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Hua Ying-Xin, Chen Xiao-Hui, Li Jun, Hao Long, Sun Yi, Wang Yu-Feng, Geng Hua-Yun.In situX-ray diffraction measurement of shock melting in vanadium. Acta Physica Sinica, 2022, 71(7): 076201.doi:10.7498/aps.71.20212065 |
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Gao Feng-Ju.Calculation of coherent X-ray diffraction from bent Cu nanowires. Acta Physica Sinica, 2015, 64(13): 138102.doi:10.7498/aps.64.138102 |
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Li Hong-Tao, Luo Yi, Xi Guang-Yi, Wang Lai, Jiang Yang, Zhao Wei, Han Yan-Jun, Hao Zhi-Biao, Sun Chang-Zheng.Thickness measurement of GaN films by X-ray diffraction. Acta Physica Sinica, 2008, 57(11): 7119-7125.doi:10.7498/aps.57.7119 |
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YANG JIA-MIN, YI RONG-QING, CHEN ZHENG-LIN, SUN KE-XU, DING YAO-NAN, ZHENG ZHI-JIAN, LI CHAO-GUANG, CUI MING-QI, ZHU PEI-PING, CUI CONG-WU.STUDY OF TRANSMISSION GRATING DIFFRACTION EFFICIENCIES FOR SOFT X-RAYS. Acta Physica Sinica, 1998, 47(4): 613-618.doi:10.7498/aps.47.613 |
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XU ZHENG, ZHAO XIAO-RU, WU WEN-BIN, SUN XUE-FENG, WANG LIANG-BIN, ZHOU GUI-EN, LI XIAO-GUANG, ZHANG YU-HENG.X-RAY DIFFRACTION STUDY OF THE MODULATED STRUCTURE IN Bi2Sr2CaCu2Oy SINGLE CRYSTALS. Acta Physica Sinica, 1996, 45(9): 1578-1585.doi:10.7498/aps.45.1578 |
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HE XIAN-CHANG, WU ZI-QIN, ZHAO TE-XIU, Lü ZHI-HUI, WANG XIAO-PING, SUN GUO-XI.INVESTIGATION OF LATTICE DEFORMATION OF POROUS SILICON FILMS BY X-RAY DOUBLE CRYSTAL DIFFRACTION. Acta Physica Sinica, 1993, 42(6): 954-962.doi:10.7498/aps.42.954 |
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YANG PING, ZHAO JI-YONG, JIANG JIAN-HUA.CALCULATION ON THE HARMONIC DIFFRACTION OF SYNCHROTRON RADIATION X-RAYS. Acta Physica Sinica, 1993, 42(3): 437-445.doi:10.7498/aps.42.437 |
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MAI ZHEN-HONG, GUI SHU-FAN, WANG CHAO-YING, WU LAN-SHENG.STUDY OF AlGaAs/GaAs WAVEGUIDE STRUCTURE BY X-RAY DOUBLE CRYSTAL DIFFRACTION. Acta Physica Sinica, 1991, 40(6): 969-977.doi:10.7498/aps.40.969 |
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ZHU NAN-CHANG, LI RUN-SHEN, CHEN JING-YI, XU SHUN-SHENG.INVESTIGATION OF THE SURFACE DISTORTED CRYSTALS BY DYNAMICAL X-RAY DOUBLE-CRYSTAL DIFFRACTION. Acta Physica Sinica, 1990, 39(5): 770-777.doi:10.7498/aps.39.770 |
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ZHANG JIAN-ZHONG, CAO YAN-NI.SIMULATION STUDY OF DIVERGENT BEAM X-RAY DIFFRACTION BY CRYSTALS. Acta Physica Sinica, 1990, 39(1): 124-128.doi:10.7498/aps.39.124 |
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ZHAO QING-LAN, HUANG YI-SEN.STUDY OF DEFECTS IN CRYSTAL OF TRIHYDROXYME-THYLAMINOMETHANE BY X-RAY TOPOGRAPHY. Acta Physica Sinica, 1990, 39(9): 1418-1423.doi:10.7498/aps.39.1418 |
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MA DE-LU, SHANG DE-YING, YU JIN-HUA.XRD STUDY OF N2+ IMPLANTED Si. Acta Physica Sinica, 1989, 38(4): 579-585.doi:10.7498/aps.38.579 |
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TIAN LIANG-GUANG, LIU XIANG-LIN, XU SHUN-SHENG, HAN XIAO-XI.X RAY DOUBLE CRYSTAL DIFFRACTION STUDY OF (BiTm)3(FeGa)5O12 MAGNETIC GARNET FILMS GROWN BY LIQUID PHASE EPITAXY. Acta Physica Sinica, 1989, 38(10): 1704-1709.doi:10.7498/aps.38.1704 |
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ZHAO QING-LAN, HUANG YI-SEN.X-RAY TOPOGRAPHIC CONTRAST OF INCLUSIONS IN CRYSTAL OF POTASSIUM ACID PHTHALATE. Acta Physica Sinica, 1989, 38(7): 1134-1139.doi:10.7498/aps.38.1134 |
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JIANG XIAO-MING, WU ZI-QIN.SIMULATION OF X-RAY DIFFRACTION PEAK PROFILE OF ONE DIMENSIONAL FIBONACCI SERIES. Acta Physica Sinica, 1988, 37(11): 1900-1905.doi:10.7498/aps.37.1900 |
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CHU XI, MAI ZHEN-HONG, DAI DAO-YANG, CUI SHU-FAN, GE PEI-WEN.STUDY ON A PLANE-LIKE PRECIPITATE IN SILICON SINGLE CRYSTAL BY X-RAY TOPOGRAPHIC METHOD. Acta Physica Sinica, 1987, 36(3): 408-410.doi:10.7498/aps.36.408 |
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SUN ZhANG-DE.SOLVING THE EQUATION OF X-RAY DIFFRACTION BY GREEN'S FUNCTION. Acta Physica Sinica, 1983, 32(8): 982-989.doi:10.7498/aps.32.982 |
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LIANG JING-KUI, YI SUn-SHENG.AN X-RAY DOUBLE-CRYSTAL SPECTROMETRIC INVESTIGATION OF THE BEHAVIOUR OF α-LiIO3SINGLE CRYSTALS UNDER THE ACTION OF ELECTROSTATIC FIELD. Acta Physica Sinica, 1978, 27(2): 126-136.doi:10.7498/aps.27.126 |
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XU JI-AN, HU JING-ZHU.X-RAY DIFFRACTION UNDER HIGH PRESSURE. Acta Physica Sinica, 1977, 26(6): 521-525.doi:10.7498/aps.26.521 |
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WU TE-CHAN, WANG JEN-HUI.THE THERMAL DIFFUSE X-RAY SCATTERING AND ELASTIC CONSTANTS OF ZINC. Acta Physica Sinica, 1966, 22(5): 533-540.doi:10.7498/aps.22.533 |
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