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Xu Yi-Dan, Jiang Wen-Yu, Tong Ji-Hong, Han Lu-Lu, Zuo Zi-Tan, Xu Li-Ming, Gong Xiao-Chun, Wu Jian.Precise measurement of attosecond dynamics of NO molecular shape resonance. Acta Physica Sinica, 2022, 71(23): 233301.doi:10.7498/aps.71.20221735 |
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Wang Hai-Bo, Luo Zhen-Lin, Liu Qing-Qing, Jin Chang-Qing, Gao Chen, Zhang Li.Resonant X-ray diffraction studies on modulation structures of high temperature superconducting sample Sr2CuO3.4. Acta Physica Sinica, 2019, 68(18): 187401.doi:10.7498/aps.68.20190494 |
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Huang Hao, Zhang Kan, Wu Ming, Li Hu, Wang Min-Juan, Zhang Shu-Ming, Chen Jian-Hong, Wen Mao.Comparison between axial residual stresses measured by Raman spectroscopy and X-ray diffraction in SiC fiber reinforced titanium matrix composite. Acta Physica Sinica, 2018, 67(19): 197203.doi:10.7498/aps.67.20181157 |
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Li Ling, Jin Zhen-Lan, Li Bin.Spatiotemporal dynamic analysis of phase synchronized sources based on factor analysis. Acta Physica Sinica, 2011, 60(4): 048703.doi:10.7498/aps.60.048703 |
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Gao Tao, Zhou Jing-Jing, Chen Yun-Gui, Wu Chao-Ling, Xiao Yan.Spatial configurations and X-ray absorption of Ti catalyzing on NaAlH4 surfaces: Car-Parrinello molecular dynamics and density functional theory study. Acta Physica Sinica, 2010, 59(10): 7452-7457.doi:10.7498/aps.59.7452 |
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Wu Lian-Wen, Cheng Qian-Sheng.A note on the exponent of dynamical cross-correlation factor. Acta Physica Sinica, 2005, 54(7): 3027-3028.doi:10.7498/aps.54.3027 |
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LI ZHI-HONG, GONG YAN-JUN, WU DONG, SUN YU-HAN, WANG JUN, LIU YI, DONG BAO-ZHONG.DETERMINATION OF THE AVERAGE THICKNESS OF INTERFACE LAYER WRAPPED ABOUT SiO2 SOLS BY SAXS. Acta Physica Sinica, 2001, 50(6): 1128-1131.doi:10.7498/aps.50.1128 |
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DU KUI, WANG YUAN-MING, WANG ZHONG-MING, ZHU SHI-XUE.THE ACCURATE CALCULATION AND ANALYSIS OF THE PROPAGATOR IN REAL SPACE DYNAMICAL ELECTRON DIFFRACTION CALCULATIONS. Acta Physica Sinica, 1997, 46(2): 332-339.doi:10.7498/aps.46.332 |
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LI MING, MAI ZHEN-HONG, CUI SHU-PAN.STATISTICAL DYNAMICAL DIFFRACTION IN NEARLY PERFECT CRYSTALS. Acta Physica Sinica, 1994, 43(1): 84-90.doi:10.7498/aps.43.84 |
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XU KE-WEI, GAO RUN-SHENG, YU LI-GEN, HE JIA-WEN.THIN FILM STRESS EVALUATION BY A GLANCING X-RAY BEAM. Acta Physica Sinica, 1994, 43(8): 1295-1300.doi:10.7498/aps.43.1295 |
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LU XUE-SHAN, LIANG JING-KUI.THE DETERMINATION OF DEBYE CHARACTERISTIC TEMPERATURES OF CRYSTALS FROM X-RAY DIFFRACTION INTENSITIES. Acta Physica Sinica, 1981, 30(10): 1361-1368.doi:10.7498/aps.30.1361 |
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SUN ZHANG-DE, LIANG JING-GUO.A NEW METHOD OF SOLVING THE TAKAGI EQUATION OF THE DYNAMICAL THEORY OF X-RAY DIFFRACTION. Acta Physica Sinica, 1981, 30(3): 344-350.doi:10.7498/aps.30.344 |
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LING BING-CHANG.PERTURBATIVE SOLUTION OF TAKAGI EQUATION IN X-RAY DIFFRACTION DYNAMIC IN SLIGHTLY DEFORMATION CRYSTAL. Acta Physica Sinica, 1981, 30(11): 1528-1532.doi:10.7498/aps.30.1528 |
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GUO CHANG-LIN, WU YU-QIN.X-RAY POWDER DIFFRACTION STUDY OF MIXED BISMUTH OXIDE FERROELECTRICS WITH LAYER TYPE STRUCTURE PbBi4Ti4O15AND SrBi4Ti4O15. Acta Physica Sinica, 1980, 29(11): 1490-1496.doi:10.7498/aps.29.1490 |
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GUO CHANG-LIN.DETERMINATION OF X-RAY POWDER DIFFRACTION DATA FOR SODIUM STRONTIUM BARIUM NIOBATE SYSTEM. Acta Physica Sinica, 1980, 29(2): 247-251.doi:10.7498/aps.29.247 |
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GUO CHANG-LIN.QUANTITATIVE DETERMINATION OF SPECTRAL PURITY OF X-RAY TUBES FOR DIFFRACTION ANALYSIS. Acta Physica Sinica, 1980, 29(1): 35-45.doi:10.7498/aps.29.35 |
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