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Zhang Guan-Jie, Yang Hao, Zhang Nan.Research progress of the investigation of intrinsic and extrinsic origin of piezoelectric materials by X-ray diffraction. Acta Physica Sinica, 2020, 69(12): 127711.doi:10.7498/aps.69.20200301 |
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Huang Hao, Zhang Kan, Wu Ming, Li Hu, Wang Min-Juan, Zhang Shu-Ming, Chen Jian-Hong, Wen Mao.Comparison between axial residual stresses measured by Raman spectroscopy and X-ray diffraction in SiC fiber reinforced titanium matrix composite. Acta Physica Sinica, 2018, 67(19): 197203.doi:10.7498/aps.67.20181157 |
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Han Liang, Liu De-Lian, Chen Xian, Zhao Yu-Qing.The effect of the interlayer CrN on adhesion characteristics of ta-C films on high-speed steel substrate. Acta Physica Sinica, 2013, 62(9): 096802.doi:10.7498/aps.62.096802 |
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Pan Hui-Ping, Cheng Feng-Feng, Li Lin, Horng Ray-Hua, Yao Shu-De.Structrual analyses of Ga2+xO3-x thin films grown on sapphire substrates. Acta Physica Sinica, 2013, 62(4): 048801.doi:10.7498/aps.62.048801 |
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Li Jia, Fang Qi, Luo Bing-Chi, Zhou Min-Jie, Li Kai, Wu Wei-Dong.Residual stress analysis by grazing-incidence X-ray diffraction on beryllium films. Acta Physica Sinica, 2013, 62(14): 140701.doi:10.7498/aps.62.140701 |
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Xu Xiao-Ming, Miao Wei, Tao Kun.Direct method of determining the lattice parameters of a phase from X-ray diffraction pattern of multi-phase. Acta Physica Sinica, 2011, 60(8): 086101.doi:10.7498/aps.60.086101 |
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Tang Jun, Liu Zhong-Liang, Ren Peng, Yao Tao, Yan Wen-Sheng, Xu Peng-Shou, Wei Shi-Qiang.Structural characterization of Mn doped SiC magnetic thin films. Acta Physica Sinica, 2010, 59(7): 4774-4780.doi:10.7498/aps.59.4774 |
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Li Yong-Hua, Liu Chang-Sheng, Meng Fan-Ling, Wang Yu-Ming, Zheng Wei-Tao.X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films. Acta Physica Sinica, 2009, 58(4): 2742-2745.doi:10.7498/aps.58.2742 |
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Zhang Li-Ping, Zhang Jian-Jun, Zhang Xin, Shang Ze-Ren, Hu Zeng-Xin, Zhang Ya-Ping, Geng Xin-Hua, Zhao Ying.Investigation of microcrystalline silicon germanium prepared by hydrogen and helium gas mixture diluted VHFPA-RTCVD. Acta Physica Sinica, 2008, 57(11): 7338-7343.doi:10.7498/aps.57.7338 |
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Ming Bao-Quan, Wang Jin-Feng, Zang Guo-Zhong, Wang Chun-Ming, Gai Zhi-Gang, Du Juan, Zheng Li-Mei.X-ray diffraction and phase transition analysis for (K, Na)NbO3-based lead-free piezoelectric ceramics. Acta Physica Sinica, 2008, 57(9): 5962-5967.doi:10.7498/aps.57.5962 |
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Li Hong-Tao, Luo Yi, Xi Guang-Yi, Wang Lai, Jiang Yang, Zhao Wei, Han Yan-Jun, Hao Zhi-Biao, Sun Chang-Zheng.Thickness measurement of GaN films by X-ray diffraction. Acta Physica Sinica, 2008, 57(11): 7119-7125.doi:10.7498/aps.57.7119 |
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.Properties of Co nano-films deposited on monocrystalline silicon surface by ion beam sputtering. Acta Physica Sinica, 2007, 56(12): 7158-7164.doi:10.7498/aps.56.7158 |
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Xie Zi-Li, Zhang Rong, Xiu Xiang-Qian, Liu Bin, Zhu Shun-Ming, Zhao Hong, Pu Lin, Han Ping, Jiang Ruo-Lian, Shi Yi, Zheng You-Dou.The oxidation characteristics of InN films. Acta Physica Sinica, 2007, 56(2): 1032-1035.doi:10.7498/aps.56.1032 |
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Tan Guo-Tai, Chen Zheng-Hao.XRD analysis on lattice structure of La1-xTexMnO3. Acta Physica Sinica, 2007, 56(3): 1702-1706.doi:10.7498/aps.56.1702 |
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Liu Guo-Han, Ding Yi, Zhu Xiu-Hong, Chen Guang-Hua, He De-Yan.Preparation and characterization of hydrogenated microcrystalline silicon films by HW-MWECR-CVD. Acta Physica Sinica, 2006, 55(11): 6147-6151.doi:10.7498/aps.55.6147 |
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Qin Pei, Lou Yu-Wan, Yang Chuan-Zheng, Xia Bao-Jia.New computing methods and programs for separating multipe-broadening effects of X-ray diffraction lines. Acta Physica Sinica, 2006, 55(3): 1325-1335.doi:10.7498/aps.55.1325 |
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Feng Qian, Wang Feng-Xiang, Hao Yue.Effect of Mg doping on properties of AlGaN films. Acta Physica Sinica, 2004, 53(10): 3587-3590.doi:10.7498/aps.53.3587 |
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Chen Dun-Jun, Shen Bo, Zhang Kai-Xiao, Deng Yong-Zhen, Fan Jie, Zhang Rong, Shi Yi, Zheng You-Dou.Structural properties of GaN1-xPx films. Acta Physica Sinica, 2003, 52(7): 1788-1791.doi:10.7498/aps.52.1788 |
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Hao Yan-Ming, Zhao Wei, Gao Yan.Structure and Curie temperature of Y2(Fe1-x-y,Coy,Crx)17 compounds. Acta Physica Sinica, 2003, 52(10): 2612-2615.doi:10.7498/aps.52.2612 |
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.. Acta Physica Sinica, 1963, 19(3): 202-204.doi:10.7498/aps.19.202 |
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