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Xu Xiao-Ming, Miao Wei, Tao Kun.Direct method of determining the lattice parameters of a phase from X-ray diffraction pattern of multi-phase. Acta Physica Sinica, 2011, 60(8): 086101.doi:10.7498/aps.60.086101 |
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Zhao Hui, Guo Mei-Fang, Dong Bao-Zhong.Determination of the transition-layer thickness of a crystalline polymer by using small-angle x-ray scattering. Acta Physica Sinica, 2004, 53(4): 1247-1250.doi:10.7498/aps.53.1247 |
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YANG JIA-MIN, DING YAO-NAN, YI RONG-QING, WANG YAO-MEI, ZHANG WEN-HAI, ZHENG ZHI-JIAN.QUANTITATIVE MEASUREMENT OF SOFT-X-RAY SPECTRUM USING TRANSMISSION GRATING SPECTROMETER. Acta Physica Sinica, 2001, 50(9): 1723-1728.doi:10.7498/aps.50.1723 |
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LI ZHI-HONG, SUN JI-HONG, WU DONG, SUN YU-HAN, LIU YI, SHENG WEN-JUN, DONG BAO-ZHONG.DETERMINATION OF AVERAGE PORE DIAMETER OF SiO2 XEROGELS BY SMALL ANGLE X-RA Y SCATTERING. Acta Physica Sinica, 2000, 49(7): 1312-1315.doi:10.7498/aps.49.1312 |
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CHU GANG.A DOPING METHOD FOR QUANTITATIVE X-RAY DIFFRACTION PHASE ANALYSIS OF SAMPLES CONTAINING AMORPHOUS MATERIAL. Acta Physica Sinica, 1998, 47(7): 1143-1148.doi:10.7498/aps.47.1143 |
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LIU HONG-CHAO, GUO CHANG-LIN.X-RAY POWDER DIFFRACTION RIETVELD METHOD IN-QUANTITATIVE DETERMINATION OF SiC POLYTYPES. Acta Physica Sinica, 1997, 46(3): 524-529.doi:10.7498/aps.46.524 |
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LI CHAO-QUN, N.J.Park, H.J.Bunge.. Acta Physica Sinica, 1995, 44(1): 98-104.doi:10.7498/aps.44.98 |
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LUO JIAN, YAN HONG, TAO KUN.X-RAY DIFFRACTION PHASE DEPTH PROFILING FOR POLYCRYSTAL WITH CONTINUOUS PHASE DEPTH DISTRIBUTION. Acta Physica Sinica, 1995, 44(11): 1788-1792.doi:10.7498/aps.44.1788 |
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CHU GANG.. Acta Physica Sinica, 1995, 44(10): 1679-1683.doi:10.7498/aps.44.1679 |
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XU KE-WEI, GAO RUN-SHENG, YU LI-GEN, HE JIA-WEN.THIN FILM STRESS EVALUATION BY A GLANCING X-RAY BEAM. Acta Physica Sinica, 1994, 43(8): 1295-1300.doi:10.7498/aps.43.1295 |
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WANG XIN-JIU, ZHAO JING-AN, CHENG HONG-FEI, TAO KUN, WANG LIANG-YU, PEI XUE-FENG.AN X-RAY STUDY OF MESOPHASE OF BOWL-LIKE COMPOUNDS. Acta Physica Sinica, 1988, 37(10): 1729-1734.doi:10.7498/aps.37.1729 |
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LIU YUN-JI, GUO CHANG-LIN.A METHOD OF DETERMINATION OF CRYSTALLITE SIZE FROM LINE PROFILES FITTED BY THE WEIGHTED GAUSS-CAUCHY COMBINATION FUNCTIONS. Acta Physica Sinica, 1985, 34(9): 1156-1165.doi:10.7498/aps.34.1156 |
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GUO CHANG-LIN, YAO GONG-DA.NEW GENERAL METHOD OF X-RAY DIFFRACTION QUANTITATIVE PHASE ANALYSIS WITHOUT STANDARDS. Acta Physica Sinica, 1985, 34(11): 1451-1460.doi:10.7498/aps.34.1451 |
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LI HUA-RUI, LIU HENG-DA, DONG KE-ZHU.THE SIMPLIFICATION OF X-RAY ANOMALOUS DISPERSION METHOD IN DETERMINING PARTIAL RADIAL DISTRIBUTION FUNCTION (PDF) OF THE AMOPHOUS BINARY ALLOY Fe82B18. Acta Physica Sinica, 1985, 34(6): 766-773.doi:10.7498/aps.34.766 |
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WAN DE-RUI, FENG JIAN-QING, ZENG JIA-YU, LIU XAO-GUANG, ZHONG YUAN-QING.QUANTITATIVE EDS ANALYSIS OF THE CONSTITUENTS OF BINARY COMPOUNDS WITHOUT STANDARD SAMPLES. Acta Physica Sinica, 1984, 33(6): 762-769.doi:10.7498/aps.33.762 |
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Yu Ming-ren, Yang Guang, Wang Xun.DETERMINATION OF THE ATOMIC CONCENTRATION RATIO ON InP (100) CLEAN SURFACES BY X-RAY PHOTOELECTRON SPECTROSCOPY. Acta Physica Sinica, 1983, 32(6): 799-802.doi:10.7498/aps.32.799 |
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CHENG JIAN-BANG, CHENG WAN-RONG, WANG XI-HONG, HAO GONG-ZHANG, WU ZHANG-CUN.NON-DESTRUCTIVE DETERMINATION OF COMPOSITION AND THICKNESS OF MULTI-COMPONENT ALLOY THIN FILMS BY X-RAY FLUORESCENCE SPECTROSCOPIC METHOD. Acta Physica Sinica, 1983, 32(2): 251-255.doi:10.7498/aps.32.251 |
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CHENG WAN-BONG, GAO QIAO-JUN, WU ZI-QIN.SIMULTANEOUS MEASUREMENT OF THE CONSTITUENT AND THICKNESS OF THIN FILM BY X-RAY EDS. Acta Physica Sinica, 1982, 31(1): 30-37.doi:10.7498/aps.31.30 |
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GUO CHANG-LIN, JI ANG, TAO GUANG-YI.QUANTITATIVE DETERMINATION OF INTENSITY DISTRIBUTION OF PRIMARY X-RAY SPECTRUM. Acta Physica Sinica, 1981, 30(10): 1351-1360.doi:10.7498/aps.30.1351 |
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GUO CHANG-LIN.QUANTITATIVE DETERMINATION OF SPECTRAL PURITY OF X-RAY TUBES FOR DIFFRACTION ANALYSIS. Acta Physica Sinica, 1980, 29(1): 35-45.doi:10.7498/aps.29.35 |