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Wang Hai-Bo, Luo Zhen-Lin, Liu Qing-Qing, Jin Chang-Qing, Gao Chen, Zhang Li.Resonant X-ray diffraction studies on modulation structures of high temperature superconducting sample Sr2CuO3.4. Acta Physica Sinica, 2019, 68(18): 187401.doi:10.7498/aps.68.20190494 |
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Zhang Jin-Shuai, Huang Qiu-Shi, Jiang Li, Qi Run-Ze, Yang Yang, Wang Feng-Li, Zhang Zhong, Wang Zhan-Shan.Stress and structure properties of X-ray W/Si multilayer under low temperature annealing. Acta Physica Sinica, 2016, 65(8): 086101.doi:10.7498/aps.65.086101 |
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Li Hong-Tao, Luo Yi, Xi Guang-Yi, Wang Lai, Jiang Yang, Zhao Wei, Han Yan-Jun, Hao Zhi-Biao, Sun Chang-Zheng.Thickness measurement of GaN films by X-ray diffraction. Acta Physica Sinica, 2008, 57(11): 7119-7125.doi:10.7498/aps.57.7119 |
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Wang Zhen-Ning, Jiang Mei-Fu, Ning Zhao-Yuan, Zhu Li.Structure and photoluminescence of Zn2GeO4 polycrystalline films prepared by radio-frequency magnetron sputtering. Acta Physica Sinica, 2008, 57(10): 6507-6512.doi:10.7498/aps.57.6507 |
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Xue Jian-Ming, S. Ninomiya, N. Imanishi.Study on the sputtering mechanism of SiO2 irradiated with MeV Si ions. Acta Physica Sinica, 2004, 53(5): 1445-1449.doi:10.7498/aps.53.1445 |
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LIU FENG-ZHEN, ZHU MEI-FANG, LIU TAO, LI BING-CHENG.THE TRANSITION FROM Eu3+TO Eu2+ IN SiO2(Eu) THIN FILMS PREPARED BY ION IMPLANTATION AND CO-SPUTTERING. Acta Physica Sinica, 2001, 50(3): 532-535.doi:10.7498/aps.50.532 |
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XU ZHENG, ZHAO XIAO-RU, WU WEN-BIN, SUN XUE-FENG, WANG LIANG-BIN, ZHOU GUI-EN, LI XIAO-GUANG, ZHANG YU-HENG.X-RAY DIFFRACTION STUDY OF THE MODULATED STRUCTURE IN Bi2Sr2CaCu2Oy SINGLE CRYSTALS. Acta Physica Sinica, 1996, 45(9): 1578-1585.doi:10.7498/aps.45.1578 |
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Xu Qiang, Wang Jian-Bao, Yuan Jian, Lu Fang, Sun Heng-Hui.. Acta Physica Sinica, 1995, 44(3): 432-438.doi:10.7498/aps.44.432 |
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WANG JIAN-PING, LUO HE-LIE.MECHANISM OF THE COERCIVITY FOR THE GRANULAR SOLID. Acta Physica Sinica, 1995, 44(12): 2000-2006.doi:10.7498/aps.44.2000 |
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WANG WEI-HUA, BAI HAI-YANG, ZHANG YUN, CHEN HONG, WANG WEN-KUI.STUDY THE DIFFUSION MECHANISM OF Ni IN AMORPHOUS Si BY X-RAY DIFFRACTION. Acta Physica Sinica, 1993, 42(9): 1505-1509.doi:10.7498/aps.42.1505 |
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LI CHAO-RONG, MAI ZHEN-HONG, P. D. HATTON, C. H. DU.X-RAY TRIPLE AXIS SCATTERING STUDIES OF YBa2Cu3Oy SUPERCONDUCTING THIN FILM. Acta Physica Sinica, 1993, 42(9): 1479-1484.doi:10.7498/aps.42.1479 |
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TIAN LIANG-GUANG, ZHU NAN-CHANG, CHEN JING-YI, LI RUN-SHEN, XU SHUN-SHENG, ZHOU GUO-LIANG.X-RAY DOUBLE-CRYSTAL DIFFRACTION STUDY OF HIGH QUALITY GexSi1-x/Si STRAINED LAYER SUPERLATTICE. Acta Physica Sinica, 1991, 40(3): 441-448.doi:10.7498/aps.40.441 |
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MAI ZHEN-HONG, GUI SHU-FAN, WANG CHAO-YING, WU LAN-SHENG.STUDY OF AlGaAs/GaAs WAVEGUIDE STRUCTURE BY X-RAY DOUBLE CRYSTAL DIFFRACTION. Acta Physica Sinica, 1991, 40(6): 969-977.doi:10.7498/aps.40.969 |
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ZHANG JIAN-ZHONG, CAO YAN-NI.SIMULATION STUDY OF DIVERGENT BEAM X-RAY DIFFRACTION BY CRYSTALS. Acta Physica Sinica, 1990, 39(1): 124-128.doi:10.7498/aps.39.124 |
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LU JIANG, WU ZI-QIN.A CROSS-SECTIONED TEM STUDY OF Si-W/Si/SiO2/Si(100). Acta Physica Sinica, 1989, 38(6): 981-986.doi:10.7498/aps.38.981 |
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MA DE-LU, SHANG DE-YING, YU JIN-HUA.XRD STUDY OF N2+ IMPLANTED Si. Acta Physica Sinica, 1989, 38(4): 579-585.doi:10.7498/aps.38.579 |
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JIANG XIAO-MING, JIANG ZUI-MIN, LIU WEN-HAN, WU ZI-QIN.THE EFFECT OF ANNEALING ON THE X-RAY DIFFRACTION OF W/C PERIODIC MULTILAYERS. Acta Physica Sinica, 1988, 37(11): 1893-1899.doi:10.7498/aps.37.1893 |
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QI MING, LUO JIN-SHENG.A STUDY ON THE PROPERTIES OF SiO2 THIN FILM THERMALLY NITRIDED IN AMMONIA AND ITS INTERFACE. Acta Physica Sinica, 1988, 37(10): 1600-1606.doi:10.7498/aps.37.1600 |
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LI SI-YUAN, ZHANG TONG-JUN, WANG IU-ZHEN, LI SHOU-SONG, YIN ZHI-PING.ANNEALING PROPERTIES OF GOLD-DOPED AND UNDOPED Si-SiO2 INTERFACES IN DRY OXYGEN. Acta Physica Sinica, 1985, 34(6): 715-724.doi:10.7498/aps.34.715 |
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