[1] |
Xing Hai-Ying, Zheng Zhi-Jian, Zhang Zi-Han, Wu Wen-Jing, Guo Zhi-Ying.Tunable electronic structure and optical properties of BlueP/XTe2(X= Mo, W) van der Waals heterostructures by strain. Acta Physica Sinica, 2021, 70(6): 067101.doi:10.7498/aps.70.20201728 |
[2] |
Huang Hao, Zhang Kan, Wu Ming, Li Hu, Wang Min-Juan, Zhang Shu-Ming, Chen Jian-Hong, Wen Mao.Comparison between axial residual stresses measured by Raman spectroscopy and X-ray diffraction in SiC fiber reinforced titanium matrix composite. Acta Physica Sinica, 2018, 67(19): 197203.doi:10.7498/aps.67.20181157 |
[3] |
Zhang Jin-Shuai, Huang Qiu-Shi, Jiang Li, Qi Run-Ze, Yang Yang, Wang Feng-Li, Zhang Zhong, Wang Zhan-Shan.Stress and structure properties of X-ray W/Si multilayer under low temperature annealing. Acta Physica Sinica, 2016, 65(8): 086101.doi:10.7498/aps.65.086101 |
[4] |
Pan Hui-Ping, Cheng Feng-Feng, Li Lin, Horng Ray-Hua, Yao Shu-De.Structrual analyses of Ga2+xO3-x thin films grown on sapphire substrates. Acta Physica Sinica, 2013, 62(4): 048801.doi:10.7498/aps.62.048801 |
[5] |
Guo Zi-Zheng, Hu Xu-Bo.Effects of stress on the hysteresis loss and coercivity of ferromagnetic film. Acta Physica Sinica, 2013, 62(5): 057501.doi:10.7498/aps.62.057501 |
[6] |
Sun Yun, Wang Sheng-Lai, Gu Qing-Tian, Xu Xin-Guang, Ding Jian-Xu, Liu Wen-Jie, Liu Guang-Xia, Zhu Sheng-Jun.Study of KDP crystal lattice strain and stress by high resolution X-ray diffraction. Acta Physica Sinica, 2012, 61(21): 210203.doi:10.7498/aps.61.210203 |
[7] |
Gu Jian-Jun, Zhang Hai-Feng, Xu Qin, Liu Li-Hu, Sun Hui-Yuan, Qi Yun-Kai.Effects of thickness for Al doped ZnO thin films on their microstructure and magnetic properties. Acta Physica Sinica, 2011, 60(6): 067502.doi:10.7498/aps.60.067502 |
[8] |
Yuan Wen-Jia, Zhang Yue-Guang, Shen Wei-Dong, Ma Qun, Liu Xu.Characteristics of Nb2O5 thin films deposited by ion beam sputtering. Acta Physica Sinica, 2011, 60(4): 047803.doi:10.7498/aps.60.047803 |
[9] |
Li Yong-Hua, Liu Chang-Sheng, Meng Fan-Ling, Wang Yu-Ming, Zheng Wei-Tao.X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films. Acta Physica Sinica, 2009, 58(4): 2742-2745.doi:10.7498/aps.58.2742 |
[10] |
Li Hong-Tao, Luo Yi, Xi Guang-Yi, Wang Lai, Jiang Yang, Zhao Wei, Han Yan-Jun, Hao Zhi-Biao, Sun Chang-Zheng.Thickness measurement of GaN films by X-ray diffraction. Acta Physica Sinica, 2008, 57(11): 7119-7125.doi:10.7498/aps.57.7119 |
[11] |
Xie Zi-Li, Zhang Rong, Xiu Xiang-Qian, Liu Bin, Zhu Shun-Ming, Zhao Hong, Pu Lin, Han Ping, Jiang Ruo-Lian, Shi Yi, Zheng You-Dou.The oxidation characteristics of InN films. Acta Physica Sinica, 2007, 56(2): 1032-1035.doi:10.7498/aps.56.1032 |
[12] |
Li Rong-Bin.Study of the stress in doped CVD diamond films. Acta Physica Sinica, 2007, 56(6): 3428-3434.doi:10.7498/aps.56.3428 |
[13] |
Wang Rui-Min, Chen Guang-De, Zhu You-Zhang.Micro-Raman scattering study of hexagonal InGaN epitaxial layer. Acta Physica Sinica, 2006, 55(2): 914-919.doi:10.7498/aps.55.914 |
[14] |
Tao Yong-Mei, Jiang Qing, Cao Hai-Xia.Impact of stress on the thermodynamic properties of ferroelectric films within the transverse Ising model. Acta Physica Sinica, 2005, 54(1): 274-279.doi:10.7498/aps.54.274 |
[15] |
Sun Xian-Kai, Lin Bi-Xia, Zhu Jun-Jie, Zhang Yang, Fu Zhu-Xi.Studies on the strain and its effect on defects in heteroepitaxial ZnO films prepared by LP-OCVD method. Acta Physica Sinica, 2005, 54(6): 2899-2903.doi:10.7498/aps.54.2899 |
[16] |
Xu Bo, Yu Qing-Xuan, Wu Qi-Hong, Liao Yuan, Wang Guan-Zhong, Fang Rong-Chuan.Effects of strain and Mg-dopant on the photoluminescencespectra in p-type GaN. Acta Physica Sinica, 2004, 53(1): 204-209.doi:10.7498/aps.53.204 |
[17] |
Du Xiao-Song, S. Hak, O. C. Rogojanu, T. Hibma.X-ray study of chromium oxide films epitaxially grown on MgO. Acta Physica Sinica, 2004, 53(10): 3510-3514.doi:10.7498/aps.53.3510 |
[18] |
Cha Li-Mei, Zhang Peng-Xiang, H.U.Habermeier.The preparation and properties of bilayer manganite films. Acta Physica Sinica, 2003, 52(2): 498-502.doi:10.7498/aps.52.498 |
[19] |
Fang Zhi-Jun, Xia Yi-Ben, Wang Lin-Jun, Zhang Wei-Li, Ma Zhe-Guo, Zhang Ming-Long.Study of the stress observed in diamond films on carbon-implanted alumina surfaces. Acta Physica Sinica, 2003, 52(4): 1028-1033.doi:10.7498/aps.52.1028 |
[20] |
WANG XIAO-DONG, LIU HUI-YUN, NIU ZHI-CHUAN, FENG SONG-LIN.STUDY OF SELF-ASSEMBLED InAs QUANTUM DOT STRUCTURE COVERED BY InxGa1-xAs(0≤x≤0.3) CAPPING LAYER. Acta Physica Sinica, 2000, 49(11): 2230-2234.doi:10.7498/aps.49.2230 |