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Yang Meng-Sheng, Yi Tai-Min, Zheng Feng-Cheng, Tang Yong-Jian, Zhang Lin, Du Kai, Li Ning, Zhao Li-Ping, Ke Bo, Xing Pi-Feng.Surface oxidation of as-deposit uranium film characterized by X-ray photoelectron spectroscopy. Acta Physica Sinica, 2018, 67(2): 027301.doi:10.7498/aps.67.20172055 |
[2] |
Hou Li-Fei, Li Fang, Yuan Yong-Teng, Yang Guo-Hong, Liu Shen-Ye.Chemical vapor deposited diamond detectors for soft X-ray power measurement. Acta Physica Sinica, 2010, 59(2): 1137-1142.doi:10.7498/aps.59.1137 |
[3] |
Su Zhao-Feng, Yang Hai-Liang, Qiu Ai-Ci, Sun Jian-Feng, Cong Pei-Tian, Wang Liang-Ping, Lei Tian-Shi, Han Juan-Juan.Measurements of energy spectra for high energy pulsed X-ray. Acta Physica Sinica, 2010, 59(11): 7729-7735.doi:10.7498/aps.59.7729 |
[4] |
Liu Su-Ping, Gong Jian, Hu Guang-Chun, Zhang Jian-Hua.A spectral blanking-out controller for demonstration of information barrier technology. Acta Physica Sinica, 2006, 55(7): 3203-3207.doi:10.7498/aps.55.3203 |
[5] |
Feng Yu-Qing, Zhao Kun, Zhu Tao, Zhan Wen-Shan.Thermal stability of magnetic tunnel junctions investigated by x-ray photoelectron spectroscopy. Acta Physica Sinica, 2005, 54(11): 5372-5376.doi:10.7498/aps.54.5372 |
[6] |
He Shao-Long, Li Hong-Nian, Li Hai-Yang, Zhang Han-Jie, Lü Bin, He Pi-Mo, Bao Shi-Ning, Xu Ya-Bo.X-ray photoemission studies of Yb intercalated C60 thin film. Acta Physica Sinica, 2004, 53(3): 915-921.doi:10.7498/aps.53.915 |
[7] |
Wang Wei, Zhang Jie, Dong Quan-Li, V.K.Senecha.Effects of target thickness on spectral characteristics of x-ray flux from the laser-produced plasmas. Acta Physica Sinica, 2004, 53(3): 967-972.doi:10.7498/aps.53.967 |
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Xiong Zong-Hua, Kang Wu, Gong Jian, Hu Guang-Chun, Xiang Yong-Chun, Pei Yong-Quan.Analysis of the warhead temper thickness by γ-ray spectra. Acta Physica Sinica, 2003, 52(1): 1-4.doi:10.7498/aps.52.1 |
[9] |
Liu Su-Ping, Wu Huai-Long, Gu Dang-Chang, Gong Jian, Hao Fan-Hua, Hu Guang-Chun.. Acta Physica Sinica, 2002, 51(11): 2411-2416.doi:10.7498/aps.51.2411 |
[10] |
CHEN BO, ZHENG ZHI-JIAN, DING YONG-KUN, LI SAN-WEI, WANG YAO-MEI.DETERMINATION OF ELECTRON TEMPERATURE IN LASER-PRODUCED PLASMAS BY ISOELECTRONIC XRAY SPECTROSCOPY. Acta Physica Sinica, 2001, 50(4): 711-714.doi:10.7498/aps.50.711 |
[11] |
YUAN JIN-SHE, CHEN GUANG-DE, QI MING, LI AI-ZHEN, XU ZHUO.XPS AND AES INVESTIGATION OF GaN FILMS GROWN BY MBE. Acta Physica Sinica, 2001, 50(12): 2429-2433.doi:10.7498/aps.50.2429 |
[12] |
YANG JIA-MIN, DING YAO-NAN, YI RONG-QING, WANG YAO-MEI, ZHANG WEN-HAI, ZHENG ZHI-JIAN.QUANTITATIVE MEASUREMENT OF SOFT-X-RAY SPECTRUM USING TRANSMISSION GRATING SPECTROMETER. Acta Physica Sinica, 2001, 50(9): 1723-1728.doi:10.7498/aps.50.1723 |
[13] |
YANG JIA-MIN, DING YAO-NAN, SUN KE-XU, HUANG TIAN-XUAN, ZHANG WEN-HAI, WANG YAO-MEI, HU XIN, ZHANG BAO-HAN, ZHENG ZHI-JIAN.EXPERIMENTAL STUDY ON X-RAY SPECTRA FROM GOLD FOIL TARGET IRRADIATED BY 1.053μm LASER. Acta Physica Sinica, 2000, 49(12): 2408-2413.doi:10.7498/aps.49.2408 |
[14] |
Yang Jia-Min, Ding Yao-Nan, Sun Ke-Xu, Cheng Jin-Xiu, Jiang Shao-En, Zheng Zhi-Jian, Zhang Wen-Hai.. Acta Physica Sinica, 2000, 49(4): 747-750.doi:10.7498/aps.49.747 |
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JI ZHEN-GUO, CHEN LI-DENG, MA XIANG-YANG, YAO HONG-NIAN, QUE DUAN-LIN.. Acta Physica Sinica, 1995, 44(1): 57-63.doi:10.7498/aps.44.57 |
[16] |
ZHONG ZHAN-TIAN, WANG DA-WEN, LIAO XIAN-BO, FAN YUE, LI CHENG-FANG, MOU SHAN-MING.XPS AND AES STUDY FOR Au/a-Si:H INTERFACE. Acta Physica Sinica, 1991, 40(2): 275-280.doi:10.7498/aps.40.275 |
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ZHAO LIANG-ZHONG.XPS STUDIES OF A SERIES OF Ce(Ⅳ) AND Ce(Ⅲ) COMPOUNDS. Acta Physica Sinica, 1989, 38(6): 987-990.doi:10.7498/aps.38.987 |
[18] |
ZHANG HAN, HE ZHEN-HUI, ZHAO YONG, SUN SHI-FANG, QIAN YI-TAI, ZHANG QI-RUI.AN XPS STUDY ON Y-Ba-Cu-Al-O SYSTEM. Acta Physica Sinica, 1989, 38(4): 689-693.doi:10.7498/aps.38.689 |
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ZHANG TIAN-BAO, WANG SHO-JIE, LI YAO-QING, TANG XIAO-WEI.MEASUREMENT OF THE ENERGY SPECTRUM IN THE 3S1 POSITRONIUM 3γ DECAY. Acta Physica Sinica, 1983, 32(5): 670-674.doi:10.7498/aps.32.670 |
[20] |
CHENG WAN-BONG, GAO QIAO-JUN, WU ZI-QIN.SIMULTANEOUS MEASUREMENT OF THE CONSTITUENT AND THICKNESS OF THIN FILM BY X-RAY EDS. Acta Physica Sinica, 1982, 31(1): 30-37.doi:10.7498/aps.31.30 |