[1] |
Huang Yu-Feng, Wu Wei-Hua, Xu Sheng-Qing, Zhu Xiao-Qin, Song San-Nian, Song Zhi-Tang.Thickness effect of Sn15Sb85phase change film. Acta Physica Sinica, 2021, 70(22): 226102.doi:10.7498/aps.70.20210973 |
[2] |
Zhang Yan, Dong Gang, Yang Yin-Tang, Wang Ning, Wang Feng-Juan, Liu Xiao-Xian.A novel interconnect-optimal power model considering self-heating effect. Acta Physica Sinica, 2013, 62(1): 016601.doi:10.7498/aps.62.016601 |
[3] |
Zhou Chun-Yu, Zhang He-Ming, Hu Hui-Yong, Zhuang Yi-Qi, Su Bin, Wang Bin, Wang Guan-Yu.Physical compact modeling for threshold voltage of strained Si NMOSFET. Acta Physica Sinica, 2013, 62(7): 077103.doi:10.7498/aps.62.077103 |
[4] |
Li Li, Liu Hong-Xia, Yang Zhao-Nian.Threshold-voltage and hole-sheet-density model of quantum well Si/SiGe/Si p field effect transistor. Acta Physica Sinica, 2012, 61(16): 166101.doi:10.7498/aps.61.166101 |
[5] |
Qiang Lei, Yao Ruo-He.Distributions of the threshold voltage and the temperature in the channel of amorphous silicon thin film transistors. Acta Physica Sinica, 2012, 61(8): 087303.doi:10.7498/aps.61.087303 |
[6] |
Li Yu-Chen, Zhang He-Ming, Zhang Yu-Ming, Hu Hui-Yong, Xu Xiao-Bo, Qin Shan-Shan, Wang Guan-Yu.A analytic model for the threshold-voltage of novel high-speed semiconductor device IMOS. Acta Physica Sinica, 2012, 61(4): 047303.doi:10.7498/aps.61.047303 |
[7] |
Qian Li-Bo, Zhu Zhang-Ming, Yang Yin-Tang.Through-silicon-via-aware interconnect prediction model for 3D integrated circuirt. Acta Physica Sinica, 2012, 61(6): 068001.doi:10.7498/aps.61.068001 |
[8] |
Wang Guan-Yu, Zhang He-Ming, Wang Xiao-Yan, Wu Tie-Feng, Wang Bin.Two-dimensional threshold voltage model of sub-100 nm strained-Si/SiGe nMOSFET. Acta Physica Sinica, 2011, 60(7): 077106.doi:10.7498/aps.60.077106 |
[9] |
Dong Gang, Xue Meng, Li Jian-Wei, Yang Yin-Tang.Statistical power consumption of RC interconnect tree with process fluctuation. Acta Physica Sinica, 2011, 60(3): 036601.doi:10.7498/aps.60.036601 |
[10] |
Qu Jiang-Tao, Zhang He-Ming, Wang Guan-Yu, Wang Xiao-Yan, Hu Hui-Yong.Threshold voltage model for quantum-well channelpMOSFET with poly SiGe gate. Acta Physica Sinica, 2011, 60(5): 058502.doi:10.7498/aps.60.058502 |
[11] |
Liu Hong-Xia, Yin Xiang-Kun, Liu Bing-Jie, Hao Yue.Threshold voltage analytic model for strained SiGe-on-insulator p-channel metal-oxide-semiconductor-field-effect-transistor. Acta Physica Sinica, 2010, 59(12): 8877-8882.doi:10.7498/aps.59.8877 |
[12] |
Zhu Zhang-Ming, Zhong Bo, Yang Yin-Tang.An accurate Joule heat model of RLC interconnect based on π equivalent circuit. Acta Physica Sinica, 2010, 59(7): 4895-4900.doi:10.7498/aps.59.4895 |
[13] |
Li Jin, Liu Hong-Xia, Li Bin, Cao Lei, Yuan Bo.Threshold voltage analytical model for strained Si SOI MOSFET with high-k dielectric. Acta Physica Sinica, 2010, 59(11): 8131-8136.doi:10.7498/aps.59.8131 |
[14] |
Zhu Zhang-Ming, Zhong Bo, Hao Bao-Tian, Yang Yin-Tang.A novel temperature-aware distributed interconnect power model. Acta Physica Sinica, 2009, 58(10): 7124-7129.doi:10.7498/aps.58.7124 |
[15] |
Zhang Zhi-Feng, Zhang He-Ming, Hu Hui-Yong, Xuan Rong-Xi, Song Jian-Jun.Threshold voltage model of strained Si channel nMOSFET. Acta Physica Sinica, 2009, 58(7): 4948-4952.doi:10.7498/aps.58.4948 |
[16] |
Tang Xiao-Yan, Zhang Yi-Men, Zhang Yu-Ming.The threshold voltage of SiC Schottky barrier source/drain MOSFET. Acta Physica Sinica, 2009, 58(1): 494-497.doi:10.7498/aps.58.494 |
[17] |
Zhang He-Ming, Cui Xiao-Ying, Hu Hui-Yong, Dai Xian-Ying, Xuan Rong-Xi.Study on threshold voltage model of strained SiGe quantum well channel SOI PMOSFET. Acta Physica Sinica, 2007, 56(6): 3504-3508.doi:10.7498/aps.56.3504 |
[18] |
Li Yan-Ping, Xu Jing-Ping, Chen Wei-Bing, Xu Sheng-Guo, Ji Feng.2-D threshold voltage model for short-channel MOSFET with quantum-mechanical effects. Acta Physica Sinica, 2006, 55(7): 3670-3676.doi:10.7498/aps.55.3670 |
[19] |
Dai Yue-Hua, Chen Jun-Ning, Ke Dao-Ming, Sun Jia-E.An analytical model of MOSFET threshold voltage with considiring the quantum effects. Acta Physica Sinica, 2005, 54(2): 897-901.doi:10.7498/aps.54.897 |
[20] |
Tang Xiao-Yan, Zhang Yi-Men, Zhang Yu-Ming.. Acta Physica Sinica, 2002, 51(4): 771-775.doi:10.7498/aps.51.771 |