ARRAYS. Acta Physica Sinica, 1993, 42(3): 394-399.doi:10.7498/aps.42.394 |
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XING XIU-SAN.THE PHYSICAL KINETICS OF STRUCTURAL RELIABILITY. Acta Physica Sinica, 1986, 35(6): 741-749.doi:10.7498/aps.35.741 |