[1] |
Zhang Ming-Lan, Yang Rui-Xia, Li Zhuo-Xin, Cao Xing-Zhong, Wang Bao-Yi, Wang Xiao-Hui.Study on proton irradiation induced defects in GaN thick film. Acta Physica Sinica, 2013, 62(11): 117103.doi:10.7498/aps.62.117103 |
[2] |
Wu Jun-Bo, Tang Xin-Gui, Jia Zhen-Hua, Chen Dong-Ge, Jiang Yan-Ping, Liu Qiu-Xiang.Influences of Y- and La-dopant on the thermal conductive properties and dielectric relaxation of Al2O3-based ceramics. Acta Physica Sinica, 2012, 61(20): 207702.doi:10.7498/aps.61.207702 |
[3] |
Chang Hu-Dong, Sun Bing, Lu Li, Zhao Wei, Wang Sheng-Kai, Wang Wen-Xin, Liu Hong-Gang.Study on high mobility In0.6Ga0.4As channel MOSHEMT and MOSFET. Acta Physica Sinica, 2012, 61(21): 217304.doi:10.7498/aps.61.217304 |
[4] |
Qiao Jian-Liang, Chang Ben-Kang, Qian Yun-Sheng, Wang Xiao-Hui, Li Biao, Xu Yuan.Photoemission mechanism of GaN vacuum surface electron source. Acta Physica Sinica, 2011, 60(12): 127901.doi:10.7498/aps.60.127901 |
[5] |
Jin Yu-Zhe, Hu Yi-Pei, Zeng Xiang-Hua, Yang Yi-Jun.Gamma radiation effect on GaN-based blue light-emitting diodes with multi-quantum well. Acta Physica Sinica, 2010, 59(2): 1258-1262.doi:10.7498/aps.59.1258 |
[6] |
Bi Zhi-Wei, Feng Qian, Hao Yue, Yue Yuan-Zheng, Zhang Zhong-Fen, Mao Wei, Yang Li-Yuan, Hu Gui-Zhou.Effect of Al2O3 dielectric layer thickness on the AlGaN/GaN metal-oxide-semiconductor higher-electron-mobility transistor characteristics. Acta Physica Sinica, 2009, 58(10): 7211-7215.doi:10.7498/aps.58.7211 |
[7] |
Lü Ling, Gong Xin, Hao Yue.Properties of p-type GaN etched by inductively coupled plasma and their improvement. Acta Physica Sinica, 2008, 57(2): 1128-1132.doi:10.7498/aps.57.1128 |
[8] |
Zhou Mei, Zhao De-Gang.Effect of p-GaN layer thickness on the performance of p-i-n structure GaN ultraviolet photodetectors. Acta Physica Sinica, 2008, 57(7): 4570-4574.doi:10.7498/aps.57.4570 |
[9] |
Zhou Li-Hong, Zhang Chong-Hong, Li Bing-Sheng, Yang Yi-Tao, Song Yin.Photoluminescence of Ar+ implanted sapphire before and after annealing. Acta Physica Sinica, 2008, 57(4): 2562-2566.doi:10.7498/aps.57.2562 |
[10] |
Liao Guo-Jin, Yan Shao-Feng, Ba De-Chun.The blue luminescence of cerium doped aluminum oxide thin film. Acta Physica Sinica, 2008, 57(11): 7327-7332.doi:10.7498/aps.57.7327 |
[11] |
Shen Ye, Xing Huai-Zhong, Yu Jian-Guo, Lü Bin, Mao Hui-Bing, Wang Ji-Qing.Curie-temperature modulation by polarization-induced built-in electric fields in Mn δ-doped GaN/AlGaN quantum wells. Acta Physica Sinica, 2007, 56(6): 3453-3457.doi:10.7498/aps.56.3453 |
[12] |
Zhou Mei, Zuo Shu-Hua, Zhao De-Gang.A new Schottky barrier structure of GaN-based ultraviolet photodetector. Acta Physica Sinica, 2007, 56(9): 5513-5517.doi:10.7498/aps.56.5513 |
[13] |
Guo Liang-Liang, Feng Qian, Ma Xiang-Bai, Hao Yue, Liu Jie.Relation between breakdown voltage and current collapse in GaN FP-HEMTs. Acta Physica Sinica, 2007, 56(5): 2900-2904.doi:10.7498/aps.56.2900 |
[14] |
Song Yin, Wang Zhi-Guang, Wei Kong-Fang, Zhang Chong-Hong, Liu Chun-Bao, Zang Hang, Zhou Li-Hong.Effects of annealing on the photoluminescence of He ion implanted sapphire after 230 MeV Pb ion irradiation. Acta Physica Sinica, 2007, 56(1): 551-555.doi:10.7498/aps.56.551 |
[15] |
Zhou Xian-Ming, Wang Xiao-Song, Li Sai-Nan, Li Jun, Li Jia-Bo, Jing Fu-Qian.Optical transparency of z-cut LiF, Al2O3 and LiTaO3 single crystals under strong shock compression. Acta Physica Sinica, 2007, 56(8): 4965-4970.doi:10.7498/aps.56.4965 |
[16] |
Song Shu-Fang, Chen Wei-De, Xu Zhen-Jia, Xu Xu-Rong.Study on optical properties of Er/Er+O doped GaN thin films. Acta Physica Sinica, 2007, 56(3): 1621-1626.doi:10.7498/aps.56.1621 |
[17] |
Meng Kang, Jiang Sen-Lin, Hou Li-Na, Li Chan, Wang Kun, Ding Zhi-Bo, Yao Shu-De.Study of radiation damage in Mg+-implanted GaN. Acta Physica Sinica, 2006, 55(5): 2476-2481.doi:10.7498/aps.55.2476 |
[18] |
Song Shu-Fang, Chen Wei-De, Xu Zhen-Jia, Xu Xu-Rong.Deep level transient spectroscopy studies of Er and Pr implanted GaN films. Acta Physica Sinica, 2006, 55(3): 1407-1412.doi:10.7498/aps.55.1407 |
[19] |
Wan Wei, Tang Chun-Yan, Wang Yu-Mei, Li Fang-Hua.A study on the stacking fault in GaN crystals by high-resolution electron microscope imaging. Acta Physica Sinica, 2005, 54(9): 4273-4278.doi:10.7498/aps.54.4273 |
[20] |
Qin Qi, Yu Nai-Sen, Guo Li-Wei, Wang Yang, Zhu Xue-Liang, Chen Hong, Zhou Jun-Ming.Residual stress in the GaN epitaxial film prepared by in situ SiNx deposition. Acta Physica Sinica, 2005, 54(11): 5450-5454.doi:10.7498/aps.54.5450 |