| [1] |
Zhou Guang-Zhao, Hu Zhe, Yang Shu-Min, Liao Ke-Liang, Zhou Ping, Liu Ke, Hua Wen-Qiang, Wang Yu-Zhu, Bian Feng-Gang, Wang Jie.Preliminary exploration of hard X-ray coherent diffraction imaging method at SSRF. Acta Physica Sinica, 2020, 69(3): 034102.doi:10.7498/aps.69.20191586 |
| [2] |
Wang Hai-Bo, Luo Zhen-Lin, Liu Qing-Qing, Jin Chang-Qing, Gao Chen, Zhang Li.Resonant X-ray diffraction studies on modulation structures of high temperature superconducting sample Sr2CuO3.4. Acta Physica Sinica, 2019, 68(18): 187401.doi:10.7498/aps.68.20190494 |
| [3] |
Li Jun, Chen Xiao-Hui, Wu Qiang, Luo Bin-Qiang, Li Mu, Yang Qing-Guo, Tao Tian-Jiong, Jin Ke, Geng Hua-Yun, Tan Ye, Xue Tao.Experimental investigation on dynamic lattice response by in-situ Xray diffraction method. Acta Physica Sinica, 2017, 66(13): 136101.doi:10.7498/aps.66.136101 |
| [4] |
He Ju-Sheng, Zhang Meng, Zou Ji-Jun, Pan Hua-Qing, Qi Wei-Jing, Li Ping.Analyses of determination conditions of n-GaN dislocation density by triple-axis X-ray diffraction. Acta Physica Sinica, 2017, 66(21): 216102.doi:10.7498/aps.66.216102 |
| [5] |
Xu Xiao-Ming, Miao Wei, Tao Kun.Direct method of determining the lattice parameters of a phase from X-ray diffraction pattern of multi-phase. Acta Physica Sinica, 2011, 60(8): 086101.doi:10.7498/aps.60.086101 |
| [6] |
Ming Bao-Quan, Wang Jin-Feng, Zang Guo-Zhong, Wang Chun-Ming, Gai Zhi-Gang, Du Juan, Zheng Li-Mei.X-ray diffraction and phase transition analysis for (K, Na)NbO3-based lead-free piezoelectric ceramics. Acta Physica Sinica, 2008, 57(9): 5962-5967.doi:10.7498/aps.57.5962 |
| [7] |
Shi Shao-Meng, Chen Rong-Chang, Xue Yan-Ling, Ren Yu-Qi, Du Guo-Hao, Deng Biao, Xie Hong-Lan, Xiao Ti-Qiao.X-ray microscopic imaging of low Z material wrapped by strongly absorbing medium. Acta Physica Sinica, 2008, 57(10): 6319-6328.doi:10.7498/aps.57.6319 |
| [8] |
Tan Guo-Tai, Chen Zheng-Hao.XRD analysis on lattice structure of La1-xTexMnO3. Acta Physica Sinica, 2007, 56(3): 1702-1706.doi:10.7498/aps.56.1702 |
| [9] |
Qin Pei, Lou Yu-Wan, Yang Chuan-Zheng, Xia Bao-Jia.New computing methods and programs for separating multipe-broadening effects of X-ray diffraction lines. Acta Physica Sinica, 2006, 55(3): 1325-1335.doi:10.7498/aps.55.1325 |
| [10] |
LIU GANG, LU KE, LIANG ZHI-DE.ANALYSIS OF THE DECONVOLUTION OF X-RAY DIFFRACTION PROFILE AND SIMULTANEOUS CALCULATION OF BRAGG ANGLE. Acta Physica Sinica, 2000, 49(8): 1520-1523.doi:10.7498/aps.49.1520 |
| [11] |
CHU GANG.A DOPING METHOD FOR QUANTITATIVE X-RAY DIFFRACTION PHASE ANALYSIS OF SAMPLES CONTAINING AMORPHOUS MATERIAL. Acta Physica Sinica, 1998, 47(7): 1143-1148.doi:10.7498/aps.47.1143 |
| [12] |
CHENG YU-HANG, WU YI-PING, CHEN JIAN-GUO, QIAO XUE-LIANG, XIE CHANG-SHENG, YANG YE-ZHI, MUO SHAO-BO.STUDY ON THE STRUCTURE OF a-C∶H(N) FILMS BY XPS. Acta Physica Sinica, 1998, 47(1): 83-88.doi:10.7498/aps.47.83 |
| [13] |
LUO JIAN, YAN HONG, TAO KUN.X-RAY DIFFRACTION PHASE DEPTH PROFILING FOR POLYCRYSTAL WITH CONTINUOUS PHASE DEPTH DISTRIBUTION. Acta Physica Sinica, 1995, 44(11): 1788-1792.doi:10.7498/aps.44.1788 |
| [14] |
CHU GANG.. Acta Physica Sinica, 1995, 44(10): 1679-1683.doi:10.7498/aps.44.1679 |
| [15] |
ZHU NAN-CHANG, LI RUN-SHEN, XU SHUN-SHENG.INVESTIGATION OF THE SEMICONDUCTOR STRAINED SUPERLATTICE STRUCTURE AND INTERFACE BY X-RAY ROCKING-CURVE ANALYSIS. Acta Physica Sinica, 1991, 40(3): 433-440.doi:10.7498/aps.40.433 |
| [16] |
ZHOU GUO-LIANG, SHEN XIAO-LIANG, SHENG CHI, JIANG WEI-DONG, YU MING-REN.SMALL-ANGLE X-RAY DIFFRACTION ANALYSIS OF GexSi1-x/Si SUPERLATTICE. Acta Physica Sinica, 1991, 40(1): 56-63.doi:10.7498/aps.40.56 |
| [17] |
WU ZHI-QIANG, LU XIANG-DONG, HUANG WEN-YONG, LIU HONG-TU, JIN HUAI-CHENG, WANG CHANG-SUI, ZHOU GUI-EN, WU ZI-QIN.SMALL-ANGLE X-RAY DIFFRACTION STUDY OF AMORPHOUS MULTILAYER AND SINGLE LAYER THIN FILMS. Acta Physica Sinica, 1987, 36(5): 591-598.doi:10.7498/aps.36.591 |
| [18] |
GUO CHANG-LIN, YAO GONG-DA.NEW GENERAL METHOD OF X-RAY DIFFRACTION QUANTITATIVE PHASE ANALYSIS WITHOUT STANDARDS. Acta Physica Sinica, 1985, 34(11): 1451-1460.doi:10.7498/aps.34.1451 |
| [19] |
GUO CHANG-LIN.QUANTITATIVE DETERMINATION OF SPECTRAL PURITY OF X-RAY TUBES FOR DIFFRACTION ANALYSIS. Acta Physica Sinica, 1980, 29(1): 35-45.doi:10.7498/aps.29.35 |
| [20] |
JIN LONG-HUAN, CHANG LONG-CHUN.X-RAY STRUCTURE ANALYSIS OF AMORPHOUS ALLOYS FeCoSiB, FeSiB AND FeB. Acta Physica Sinica, 1980, 29(10): 1275-1282.doi:10.7498/aps.29.1275 |
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