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Liu Jie, Chen Wei, Yang Qiu-Lin, Mu Gen, Gao Hao, Shen Tao, Yang Si-Hua, Zhang Zhen-Hui.Research and development of polarized photoacoustic imaging technology. Acta Physica Sinica, 2023, 72(20): 204202.doi:10.7498/aps.72.20230900 |
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Su Xin, Huang Tian-Ye, Wang Jun-Zhuan, Liu Yuan, Zheng You-Liao, Shi Yi, Wang Xiao-Mu.Circular photogalvanic effect. Acta Physica Sinica, 2021, 70(13): 138501.doi:10.7498/aps.70.20210498 |
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Yuan Qiang, Zhao Wen-Xuan, Ma Rui, Zhang Chen, Zhao Wei, Wang Shuang, Feng Xiao-Qiang, Wang Kai-Ge, Bai Jin-Tao.Sub-diffraction-limit spatially structured light pattern based on polarized beam phase modulation. Acta Physica Sinica, 2017, 66(11): 110201.doi:10.7498/aps.66.110201 |
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Wang Pan-Pan, Zhang Yu-Zhi, Peng Ming-Dong, Zhang Yun-Long, Wu Ling-Nan, Cao Yun-Zhen, Song Li-Xin.Spectroscopic ellipsometry analysis of vanadium oxide film in Vis-NIR and NIR-MIR. Acta Physica Sinica, 2016, 65(12): 127201.doi:10.7498/aps.65.127201 |
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Zhou Ya, Wu Zheng-Mao, Fan Li, Sun Bo, He Yang, Xia Guang-Qiong.Two channel photonic microwave generation based on period-one oscillations of two orthogonally polarized modes in a vertical-cavity surface-emitting laser subjected to an elliptically polarized optical injection. Acta Physica Sinica, 2015, 64(20): 204203.doi:10.7498/aps.64.204203 |
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Wu Liang-Hai, Zhang Jun, Fan Zhi-Guo, Gao Jun.An analytical model for skylight polarization pattern with multiple scattering. Acta Physica Sinica, 2014, 63(11): 114201.doi:10.7498/aps.63.114201 |
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Chen Guo-Jun, Zhou Qiao-Qiao, Ji Xian-Ming, Yin Jian-Ping.Generation of the tunable vector ellipse hollow beam by using linearly polarized light beams. Acta Physica Sinica, 2014, 63(8): 083701.doi:10.7498/aps.63.083701 |
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Chen Ren-Gang, Deng Jin-Xiang, Chen Liang, Kong Le, Cui Min, Gao Xue-Fei, Pang Tian-Qi, Miao Yi-Ming.Spectroscopic ellipsometry study of the Zn3N2 films prepared by radio-frequency sputtering. Acta Physica Sinica, 2014, 63(13): 137701.doi:10.7498/aps.63.137701 |
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Chen Ping, Tang Zhi-Lie, Wang Juan, Fu Xiao-Di, Chen Fei-Hu.Analysis of digital in-line polarization holography by Stokes parameters. Acta Physica Sinica, 2012, 61(10): 104202.doi:10.7498/aps.61.104202 |
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Wu Chen-Yang, Gu Jin-Hua, Feng Ya-Yang, Xue Yuan, Lu Jing-Xiao.The characterization of hydrogenated amorphous silicon and epitaxial silicon thin films grown on crystalline silicon substrates by using spectroscopic ellipsometry. Acta Physica Sinica, 2012, 61(15): 157803.doi:10.7498/aps.61.157803 |
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Li Xin-Li, Gu Jin-Hua, Gao Hai-Bo, Chen Yong-Sheng, Gao Xiao-Yong, Yang Shi-E, Lu Jing-Xiao, Li Rui, Jiao Yue-Chao.Real time and ex situ spectroscopic ellipsometry analysis microcrystalline silicon thin films growth. Acta Physica Sinica, 2012, 61(3): 036802.doi:10.7498/aps.61.036802 |
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Ma Jiao-Min, Liang Yan, Gao Xiao-Yong, Chen Chao, Zhao Meng-Ke, Lu Jing-Xiao.Spectroscopic ellipsometry study of the Ag2O film deposited by radio-frequency reactive magnetron sputtering. Acta Physica Sinica, 2012, 61(5): 056106.doi:10.7498/aps.61.056106 |
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Xu Kai, Yang Yan-Fang, He Ying, Han Xiao-Hong, Li Chun-Fang.Study on the tight focusing of the local elliptically polarized beam. Acta Physica Sinica, 2010, 59(9): 6125-6130.doi:10.7498/aps.59.6125 |
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Gu Jin-Hua, Ding Yan-Li, Yang Shi-E, Gao Xiao-Yong, Chen Yong-Sheng, Lu Jing-Xiao.A spectroscopic ellipsometry study of the abnormal scaling behavior of high-rate-deposited microcrystalline silicon films by VHF-PECVD technique. Acta Physica Sinica, 2009, 58(6): 4123-4127.doi:10.7498/aps.58.4123 |
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Shen Hu-Jiang, Wang Lin-Jun, Fang Zhi-Jun, Zhang Ming-Long, Yang Ying, Wang Lin, Xia Yi-Ben.Study on optical properties of diamond films by means of infrared spectroscopic ellipsometry. Acta Physica Sinica, 2004, 53(6): 2009-2013.doi:10.7498/aps.53.2009 |
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Wang Qi, Chen Jian-Xin, Xia Yuan-Qin, Chen De-Ying.. Acta Physica Sinica, 2002, 51(5): 1035-1039.doi:10.7498/aps.51.1035 |
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GU SHI-JIE.THE DEGENERATE FOUR-WAVE MIXING OF LIGHT WITH ARBITRARY POLARIZATIONS IN ISOTROPIC MEDIUM. Acta Physica Sinica, 1984, 33(5): 593-601.doi:10.7498/aps.33.593 |
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MO DANG, YE XIAN-JING.ELLIPSOMETRIC SPECTRUM AND OPTICAL PROPERTIES OF ION IMPLANTED SILICON. Acta Physica Sinica, 1981, 30(10): 1287-1294.doi:10.7498/aps.30.1287 |
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MO DANG, CHEN SHU-GUANG, YU YU-ZHEN, HUANG BING-ZHONG.ELLIPSOMETRIC SPECTRA OF SiO2FILMS ON SILICON. Acta Physica Sinica, 1980, 29(5): 673-676.doi:10.7498/aps.29.673 |