[1] |
Zhou Chun-Yu, Zhang He-Ming, Hu Hui-Yong, Zhuang Yi-Qi, Su Bin, Wang Bin, Wang Guan-Yu.Physical compact modeling for threshold voltage of strained Si NMOSFET. Acta Physica Sinica, 2013, 62(7): 077103.doi:10.7498/aps.62.077103 |
[2] |
Huang Yuan, Xu Jing-Ping, Wang Li-Sheng, Zhu Shu-Yan.Effects of different scattering mechanisms on inversion-channel electron mobility in Al2O3/InxGa1-xAs nMOSFET. Acta Physica Sinica, 2013, 62(15): 157201.doi:10.7498/aps.62.157201 |
[3] |
Xin Yan-Hui, Liu Hong-Xia, Fan Xiao-Jiao, Zhuo Qing-Qing.Threshold voltage analytical model of fully depleted strained Si single Halo silicon-on-insulator metal-oxide semiconductor field effect transistor. Acta Physica Sinica, 2013, 62(10): 108501.doi:10.7498/aps.62.108501 |
[4] |
Bi Juan, Jin Guang-Yong, Ni Xiao-Wu, Zhang Xi-He, Yao Zhi-Jian.Analysis of 532nm long pulse laser-induced thermal decomposition damage to GaAs by semi-analytical method. Acta Physica Sinica, 2012, 61(24): 244209.doi:10.7498/aps.61.244209 |
[5] |
Li Yu-Chen, Zhang He-Ming, Zhang Yu-Ming, Hu Hui-Yong, Xu Xiao-Bo, Qin Shan-Shan, Wang Guan-Yu.A analytic model for the threshold-voltage of novel high-speed semiconductor device IMOS. Acta Physica Sinica, 2012, 61(4): 047303.doi:10.7498/aps.61.047303 |
[6] |
Qu Jiang-Tao, Zhang He-Ming, Wang Guan-Yu, Wang Xiao-Yan, Hu Hui-Yong.Threshold voltage model for quantum-well channelpMOSFET with poly SiGe gate. Acta Physica Sinica, 2011, 60(5): 058502.doi:10.7498/aps.60.058502 |
[7] |
Liu Zhang-Li, Hu Zhi-Yuan, Zhang Zheng-Xuan, Shao Hua, Ning Bing-Xu, Bi Da-Wei, Chen Ming, Zou Shi-Chang.Total ionizing dose effect of 0.18 m nMOSFETs. Acta Physica Sinica, 2011, 60(11): 116103.doi:10.7498/aps.60.116103 |
[8] |
Wang Guan-Yu, Zhang He-Ming, Wang Xiao-Yan, Wu Tie-Feng, Wang Bin.Two-dimensional threshold voltage model of sub-100 nm strained-Si/SiGe nMOSFET. Acta Physica Sinica, 2011, 60(7): 077106.doi:10.7498/aps.60.077106 |
[9] |
Zhang Zhi-Feng, Zhang He-Ming, Hu Hui-Yong, Xuan Rong-Xi, Song Jian-Jun.Threshold voltage model of strained Si channel nMOSFET. Acta Physica Sinica, 2009, 58(7): 4948-4952.doi:10.7498/aps.58.4948 |
[10] |
Tang Xiao-Yan, Zhang Yi-Men, Zhang Yu-Ming.The threshold voltage of SiC Schottky barrier source/drain MOSFET. Acta Physica Sinica, 2009, 58(1): 494-497.doi:10.7498/aps.58.494 |
[11] |
Han Liang, Zhao Yu-Qing, Zhang Hai-Bo.The research on half-analytical method in calculating the magnetic field of unbalanced magnetron sputtering. Acta Physica Sinica, 2008, 57(2): 996-1000.doi:10.7498/aps.57.996 |
[12] |
Luan Su-Zhen, Liu Hong-Xia, Jia Ren-Xu, Cai Nai-Qiong.2-D analytical modeling of dual material gate fully depleted SOI MOSFET with high-k dielectric. Acta Physica Sinica, 2008, 57(6): 3807-3812.doi:10.7498/aps.57.3807 |
[13] |
Ji Yun-Jing, Bian Bao-Min, Tong Chao-Xia, Lu Jian.Study on the electrical potential signals induced by laser plasma in the target with bias-voltage. Acta Physica Sinica, 2008, 57(2): 980-984.doi:10.7498/aps.57.980 |
[14] |
Zhang He-Ming, Cui Xiao-Ying, Hu Hui-Yong, Dai Xian-Ying, Xuan Rong-Xi.Study on threshold voltage model of strained SiGe quantum well channel SOI PMOSFET. Acta Physica Sinica, 2007, 56(6): 3504-3508.doi:10.7498/aps.56.3504 |
[15] |
Li Yan-Ping, Xu Jing-Ping, Chen Wei-Bing, Xu Sheng-Guo, Ji Feng.2-D threshold voltage model for short-channel MOSFET with quantum-mechanical effects. Acta Physica Sinica, 2006, 55(7): 3670-3676.doi:10.7498/aps.55.3670 |
[16] |
Chen Wei-Bing, Xu Jing-Ping, Zou Xiao, Li Yan-Ping, Xu Sheng-Guo, Hu Zhi-Fu.Analytic tunneling-current model of small-scale MOSFETs. Acta Physica Sinica, 2006, 55(10): 5036-5040.doi:10.7498/aps.55.5036 |
[17] |
Bao Jun-Lin, Zhuang Yi-Qi, Du Lei, Li Wei-Hua, Wan Chang-Xing, Zhang Ping.A unified model for 1/f noise in n-channel and p-channel MOSFETs. Acta Physica Sinica, 2005, 54(5): 2118-2122.doi:10.7498/aps.54.2118 |
[18] |
Dai Yue-Hua, Chen Jun-Ning, Ke Dao-Ming, Sun Jia-E.An analytical model of MOSFET threshold voltage with considiring the quantum effects. Acta Physica Sinica, 2005, 54(2): 897-901.doi:10.7498/aps.54.897 |
[19] |
Wang Yuan, Zhang Yi-Men, Zhang Yu-Ming, Tang Xiao-Yan.A simulation study of 6H-SiC Schottky barrier source/drain MOSFET. Acta Physica Sinica, 2003, 52(10): 2553-2557.doi:10.7498/aps.52.2553 |
[20] |
Xu Chang-Fa, Yang Yin-Tang, Liu Li.. Acta Physica Sinica, 2002, 51(5): 1113-1117.doi:10.7498/aps.51.1113 |