[1] |
Hou Jia-Jia, Zhang Da-Cheng, Feng Zhong-Qi, Zhu Jiang-Feng.Quantitative analysis method of laser-induced breakdown spectroscopy based on temperature iterative correction of self-absorption effect. Acta Physica Sinica, 2024, 73(5): 054205.doi:10.7498/aps.73.20231541 |
[2] |
Zhang Fei-Peng, Lu Qing-Mei, Zhang Jiu-Xing, Zhang Xin.Texture and electrical transport properties of Ba and Ag double substituted BaxAgyCa3-x-yCo4O9 oxide. Acta Physica Sinica, 2009, 58(4): 2697-2701.doi:10.7498/aps.58.2697 |
[3] |
Liu Li-Xiang, Du Guo-Hao, Hu Wen, Luo Yu-Yu, Xie Hong-Lan, Chen Min, Xiao Ti-Qiao.Application of quantitative imaging to elimination of scattering effect on X-ray in-line outline imaging. Acta Physica Sinica, 2006, 55(12): 6387-6394.doi:10.7498/aps.55.6387 |
[4] |
Zhang Yu-Long, Yao Xin, Zhang Hong, Jin Yan-Ping.The oxygen in- and out-diffusion behavior in melt-textured YBCO measured by thermogravimetry. Acta Physica Sinica, 2005, 54(7): 3380-3385.doi:10.7498/aps.54.3380 |
[5] |
Zhang Jian-Min, Xu Ke-Wei.Investigation of abnormal grain growth andtexture change in Ag and Cu films. Acta Physica Sinica, 2003, 52(1): 145-149.doi:10.7498/aps.52.145 |
[6] |
YANG JIA-MIN, DING YAO-NAN, YI RONG-QING, WANG YAO-MEI, ZHANG WEN-HAI, ZHENG ZHI-JIAN.QUANTITATIVE MEASUREMENT OF SOFT-X-RAY SPECTRUM USING TRANSMISSION GRATING SPECTROMETER. Acta Physica Sinica, 2001, 50(9): 1723-1728.doi:10.7498/aps.50.1723 |
[7] |
LI JIAN-JUN, WANG ZONG-KAI, LING ZHI-HUA, IAN YAN-QING, HUANG XI-MIN.STUDY OF THE STRIPED TEXTURE IN THE POLYMER NETWORK STABILIZED FERROELECTRIC LIQUID CRYSTAL CELLS. Acta Physica Sinica, 1998, 47(8): 1311-1317.doi:10.7498/aps.47.1311 |
[8] |
CHU GANG.A DOPING METHOD FOR QUANTITATIVE X-RAY DIFFRACTION PHASE ANALYSIS OF SAMPLES CONTAINING AMORPHOUS MATERIAL. Acta Physica Sinica, 1998, 47(7): 1143-1148.doi:10.7498/aps.47.1143 |
[9] |
LIU HONG-CHAO, GUO CHANG-LIN.X-RAY POWDER DIFFRACTION RIETVELD METHOD IN-QUANTITATIVE DETERMINATION OF SiC POLYTYPES. Acta Physica Sinica, 1997, 46(3): 524-529.doi:10.7498/aps.46.524 |
[10] |
CHU GANG.. Acta Physica Sinica, 1995, 44(10): 1679-1683.doi:10.7498/aps.44.1679 |
[11] |
MENG ZHAO-FU.BACKGROUND CORRECTION OF THE SAXS INTENSITIES SCATTERED BY THE AGED METALLIC GLASS. Acta Physica Sinica, 1994, 43(3): 411-415.doi:10.7498/aps.43.411 |
[12] |
GUO CHANG-LIN, HUANG YUE-HONG.STABLE SOLUTIONS OF THE LEAST SQUARE SIMULTANEOUS EQUATIONS IN QUANTITATIVE X-RAY PHASE ANALYSIS WITHOUT STANDARDS. Acta Physica Sinica, 1993, 42(7): 1106-1111.doi:10.7498/aps.42.1106 |
[13] |
GUO CHANG-LIN, HUANG YUE-HONG.STATISTICAL CRITERION FACTOR OF THE STABILITY OF THE SIMULTANEOUS EQUATIONS FOR X-RAY QUANTI-TATIVE PHASE ANALYSIS WITHOUT STANDARDS. Acta Physica Sinica, 1992, 41(8): 1289-1295.doi:10.7498/aps.41.1289 |
[14] |
WEI CHONG-DE, LIU ZUN-XIAO, LAN JIAN, SUN YUN-XI, GAN ZI-ZHAO, REN HONG-TAO, XIAO LINO, HE QING.MAGNETIC PROPERTIES OF A YBCO CRYSTAL PREPARED BY MELT-TEXTURED GROWTH METHOD. Acta Physica Sinica, 1991, 40(10): 1694-1702.doi:10.7498/aps.40.1694 |
[15] |
YAO GONG-DA, GUO CHANG-LIN.MULTIPHASE DOPING METHOD IN QUANTITATIVE X-RAY DIFFRACTION PHASE ANALYSIS. Acta Physica Sinica, 1985, 34(11): 1461-1468.doi:10.7498/aps.34.1461 |
[16] |
GUO CHANG-LIN, YAO GONG-DA.NEW GENERAL METHOD OF X-RAY DIFFRACTION QUANTITATIVE PHASE ANALYSIS WITHOUT STANDARDS. Acta Physica Sinica, 1985, 34(11): 1451-1460.doi:10.7498/aps.34.1451 |
[17] |
WAN DE-RUI, FENG JIAN-QING, ZENG JIA-YU, LIU XAO-GUANG, ZHONG YUAN-QING.QUANTITATIVE EDS ANALYSIS OF THE CONSTITUENTS OF BINARY COMPOUNDS WITHOUT STANDARD SAMPLES. Acta Physica Sinica, 1984, 33(6): 762-769.doi:10.7498/aps.33.762 |
[18] |
CHEN YONG-QI, MAO YUN-JING.CALCULATION OF THE DEPTH DISTRIBUTION OF X-RAY φ(ρz) AND QUANTITATIVE ELECTRON PROBE MICROANALYSIS. Acta Physica Sinica, 1984, 33(5): 621-628.doi:10.7498/aps.33.621 |
[19] |
GUO CHANG-LIN, JI ANG, TAO GUANG-YI.QUANTITATIVE DETERMINATION OF INTENSITY DISTRIBUTION OF PRIMARY X-RAY SPECTRUM. Acta Physica Sinica, 1981, 30(10): 1351-1360.doi:10.7498/aps.30.1351 |
[20] |
GUO CHANG-LIN.QUANTITATIVE DETERMINATION OF SPECTRAL PURITY OF X-RAY TUBES FOR DIFFRACTION ANALYSIS. Acta Physica Sinica, 1980, 29(1): 35-45.doi:10.7498/aps.29.35 |