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Zhang Jing-Qi, Hao Qi, Lyu Guo-Jian, Xiong Bi-Jin, Qiao Ji-Chao.Understanding stress relaxation behavior of amorphous polystyrene based on microstructural heterogeneity. Acta Physica Sinica, 2024, 73(3): 037601.doi:10.7498/aps.73.20231240 |
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He Ju-Sheng, Zhang Meng, Zou Ji-Jun, Pan Hua-Qing, Qi Wei-Jing, Li Ping.Analyses of determination conditions of n-GaN dislocation density by triple-axis X-ray diffraction. Acta Physica Sinica, 2017, 66(21): 216102.doi:10.7498/aps.66.216102 |
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Ming Bao-Quan, Wang Jin-Feng, Zang Guo-Zhong, Wang Chun-Ming, Gai Zhi-Gang, Du Juan, Zheng Li-Mei.X-ray diffraction and phase transition analysis for (K, Na)NbO3-based lead-free piezoelectric ceramics. Acta Physica Sinica, 2008, 57(9): 5962-5967.doi:10.7498/aps.57.5962 |
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Wang Huan, Yao Shu-De, Pan Yao-Bo, Zhang Guo-Yi.Strain in AlInGaN thin films caused by different contents of Al and In studied by Rutherford backscattering/channeling and high resolution X-ray diffraction. Acta Physica Sinica, 2007, 56(6): 3350-3354.doi:10.7498/aps.56.3350 |
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Tan Guo-Tai, Chen Zheng-Hao.XRD analysis on lattice structure of La1-xTexMnO3. Acta Physica Sinica, 2007, 56(3): 1702-1706.doi:10.7498/aps.56.1702 |
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Qin Pei, Lou Yu-Wan, Yang Chuan-Zheng, Xia Bao-Jia.New computing methods and programs for separating multipe-broadening effects of X-ray diffraction lines. Acta Physica Sinica, 2006, 55(3): 1325-1335.doi:10.7498/aps.55.1325 |
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Xu Min, Sheng Wen, Gao Zhan, Zhao Liang-Lei, Jiang Bei, Yang Lei, Zhang Lan-Ting.Characterisation of the crystal structure of La0.4FeCo3Sb12 by means of x-ray and electron diffractions. Acta Physica Sinica, 2005, 54(7): 3302-3306.doi:10.7498/aps.54.3302 |
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Ma Hong-Wei, Liang Jing-Kui.A new approach to extract reliable intensities of non-equivalent systematical overlapping reflections from powder diffraction data. Acta Physica Sinica, 2004, 53(3): 829-834.doi:10.7498/aps.53.829 |
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QI ZE-MING, SHI CHAO-SHU, WANG ZHENG, WEI YA-GUANG, XIE YA-NING, HU TIAN-DOU, LI FU-LI.AMORPHOUS AND NANOCRYSTALLINE ZrO2·Y2O3(15%) STUDIED BY EXTENDED X-RAY ABSORPTION FINE STRUCTURE. Acta Physica Sinica, 2001, 50(7): 1318-1323.doi:10.7498/aps.50.1318 |
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CHU GANG.A DOPING METHOD FOR QUANTITATIVE X-RAY DIFFRACTION PHASE ANALYSIS OF SAMPLES CONTAINING AMORPHOUS MATERIAL. Acta Physica Sinica, 1998, 47(7): 1143-1148.doi:10.7498/aps.47.1143 |
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Wang Xu-Wei, Zhou Wei-Yang, Chen Jin-Chang, Shen Bao-Gen, Tong Li-Tai.. Acta Physica Sinica, 1995, 44(9): 1395-1403.doi:10.7498/aps.44.1395 |
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CHU GANG.. Acta Physica Sinica, 1995, 44(10): 1679-1683.doi:10.7498/aps.44.1679 |
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SHAO JIAN-DA, FAN ZHENG-XIU, YIN GONG-JIE, YUAN LI-XIANG.SMALL-ANGLE X-RAY DIFFRACTION IN ANALYSES OF THE STRUCTURE OF COATINGS. Acta Physica Sinica, 1994, 43(6): 958-965.doi:10.7498/aps.43.958 |
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WANG WEI-HUA, BAI HAI-YANG, ZHANG YUN, CHEN HONG, WANG WEN-KUI.STUDY THE DIFFUSION MECHANISM OF Ni IN AMORPHOUS Si BY X-RAY DIFFRACTION. Acta Physica Sinica, 1993, 42(9): 1505-1509.doi:10.7498/aps.42.1505 |
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SUN RUN-GUANG, WANG DE-HUA, WANG ZI-HAO, ZHANG JING.A STUDY FOR THE INFLUENCE OF CH2Cl2,CHCl3, CCl4 ON THE PHOSPHATIDYLCHOLINE LIQUID-CRYSTAL STRUCTURE BY MEANS OF THE SMALL- ANGLE X-RAY SCATTERING. Acta Physica Sinica, 1992, 41(4): 554-560.doi:10.7498/aps.41.554 |
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ZHOU GUO-LIANG, SHEN XIAO-LIANG, SHENG CHI, JIANG WEI-DONG, YU MING-REN.SMALL-ANGLE X-RAY DIFFRACTION ANALYSIS OF GexSi1-x/Si SUPERLATTICE. Acta Physica Sinica, 1991, 40(1): 56-63.doi:10.7498/aps.40.56 |
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WU ZHI-QIANG, LU XIANG-DONG, HUANG WEN-YONG, LIU HONG-TU, JIN HUAI-CHENG, WANG CHANG-SUI, ZHOU GUI-EN, WU ZI-QIN.SMALL-ANGLE X-RAY DIFFRACTION STUDY OF AMORPHOUS MULTILAYER AND SINGLE LAYER THIN FILMS. Acta Physica Sinica, 1987, 36(5): 591-598.doi:10.7498/aps.36.591 |
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GUO CHANG-LIN, YAO GONG-DA.NEW GENERAL METHOD OF X-RAY DIFFRACTION QUANTITATIVE PHASE ANALYSIS WITHOUT STANDARDS. Acta Physica Sinica, 1985, 34(11): 1451-1460.doi:10.7498/aps.34.1451 |
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GUO CHANG-LIN.QUANTITATIVE DETERMINATION OF SPECTRAL PURITY OF X-RAY TUBES FOR DIFFRACTION ANALYSIS. Acta Physica Sinica, 1980, 29(1): 35-45.doi:10.7498/aps.29.35 |
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GUO CHANG-LIN, WU YU-QIN.X-RAY POWDER DIFFRACTION STUDY OF MIXED BISMUTH OXIDE FERROELECTRICS WITH LAYER TYPE STRUCTURE PbBi4Ti4O15AND SrBi4Ti4O15. Acta Physica Sinica, 1980, 29(11): 1490-1496.doi:10.7498/aps.29.1490 |