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Zhang Xue, Kim Bokyung, Lee Hyeonju, Park Jaehoon.Low-temperature rapid preparation of high-performance indium oxide thin films and transistors based on solution technology. Acta Physica Sinica, 2024, 73(9): 096802.doi:10.7498/aps.73.20240082 |
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Li Ye, Wang Xi-Xi, Wei Hui-Yun, Qiu Peng, He Ying-Feng, Song Yi-Meng, Duan Zhang, Shen Cheng-Tao, Peng Ming-Zeng, Zheng Xin-He.Enhancement of interface transportation for quantum dot solar cells using ultrathin InN by atomic layer deposition. Acta Physica Sinica, 2021, 70(18): 187702.doi:10.7498/aps.70.20210554 |
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Zhang Guan-Jie, Yang Hao, Zhang Nan.Research progress of the investigation of intrinsic and extrinsic origin of piezoelectric materials by X-ray diffraction. Acta Physica Sinica, 2020, 69(12): 127711.doi:10.7498/aps.69.20200301 |
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Chen Long, Chen Cheng-Ke, Li Xiao, Hu Xiao-Jun.Effects of oxidation on silicon vacancy photoluminescence and microstructure of separated domain formed nanodiamond films. Acta Physica Sinica, 2019, 68(16): 168101.doi:10.7498/aps.68.20190422 |
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Li Ming-Yang, Zhang Lei-Min, Lv Shasha, Li Zheng-Cao.Effects of ion irradiation and oxidation on point defects in IG-110 nuclear grade graphite. Acta Physica Sinica, 2019, 68(12): 128102.doi:10.7498/aps.68.20190371 |
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Huang Hao, Zhang Kan, Wu Ming, Li Hu, Wang Min-Juan, Zhang Shu-Ming, Chen Jian-Hong, Wen Mao.Comparison between axial residual stresses measured by Raman spectroscopy and X-ray diffraction in SiC fiber reinforced titanium matrix composite. Acta Physica Sinica, 2018, 67(19): 197203.doi:10.7498/aps.67.20181157 |
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Tao Ying, Qi Ning, Wang Bo, Chen Zhi-Quan, Tang Xin-Feng.Microstructure and thermoelectric properties of In2O3/poly(3, 4-ethylenedioxythiophene) composites. Acta Physica Sinica, 2018, 67(19): 197201.doi:10.7498/aps.67.20180382 |
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Yang Meng-Sheng, Yi Tai-Min, Zheng Feng-Cheng, Tang Yong-Jian, Zhang Lin, Du Kai, Li Ning, Zhao Li-Ping, Ke Bo, Xing Pi-Feng.Surface oxidation of as-deposit uranium film characterized by X-ray photoelectron spectroscopy. Acta Physica Sinica, 2018, 67(2): 027301.doi:10.7498/aps.67.20172055 |
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Li Xiao-Dong, Li Hui, Li Peng-Shan.High pressure single-crystal synchrotron X-ray diffraction technique. Acta Physica Sinica, 2017, 66(3): 036203.doi:10.7498/aps.66.036203 |
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Li Xiao-Na, Zheng Yue-Hong, Li Zhen, Wang Miao, Zhang Kun, Dong Chuang.High temperature oxidation resistance of cluster model designed alloys Cu-Cu12-[Mx/(12+x)Ni12/(12+x)]5 (M=Si, Cr, Cr+Fe). Acta Physica Sinica, 2014, 63(2): 028102.doi:10.7498/aps.63.028102 |
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Xu Xiao-Ming, Miao Wei, Tao Kun.Direct method of determining the lattice parameters of a phase from X-ray diffraction pattern of multi-phase. Acta Physica Sinica, 2011, 60(8): 086101.doi:10.7498/aps.60.086101 |
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Zhao Guo-Zhong, Wang Xin-Qiang, Wang Hai-Yan.Terahertz radiations from narrow band gap of semiconductor irradiated by femtosecond pulses with different pump intensities. Acta Physica Sinica, 2011, 60(4): 043202.doi:10.7498/aps.60.043202 |
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Hu Mei-Jiao, Li Cheng, Xu Jian-Fang, Lai Hong-Kai, Chen Song-Yan.Formation and properties of GeOI prepared by cyclic thermal oxidation and annealing processes. Acta Physica Sinica, 2011, 60(7): 078102.doi:10.7498/aps.60.078102 |
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Li Yong-Hua, Liu Chang-Sheng, Meng Fan-Ling, Wang Yu-Ming, Zheng Wei-Tao.X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films. Acta Physica Sinica, 2009, 58(4): 2742-2745.doi:10.7498/aps.58.2742 |
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Li Hong-Tao, Luo Yi, Xi Guang-Yi, Wang Lai, Jiang Yang, Zhao Wei, Han Yan-Jun, Hao Zhi-Biao, Sun Chang-Zheng.Thickness measurement of GaN films by X-ray diffraction. Acta Physica Sinica, 2008, 57(11): 7119-7125.doi:10.7498/aps.57.7119 |
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Ming Bao-Quan, Wang Jin-Feng, Zang Guo-Zhong, Wang Chun-Ming, Gai Zhi-Gang, Du Juan, Zheng Li-Mei.X-ray diffraction and phase transition analysis for (K, Na)NbO3-based lead-free piezoelectric ceramics. Acta Physica Sinica, 2008, 57(9): 5962-5967.doi:10.7498/aps.57.5962 |
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Tan Guo-Tai, Chen Zheng-Hao.XRD analysis on lattice structure of La1-xTexMnO3. Acta Physica Sinica, 2007, 56(3): 1702-1706.doi:10.7498/aps.56.1702 |
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Qin Pei, Lou Yu-Wan, Yang Chuan-Zheng, Xia Bao-Jia.New computing methods and programs for separating multipe-broadening effects of X-ray diffraction lines. Acta Physica Sinica, 2006, 55(3): 1325-1335.doi:10.7498/aps.55.1325 |
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Du Xiao-Song, S. Hak, O. C. Rogojanu, T. Hibma.X-ray study of chromium oxide films epitaxially grown on MgO. Acta Physica Sinica, 2004, 53(10): 3510-3514.doi:10.7498/aps.53.3510 |
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LI Ya, Chen Ling-Yan, Zhang Zhe, Wu Yong-Gang, Qiao Yi, Xu Wei-Xin.. Acta Physica Sinica, 2001, 50(1): 79-82.doi:10.7498/aps.50.79 |
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