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Yang Meng-Sheng, Yi Tai-Min, Zheng Feng-Cheng, Tang Yong-Jian, Zhang Lin, Du Kai, Li Ning, Zhao Li-Ping, Ke Bo, Xing Pi-Feng.Surface oxidation of as-deposit uranium film characterized by X-ray photoelectron spectroscopy. Acta Physica Sinica, 2018, 67(2): 027301.doi:10.7498/aps.67.20172055 |
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Li Jiang, Tang Jing-You, Pei Wang, Wei Xian-Hua, Huang Feng.Accurate determination of thickness values and optical constants of absorbing thin films on opaque substrates with spectroscopic ellipsometry. Acta Physica Sinica, 2015, 64(11): 110702.doi:10.7498/aps.64.110702 |
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Su Zhao-Feng, Yang Hai-Liang, Qiu Ai-Ci, Sun Jian-Feng, Cong Pei-Tian, Wang Liang-Ping, Lei Tian-Shi, Han Juan-Juan.Measurements of energy spectra for high energy pulsed X-ray. Acta Physica Sinica, 2010, 59(11): 7729-7735.doi:10.7498/aps.59.7729 |
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Li Yong-Hua, Liu Chang-Sheng, Meng Fan-Ling, Wang Yu-Ming, Zheng Wei-Tao.X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films. Acta Physica Sinica, 2009, 58(4): 2742-2745.doi:10.7498/aps.58.2742 |
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Li Hong-Tao, Luo Yi, Xi Guang-Yi, Wang Lai, Jiang Yang, Zhao Wei, Han Yan-Jun, Hao Zhi-Biao, Sun Chang-Zheng.Thickness measurement of GaN films by X-ray diffraction. Acta Physica Sinica, 2008, 57(11): 7119-7125.doi:10.7498/aps.57.7119 |
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Zhao Hui, Guo Mei-Fang, Dong Bao-Zhong.Determination of the transition-layer thickness of a crystalline polymer by using small-angle x-ray scattering. Acta Physica Sinica, 2004, 53(4): 1247-1250.doi:10.7498/aps.53.1247 |
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He Shao-Long, Li Hong-Nian, Li Hai-Yang, Zhang Han-Jie, Lü Bin, He Pi-Mo, Bao Shi-Ning, Xu Ya-Bo.X-ray photoemission studies of Yb intercalated C60 thin film. Acta Physica Sinica, 2004, 53(3): 915-921.doi:10.7498/aps.53.915 |
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Wang Wei, Zhang Jie, Dong Quan-Li, V.K.Senecha.Effects of target thickness on spectral characteristics of x-ray flux from the laser-produced plasmas. Acta Physica Sinica, 2004, 53(3): 967-972.doi:10.7498/aps.53.967 |
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YANG JIA-MIN, DING YAO-NAN, YI RONG-QING, WANG YAO-MEI, ZHANG WEN-HAI, ZHENG ZHI-JIAN.QUANTITATIVE MEASUREMENT OF SOFT-X-RAY SPECTRUM USING TRANSMISSION GRATING SPECTROMETER. Acta Physica Sinica, 2001, 50(9): 1723-1728.doi:10.7498/aps.50.1723 |
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LI ZHI-HONG, GONG YAN-JUN, WU DONG, SUN YU-HAN, WANG JUN, LIU YI, DONG BAO-ZHONG.DETERMINATION OF THE AVERAGE THICKNESS OF INTERFACE LAYER WRAPPED ABOUT SiO2 SOLS BY SAXS. Acta Physica Sinica, 2001, 50(6): 1128-1131.doi:10.7498/aps.50.1128 |
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YUAN JIN-SHE, CHEN GUANG-DE, QI MING, LI AI-ZHEN, XU ZHUO.XPS AND AES INVESTIGATION OF GaN FILMS GROWN BY MBE. Acta Physica Sinica, 2001, 50(12): 2429-2433.doi:10.7498/aps.50.2429 |
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WAN DE-RUI, FENG JIAN-QING, ZENG JIA-YU, LIU XAO-GUANG, ZHONG YUAN-QING.QUANTITATIVE EDS ANALYSIS OF THE CONSTITUENTS OF BINARY COMPOUNDS WITHOUT STANDARD SAMPLES. Acta Physica Sinica, 1984, 33(6): 762-769.doi:10.7498/aps.33.762 |
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Yu Ming-ren, Yang Guang, Wang Xun.DETERMINATION OF THE ATOMIC CONCENTRATION RATIO ON InP (100) CLEAN SURFACES BY X-RAY PHOTOELECTRON SPECTROSCOPY. Acta Physica Sinica, 1983, 32(6): 799-802.doi:10.7498/aps.32.799 |
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