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Huang Hao, Zhang Kan, Wu Ming, Li Hu, Wang Min-Juan, Zhang Shu-Ming, Chen Jian-Hong, Wen Mao.Comparison between axial residual stresses measured by Raman spectroscopy and X-ray diffraction in SiC fiber reinforced titanium matrix composite. Acta Physica Sinica, 2018, 67(19): 197203.doi:10.7498/aps.67.20181157 |
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Cui Jian-Jun, Gao Si-Tian.Nanometer film thickness metrology and traceability based on grazing incidence X-ray reflectometry. Acta Physica Sinica, 2014, 63(6): 060601.doi:10.7498/aps.63.060601 |
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Li Jia, Fang Qi, Luo Bing-Chi, Zhou Min-Jie, Li Kai, Wu Wei-Dong.Residual stress analysis by grazing-incidence X-ray diffraction on beryllium films. Acta Physica Sinica, 2013, 62(14): 140701.doi:10.7498/aps.62.140701 |
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Zhou Bing-Qing, Liu Feng-Zhen, Zhu Mei-Fang, Zhou Yu-Qin, Wu Zhong-Hua, Chen Xing.Studies on surface roughness and growth mechanisms of microcrystalline silicon films by grazing incidence X-ray reflectivity. Acta Physica Sinica, 2007, 56(4): 2422-2427.doi:10.7498/aps.56.2422 |
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Xu Yao, Wu Dong, Sun Yu-Han, Li Zhi-Hong, Dong Bao-Zhong, Wu Zhong-Hua.Dependence of silica sol properties on synthesis situation studied by SAXS. Acta Physica Sinica, 2005, 54(6): 2814-2820.doi:10.7498/aps.54.2814 |
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Zhao Hui, Guo Mei-Fang, Dong Bao-Zhong.Determination of the transition-layer thickness of a crystalline polymer by using small-angle x-ray scattering. Acta Physica Sinica, 2004, 53(4): 1247-1250.doi:10.7498/aps.53.1247 |
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Sun Ke-Xu, Yi Rong-Qing, Yang Guo-Hong, Jiang Shao-En, Cui Yan-Li, Liu Shen-Ye, Ding Yong-Kun, Cui Ming-Qi, Zhu Pei-Ping, Zhao Yi-Dong, Zhu Jie, Zheng Lei, Zhang Jing-He.The reflectance calibration of soft x-ray planar mirror with different grazing angle. Acta Physica Sinica, 2004, 53(4): 1099-1104.doi:10.7498/aps.53.1099 |
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Xu Yao, Li Zhi-Hong, Fan Wen-Hao, Wu Dong, Sun Yu-Han, Wang Jun, Dong Bao-Zhong.Two fractal structures of methyl-modified Silica gels by SAXS. Acta Physica Sinica, 2003, 52(2): 442-447.doi:10.7498/aps.52.442 |
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LI ZHI-HONG, GONG YAN-JUN, WU DONG, SUN YU-HAN, WANG JUN, LIU YI, DONG BAO-ZHONG.DETERMINATION OF THE AVERAGE THICKNESS OF INTERFACE LAYER WRAPPED ABOUT SiO2 SOLS BY SAXS. Acta Physica Sinica, 2001, 50(6): 1128-1131.doi:10.7498/aps.50.1128 |
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Li Zhi-Hong, Sun Ji-Hong, Zhao Jun-Peng, Wu Dong, Sun Yu-Han, Liu Yi, Sheng Wen-Jun, Dong Bao-Zhong.. Acta Physica Sinica, 2000, 49(4): 775-780.doi:10.7498/aps.49.775 |
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XU ZHANG-CHENG, GUO CHANG-LIN, ZHAO ZONG-YAN, XU JIA-YUE, ZHOU SHENG-MING, QI ZE-MING, T. FUKAMACHI, R. NEGISHI, T. NAKAJIMA.RESONANT X-RAY DYNAMICAL DIFFRACTION METHOD FOR DETERMINING TEMPERATURE FACTOR. Acta Physica Sinica, 1998, 47(9): 1520-1528.doi:10.7498/aps.47.1520 |
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YAO GONG-DA, GUO CHANG-LIN.MULTIPHASE DOPING METHOD IN QUANTITATIVE X-RAY DIFFRACTION PHASE ANALYSIS. Acta Physica Sinica, 1985, 34(11): 1461-1468.doi:10.7498/aps.34.1461 |
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CHENG JIAN-BANG, CHENG WAN-RONG, WANG XI-HONG, HAO GONG-ZHANG, WU ZHANG-CUN.NON-DESTRUCTIVE DETERMINATION OF COMPOSITION AND THICKNESS OF MULTI-COMPONENT ALLOY THIN FILMS BY X-RAY FLUORESCENCE SPECTROSCOPIC METHOD. Acta Physica Sinica, 1983, 32(2): 251-255.doi:10.7498/aps.32.251 |
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CHENG WAN-BONG, GAO QIAO-JUN, WU ZI-QIN.SIMULTANEOUS MEASUREMENT OF THE CONSTITUENT AND THICKNESS OF THIN FILM BY X-RAY EDS. Acta Physica Sinica, 1982, 31(1): 30-37.doi:10.7498/aps.31.30 |
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LU XUE-SHAN, LIANG JING-KUI.THE DETERMINATION OF DEBYE CHARACTERISTIC TEMPERATURES OF CRYSTALS FROM X-RAY DIFFRACTION INTENSITIES. Acta Physica Sinica, 1981, 30(10): 1361-1368.doi:10.7498/aps.30.1361 |
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GUO CHANG-LIN, JI ANG, TAO GUANG-YI.QUANTITATIVE DETERMINATION OF INTENSITY DISTRIBUTION OF PRIMARY X-RAY SPECTRUM. Acta Physica Sinica, 1981, 30(10): 1351-1360.doi:10.7498/aps.30.1351 |
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GUO CHANG-LIN.DETERMINATION OF X-RAY POWDER DIFFRACTION DATA FOR SODIUM STRONTIUM BARIUM NIOBATE SYSTEM. Acta Physica Sinica, 1980, 29(2): 247-251.doi:10.7498/aps.29.247 |
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GUO CHANG-LIN, WU YU-QIN.AN X-RAY METHOD OF DETERMINING THE DEGREE OF PREFERRED ORIENTATION OF FERROELECTRIC MATERIAL WITH LAYER TYPE STRUCTURE AFTER HOT-PRESSING. Acta Physica Sinica, 1980, 29(12): 1640-1644.doi:10.7498/aps.29.1640 |
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GUO CHANG-LIN.QUANTITATIVE DETERMINATION OF SPECTRAL PURITY OF X-RAY TUBES FOR DIFFRACTION ANALYSIS. Acta Physica Sinica, 1980, 29(1): 35-45.doi:10.7498/aps.29.35 |
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SHAW NAN, LIU YI-HUAN.X-RAY MEASUREMENT OF THE THERMAL EXPANSION OF GERMANIUM, SILICON, INDIUM ANTIMONIDE AND GALLIUM ARSENIDE. Acta Physica Sinica, 1964, 20(8): 699-704.doi:10.7498/aps.20.699 |
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