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Ge Di, Zhao Guo-Peng, Qi Yue-Ying, Chen Chen, Gao Jun-Wen, Hou Hong-Sheng.Influence of relativistic effects on photoionization process of hydrogen-like ions in plasma environment. Acta Physica Sinica, 2024, 73(8): 083201.doi:10.7498/aps.73.20240016 |
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Ma Kun, Zhu Lin-Fan, Xie Lu-You.Non-dipole effects on angular distribution of photoelectrons in sequential two-photon double ionization of Ar atom and K+ion. Acta Physica Sinica, 2022, 71(6): 063201.doi:10.7498/aps.71.20211905 |
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Dao Liu-Yun, Zhang Zi-Tao, Xiao Yu-Tong, Zhang Ming-Hao, Wang Shuai, He Jun, Jia Jin-Shan, Yu Le-Jun, Sun Bo, Xiong Chang-Min.Light-enhanced gating effect on the persistent photoconductivity at LaAlO3/SrTiO3interface. Acta Physica Sinica, 2019, 68(6): 067302.doi:10.7498/aps.68.20182204 |
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Gui Huai-Meng, Shi Wei.Time jitter characteristics of GaAs photoconductive semiconductor switch in linear mode. Acta Physica Sinica, 2018, 67(18): 184207.doi:10.7498/aps.67.20180548 |
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Guo Jian-Chuan, Zuo Yu-Hua, Zhang Yun, Zhang Ling-Zi, Cheng Bu-Wen, Wang Qi-Ming.Theoretical analysis and experimental study of the space-charge-screening effect in uni-traveling-carrier photodiode. Acta Physica Sinica, 2010, 59(7): 4524-4529.doi:10.7498/aps.59.4524 |
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Liu Yu-An, Du Lei, Bao Jun-Lin.Research on correlation of 1/fγ noise and hot carrier degradation in metal oxide semiconductor field effect transistor. Acta Physica Sinica, 2008, 57(4): 2468-2475.doi:10.7498/aps.57.2468 |
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Sang Cui-Cui, Wan Jian-Jie, Dong Chen-Zhong, Ding Xiao-Bin, Jiang Jun.Relaxation effect in photoionization processes of lithium. Acta Physica Sinica, 2008, 57(4): 2152-2160.doi:10.7498/aps.57.2152 |
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Jia Wan-Li, Ji Wei-Li, Shi Wei.Two-dimensional Monte Carlo simulation of screening of the bias field in terahertz generation from semi-insulated GaAs photoconductors. Acta Physica Sinica, 2007, 56(4): 2042-2046.doi:10.7498/aps.56.2042 |
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Mao Bang-Ning, Pan Bai-Liang, Chen Gang, Xia Ting-Ting.Resonance radiation trapping in alkaline-earth metal atomic lasers. Acta Physica Sinica, 2006, 55(4): 1793-1797.doi:10.7498/aps.55.1793 |
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