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Huang Hao, Zhang Kan, Wu Ming, Li Hu, Wang Min-Juan, Zhang Shu-Ming, Chen Jian-Hong, Wen Mao.Comparison between axial residual stresses measured by Raman spectroscopy and X-ray diffraction in SiC fiber reinforced titanium matrix composite. Acta Physica Sinica, 2018, 67(19): 197203.doi:10.7498/aps.67.20181157 |
[2] |
Zhang Jin-Shuai, Huang Qiu-Shi, Jiang Li, Qi Run-Ze, Yang Yang, Wang Feng-Li, Zhang Zhong, Wang Zhan-Shan.Stress and structure properties of X-ray W/Si multilayer under low temperature annealing. Acta Physica Sinica, 2016, 65(8): 086101.doi:10.7498/aps.65.086101 |
[3] |
Lu Yong-Jun, Yang Yi, Wang Feng-Hui, Lou Kang, Zhao Xiang.Effect of continuously graded functional layer on curvature and residual stress of solid oxide fuel cell in initial reduction process. Acta Physica Sinica, 2016, 65(9): 098102.doi:10.7498/aps.65.098102 |
[4] |
Jian Xiao-Gang, Chen Jun.The Influence of Co binding phase on adhesive strength of diamond coating with cemented carbide substrate. Acta Physica Sinica, 2015, 64(21): 216701.doi:10.7498/aps.64.216701 |
[5] |
Wang Hong, Yun Feng, Liu Shuo, Huang Ya-Ping, Wang Yue, Zhang Wei-Han, Wei Zheng-Hong, Ding Wen, Li Yu-Feng, Zhang Ye, Guo Mao-Feng.Effect of wafer bonding and laser liftoff process on residual stress of GaN-based vertical light emitting diode chips. Acta Physica Sinica, 2015, 64(2): 028501.doi:10.7498/aps.64.028501 |
[6] |
Chen Shu-Ying, Wang Hai-Dou, Xu Bin-Shi, Kang Jia-Jie.Investigation on the bonding behavior of the interface within the supersonic plasma sprayed coating system based on the fractal theory. Acta Physica Sinica, 2014, 63(15): 156801.doi:10.7498/aps.63.156801 |
[7] |
Sun Yun, Wang Sheng-Lai, Gu Qing-Tian, Xu Xin-Guang, Ding Jian-Xu, Liu Wen-Jie, Liu Guang-Xia, Zhu Sheng-Jun.Study of KDP crystal lattice strain and stress by high resolution X-ray diffraction. Acta Physica Sinica, 2012, 61(21): 210203.doi:10.7498/aps.61.210203 |
[8] |
Jiang Wei-Wei, Fan Lin-Yong, Zhao Rui-Feng, Wei Yan, Pei Li, Jian Shui-Sheng.Comb-filter based on two core fiber coupler and its CO2 laser trimming. Acta Physica Sinica, 2011, 60(4): 044214.doi:10.7498/aps.60.044214 |
[9] |
Jiang Yang, Luo Yi, Xi Guang-Yi, Wang Lai, Li Hong-Tao, Zhao Wei, Han Yan-Jun.Effect of AlGaN intermediate layer on residual stress control and surface morphology of GaN grown on 6H-SiC substrate by metal organic vapour phase epitaxy. Acta Physica Sinica, 2009, 58(10): 7282-7287.doi:10.7498/aps.58.7282 |
[10] |
Cen Min, Zhang Yue-Guang, Chen Wei-Lan, Gu Pei-Fu.Influences of deposition rate and oxygen partial pressure on residual stress of HfO2 films. Acta Physica Sinica, 2009, 58(10): 7025-7029.doi:10.7498/aps.58.7025 |
[11] |
Hua Shao-Chun, Wang Han-Gong, Wang Liu-Ying, Zhang Wu, Liu Gu.The adhesives strength of nanostructured AT13 ceramic coatings characterized by fractal dimension. Acta Physica Sinica, 2008, 57(2): 1241-1245.doi:10.7498/aps.57.1241 |
[12] |
Sun Hao-Liang, Song Zhong-Xiao, Xu Ke-Wei.Effect of substrate constraint on stress-induced cracking of sputtered tungsten thin film. Acta Physica Sinica, 2008, 57(8): 5226-5231.doi:10.7498/aps.57.5226 |
[13] |
Zhang Yong-Kang, Kong De-Jun, Feng Ai-Xin, Lu Jin-Zhong, Zhang Lei-Hong, Ge Tao.Study on the determination of interfacial binding strength of coatings (Ⅰ): theorctical analysis of stress in thin film binding interface. Acta Physica Sinica, 2006, 55(6): 2897-2900.doi:10.7498/aps.55.2897 |
[14] |
Di Yu-Xian, Ji Xin-Hua, Hu Ming, Qin Yu-Wen, Chen Jin-Long.Residual stress measurement of porous silicon thin film by substrate curvature method. Acta Physica Sinica, 2006, 55(10): 5451-5454.doi:10.7498/aps.55.5451 |
[15] |
Zhang Yong-Kang, Kong De-Jun, Feng Ai-Xin, Lu Jin-Zhong, Ge Tao.Study on the detection of interfacial bonding strength of coatings (Ⅱ): detecting system of bonding strength. Acta Physica Sinica, 2006, 55(11): 6008-6012.doi:10.7498/aps.55.6008 |
[16] |
Qin Qi, Yu Nai-Sen, Guo Li-Wei, Wang Yang, Zhu Xue-Liang, Chen Hong, Zhou Jun-Ming.Residual stress in the GaN epitaxial film prepared by in situ SiNx deposition. Acta Physica Sinica, 2005, 54(11): 5450-5454.doi:10.7498/aps.54.5450 |
[17] |
Shao Shu-Ying, Fan Zheng-Xiu, Shao Jian-Da.Influences of the period of repeating thickness on the stress of alternative high and low refractivity ZrO2/SiO2 multilayers. Acta Physica Sinica, 2005, 54(7): 3312-3316.doi:10.7498/aps.54.3312 |
[18] |
Ma Hong-Wei, Liang Jing-Kui.A new approach to extract reliable intensities of non-equivalent systematical overlapping reflections from powder diffraction data. Acta Physica Sinica, 2004, 53(3): 829-834.doi:10.7498/aps.53.829 |
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XU KE-WEI, GAO RUN-SHENG, YU LI-GEN, HE JIA-WEN.THIN FILM STRESS EVALUATION BY A GLANCING X-RAY BEAM. Acta Physica Sinica, 1994, 43(8): 1295-1300.doi:10.7498/aps.43.1295 |
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LU XUE-SHAN, LIANG JING-KUI.THE DETERMINATION OF DEBYE CHARACTERISTIC TEMPERATURES OF CRYSTALS FROM X-RAY DIFFRACTION INTENSITIES. Acta Physica Sinica, 1981, 30(10): 1361-1368.doi:10.7498/aps.30.1361 |