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Zhang Guan-Jie, Yang Hao, Zhang Nan.Research progress of the investigation of intrinsic and extrinsic origin of piezoelectric materials by X-ray diffraction. Acta Physica Sinica, 2020, 69(12): 127711.doi:10.7498/aps.69.20200301 |
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Huang Hao, Zhang Kan, Wu Ming, Li Hu, Wang Min-Juan, Zhang Shu-Ming, Chen Jian-Hong, Wen Mao.Comparison between axial residual stresses measured by Raman spectroscopy and X-ray diffraction in SiC fiber reinforced titanium matrix composite. Acta Physica Sinica, 2018, 67(19): 197203.doi:10.7498/aps.67.20181157 |
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Li Xiao-Dong, Li Hui, Li Peng-Shan.High pressure single-crystal synchrotron X-ray diffraction technique. Acta Physica Sinica, 2017, 66(3): 036203.doi:10.7498/aps.66.036203 |
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Xu Xiao-Ming, Miao Wei, Tao Kun.Study on the effect of X-ray diffractometer inherent angle scale error on the precision of lattice parameter calculation. Acta Physica Sinica, 2014, 63(13): 136001.doi:10.7498/aps.63.136001 |
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Pan Hui-Ping, Cheng Feng-Feng, Li Lin, Horng Ray-Hua, Yao Shu-De.Structrual analyses of Ga2+xO3-x thin films grown on sapphire substrates. Acta Physica Sinica, 2013, 62(4): 048801.doi:10.7498/aps.62.048801 |
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Li Jia, Fang Qi, Luo Bing-Chi, Zhou Min-Jie, Li Kai, Wu Wei-Dong.Residual stress analysis by grazing-incidence X-ray diffraction on beryllium films. Acta Physica Sinica, 2013, 62(14): 140701.doi:10.7498/aps.62.140701 |
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Li Yong-Hua, Liu Chang-Sheng, Meng Fan-Ling, Wang Yu-Ming, Zheng Wei-Tao.X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films. Acta Physica Sinica, 2009, 58(4): 2742-2745.doi:10.7498/aps.58.2742 |
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Li Hong-Tao, Luo Yi, Xi Guang-Yi, Wang Lai, Jiang Yang, Zhao Wei, Han Yan-Jun, Hao Zhi-Biao, Sun Chang-Zheng.Thickness measurement of GaN films by X-ray diffraction. Acta Physica Sinica, 2008, 57(11): 7119-7125.doi:10.7498/aps.57.7119 |
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Ming Bao-Quan, Wang Jin-Feng, Zang Guo-Zhong, Wang Chun-Ming, Gai Zhi-Gang, Du Juan, Zheng Li-Mei.X-ray diffraction and phase transition analysis for (K, Na)NbO3-based lead-free piezoelectric ceramics. Acta Physica Sinica, 2008, 57(9): 5962-5967.doi:10.7498/aps.57.5962 |
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Xie Zi-Li, Zhang Rong, Xiu Xiang-Qian, Liu Bin, Zhu Shun-Ming, Zhao Hong, Pu Lin, Han Ping, Jiang Ruo-Lian, Shi Yi, Zheng You-Dou.The oxidation characteristics of InN films. Acta Physica Sinica, 2007, 56(2): 1032-1035.doi:10.7498/aps.56.1032 |
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.Properties of Co nano-films deposited on monocrystalline silicon surface by ion beam sputtering. Acta Physica Sinica, 2007, 56(12): 7158-7164.doi:10.7498/aps.56.7158 |
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Wang Hui, Liu Jin-Fang, He Yan, Chen Wei, Wang Ying, Gerward L., Jiang Jian-Zhong.Size-induced enhancement of bulk modulus and transition pressure of nanocrystalline Ge. Acta Physica Sinica, 2007, 56(11): 6521-6525.doi:10.7498/aps.56.6521 |
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Tan Guo-Tai, Chen Zheng-Hao.XRD analysis on lattice structure of La1-xTexMnO3. Acta Physica Sinica, 2007, 56(3): 1702-1706.doi:10.7498/aps.56.1702 |
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Wang Rui-Min, Chen Guang-De, Zhu You-Zhang.Micro-Raman scattering study of hexagonal InGaN epitaxial layer. Acta Physica Sinica, 2006, 55(2): 914-919.doi:10.7498/aps.55.914 |
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Liu Guo-Han, Ding Yi, Zhu Xiu-Hong, Chen Guang-Hua, He De-Yan.Preparation and characterization of hydrogenated microcrystalline silicon films by HW-MWECR-CVD. Acta Physica Sinica, 2006, 55(11): 6147-6151.doi:10.7498/aps.55.6147 |
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Qin Pei, Lou Yu-Wan, Yang Chuan-Zheng, Xia Bao-Jia.New computing methods and programs for separating multipe-broadening effects of X-ray diffraction lines. Acta Physica Sinica, 2006, 55(3): 1325-1335.doi:10.7498/aps.55.1325 |
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Sun Guang-Ai, Chen Bo, Du Hong-Lin.Anomalous thermal expansion of R(Fe, Mo)12 compounds. Acta Physica Sinica, 2005, 54(9): 4240-4244.doi:10.7498/aps.54.4240 |
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Yan Wen-Sheng, Yin Shi-Long, Fan Jiang-Wei, Li Yu-Zhi, Liu Wen-Han, Hao Lu-Yuan, Pan Zhi-Yun, Wei Shi-Qiang.Structural transition of Fe80Cu20 alloy induced by annealing. Acta Physica Sinica, 2005, 54(12): 5707-5712.doi:10.7498/aps.54.5707 |
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Du Xiao-Song, S. Hak, O. C. Rogojanu, T. Hibma.X-ray study of chromium oxide films epitaxially grown on MgO. Acta Physica Sinica, 2004, 53(10): 3510-3514.doi:10.7498/aps.53.3510 |
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Hao Yan-Ming, Zhao Wei, Gao Yan.Structure and Curie temperature of Y2(Fe1-x-y,Coy,Crx)17 compounds. Acta Physica Sinica, 2003, 52(10): 2612-2615.doi:10.7498/aps.52.2612 |
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