The micro-nano-scale science is rapidly developing. In order to study the properties of micro-nano-scale particles by the optical method, we discuss the scattering effects of sub-micrometer wires and sub-micrometer balls on photo-electromagnetic wave in this paper. For the optical scattering of micro-nano-scale particles, the scattering particle size can meet the Mie scattering conditions compared with the incident light wavelength, that is to say, the scatterer and the incident wavelength have comparable size. In this article, the analysis results are clearly displayed in the form of simulation graphs obtained by the Matlab numerical simulation. The Mie scattering analysis method can be used for discussing the scattering of electromagnetic waves in the cases of layered particles which meet the size requirements and any number of scattering particles. Multi-particle scattering is analyzed to investigate the effects of scatterers at different positions on the scattering. By analyzing the differential scattering cross section and the electromagnetic field distribution of near-field scattering related to the scattering light field, we obtain the variation trend of the scattering light field with scattering angle and the effects of various factors on the scattering light field, including the polarization of incident wave, the size of the scatterer, the structure of scattering particles, the number of particles, the number of scattering particles, and some hidden factors such as the relative refractive index of scatterer and surrounding medium. The scientific significance of the paper is reflected through the fact that the sub-micron scale particle can be used as a sensor of detecting the displacement, which can be realized by optical means. So it has a certain reference value for studying the influence of particle own characteristic on the scattering light, thereby rendering the optical readout of the mechanical displacement very accurate. The obtained results have a guiding significance for studying the optical detection of mechanical vibrations of sub-micron wires.