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He Ju-Sheng, Zhang Meng, Zou Ji-Jun, Pan Hua-Qing, Qi Wei-Jing, Li Ping.Analyses of determination conditions of n-GaN dislocation density by triple-axis X-ray diffraction. Acta Physica Sinica, 2017, 66(21): 216102.doi:10.7498/aps.66.216102 |
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Xu Xiao-Ming, Miao Wei, Tao Kun.Direct method of determining the lattice parameters of a phase from X-ray diffraction pattern of multi-phase. Acta Physica Sinica, 2011, 60(8): 086101.doi:10.7498/aps.60.086101 |
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Ming Bao-Quan, Wang Jin-Feng, Zang Guo-Zhong, Wang Chun-Ming, Gai Zhi-Gang, Du Juan, Zheng Li-Mei.X-ray diffraction and phase transition analysis for (K, Na)NbO3-based lead-free piezoelectric ceramics. Acta Physica Sinica, 2008, 57(9): 5962-5967.doi:10.7498/aps.57.5962 |
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QI ZE-MING, SHI CHAO-SHU, WANG ZHENG, WEI YA-GUANG, XIE YA-NING, HU TIAN-DOU, LI FU-LI.AMORPHOUS AND NANOCRYSTALLINE ZrO2·Y2O3(15%) STUDIED BY EXTENDED X-RAY ABSORPTION FINE STRUCTURE. Acta Physica Sinica, 2001, 50(7): 1318-1323.doi:10.7498/aps.50.1318 |
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CHU GANG.A DOPING METHOD FOR QUANTITATIVE X-RAY DIFFRACTION PHASE ANALYSIS OF SAMPLES CONTAINING AMORPHOUS MATERIAL. Acta Physica Sinica, 1998, 47(7): 1143-1148.doi:10.7498/aps.47.1143 |
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LIU HONG-CHAO, GUO CHANG-LIN.X-RAY POWDER DIFFRACTION RIETVELD METHOD IN-QUANTITATIVE DETERMINATION OF SiC POLYTYPES. Acta Physica Sinica, 1997, 46(3): 524-529.doi:10.7498/aps.46.524 |
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LUO JIAN, YAN HONG, TAO KUN.X-RAY DIFFRACTION PHASE DEPTH PROFILING FOR POLYCRYSTAL WITH CONTINUOUS PHASE DEPTH DISTRIBUTION. Acta Physica Sinica, 1995, 44(11): 1788-1792.doi:10.7498/aps.44.1788 |
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LI CHAO-QUN, N.J.Park, H.J.Bunge.. Acta Physica Sinica, 1995, 44(1): 98-104.doi:10.7498/aps.44.98 |
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SHAO JIAN-DA, FAN ZHENG-XIU, YIN GONG-JIE, YUAN LI-XIANG.SMALL-ANGLE X-RAY DIFFRACTION IN ANALYSES OF THE STRUCTURE OF COATINGS. Acta Physica Sinica, 1994, 43(6): 958-965.doi:10.7498/aps.43.958 |
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WANG WEI-HUA, BAI HAI-YANG, ZHANG YUN, CHEN HONG, WANG WEN-KUI.STUDY THE DIFFUSION MECHANISM OF Ni IN AMORPHOUS Si BY X-RAY DIFFRACTION. Acta Physica Sinica, 1993, 42(9): 1505-1509.doi:10.7498/aps.42.1505 |
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GUO CHANG-LIN, HUANG YUE-HONG.STABLE SOLUTIONS OF THE LEAST SQUARE SIMULTANEOUS EQUATIONS IN QUANTITATIVE X-RAY PHASE ANALYSIS WITHOUT STANDARDS. Acta Physica Sinica, 1993, 42(7): 1106-1111.doi:10.7498/aps.42.1106 |
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GUO CHANG-LIN, HUANG YUE-HONG.STATISTICAL CRITERION FACTOR OF THE STABILITY OF THE SIMULTANEOUS EQUATIONS FOR X-RAY QUANTI-TATIVE PHASE ANALYSIS WITHOUT STANDARDS. Acta Physica Sinica, 1992, 41(8): 1289-1295.doi:10.7498/aps.41.1289 |
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GUO CHANG-LIN, YAO GONG-DA.NEW GENERAL METHOD OF X-RAY DIFFRACTION QUANTITATIVE PHASE ANALYSIS WITHOUT STANDARDS. Acta Physica Sinica, 1985, 34(11): 1451-1460.doi:10.7498/aps.34.1451 |
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WAN DE-RUI, FENG JIAN-QING, ZENG JIA-YU, LIU XAO-GUANG, ZHONG YUAN-QING.QUANTITATIVE EDS ANALYSIS OF THE CONSTITUENTS OF BINARY COMPOUNDS WITHOUT STANDARD SAMPLES. Acta Physica Sinica, 1984, 33(6): 762-769.doi:10.7498/aps.33.762 |
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Zhang Ren-ji, Wu Zi-qin.NO-STANDARDS QUANTITATIVE EDS ANALYSIS OF MULTICOMPONENT ALLOYS. Acta Physica Sinica, 1982, 31(10): 1395-1400.doi:10.7498/aps.31.1395 |
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ZHANG REN-JI, GE SEN-LIN, WU ZI-QIN.NO-STANDARDS QUANTITATIVE EDS ANALYSIS OF THE CONSTITUENTS OF BINARY ALLOYS CONTAINING LIGHT ELEMENTS. Acta Physica Sinica, 1981, 30(2): 208-217.doi:10.7498/aps.30.208 |
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JIN LONG-HUAN, CHANG LONG-CHUN.X-RAY STRUCTURE ANALYSIS OF AMORPHOUS ALLOYS FeCoSiB, FeSiB AND FeB. Acta Physica Sinica, 1980, 29(10): 1275-1282.doi:10.7498/aps.29.1275 |
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GUO CHANG-LIN.QUANTITATIVE DETERMINATION OF SPECTRAL PURITY OF X-RAY TUBES FOR DIFFRACTION ANALYSIS. Acta Physica Sinica, 1980, 29(1): 35-45.doi:10.7498/aps.29.35 |
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