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Wang Bi-Han, Li Bing, Liu Xu-Qiang, Wang Hao, Jiang Sheng, Lin Chuan-Long, Yang Wen-Ge.Millisecond time-resolved synchrotron radiation X-ray diffraction and high-pressure rapid compression device and its application. Acta Physica Sinica, 2022, 71(10): 100702.doi:10.7498/aps.71.20212360 |
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Zhao Chang-Zhe, Si Shang-Yu, Zhang Hai-Peng, Xue Lian, Li Zhong-Liang, Xiao Ti-Qiao.Beam splitting characteristics of crystal X-ray Laue diffraction. Acta Physica Sinica, 2022, 71(4): 046101.doi:10.7498/aps.71.20211674 |
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Zhang Bing-Po, Cai Chun-Feng, Cai Xi-Kun, Wu Hui-Zhen, Wang Miao.Study of growth of [111]-oriented CdTe thin films by MBE. Acta Physica Sinica, 2012, 61(4): 046802.doi:10.7498/aps.61.046802 |
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Ding Zhao, Wei Jun, Yang Zai-Rong, Luo Zi-Jiang, He Ye-Quan, Zhou Xun, He Hao, Deng Chao-Yong.Study on temperature calibration and surface phase transition of GaAs crystal substrate in MBE growth by RHEED real-time monitoring. Acta Physica Sinica, 2011, 60(1): 016109.doi:10.7498/aps.60.016109 |
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Yan Fen, Zhang Ji-Chao, Li Ai-Guo, Yang Ke, Wang Hua, Mao Cheng-Wen, Liang Dong-Xu, Yan Shuai, Li Jiong, Yu Xiao-Han.Fast scanning X-ray microprobe fluorescence imaging based on synchrotron radiation. Acta Physica Sinica, 2011, 60(9): 090702.doi:10.7498/aps.60.090702 |
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Du Xiao-Song, S. Hak, O. C. Rogojanu, T. Hibma.X-ray study of chromium oxide films epitaxially grown on MgO. Acta Physica Sinica, 2004, 53(10): 3510-3514.doi:10.7498/aps.53.3510 |
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YUAN JIN-SHE, CHEN GUANG-DE, QI MING, LI AI-ZHEN, XU ZHUO.XPS AND AES INVESTIGATION OF GaN FILMS GROWN BY MBE. Acta Physica Sinica, 2001, 50(12): 2429-2433.doi:10.7498/aps.50.2429 |
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GUI QIAN, HUANG QI, CHEN HONG, ZHOU JUN-MING.Si AND GexSi1-x GROWTH MODE STUDY BY RHEED ON H-TERMINATED VICINAL Si SUBSTRATE. Acta Physica Sinica, 1996, 45(4): 647-654.doi:10.7498/aps.45.647 |
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LU FANG, GONG DA-WEI, SUN HENG-HUI.A STUDY OF THE INTERFACIAL DEFECTS IN MOLECULAR BEAM EPITAXIAL SILICON. Acta Physica Sinica, 1994, 43(7): 1129-1136.doi:10.7498/aps.43.1129 |
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YUAN JIAN, LU FANG, SUN HENG-HUI, WEI XING, YANG MIN, HUANG DA-MING, XU HONG-LAI, SHEN HONG-LIE, ZOU SHI-CHANG.STUDY OF ELECTRICAL PROPERTIES OF HEAVILY BORON DOPED Si EPILAYER AFTER RAPID THERMAL ANNEALING. Acta Physica Sinica, 1994, 43(7): 1137-1143.doi:10.7498/aps.43.1137 |
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ZHOU GUO-LIANG, SHENG CHI, FAN YONG-LIANG, JIANG WEI-DONG, YU MING-RBN.MOLECULAR BEAM EPITAXY GROWTH AND CHARACTERI-ZATION OF GexSi1-x/Si STRAINED-LAYER SUPERLATTICES. Acta Physica Sinica, 1993, 42(7): 1121-1128.doi:10.7498/aps.42.1121-2 |
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Zhou Guo-liang Sheng Chi Fan Yong-liang Jiang Wei-dong Yu Ming-reng.MOLECULAR BEAM EPITAXY GROWTH AND CHARACTERIZATION OF Ge_xSi_1-x_/Si STRAINED一AYER SUPERLATTICES. Acta Physica Sinica, 1991, 40(7): 1121-1128.doi:10.7498/aps.40.1121 |
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ZHANG JIAN-ZHONG, CAO YAN-NI.SIMULATION STUDY OF DIVERGENT BEAM X-RAY DIFFRACTION BY CRYSTALS. Acta Physica Sinica, 1990, 39(1): 124-128.doi:10.7498/aps.39.124 |
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TIAN LIANG-GUANG, LIU XIANG-LIN, XU SHUN-SHENG, HAN XIAO-XI.X RAY DOUBLE CRYSTAL DIFFRACTION STUDY OF (BiTm)3(FeGa)5O12 MAGNETIC GARNET FILMS GROWN BY LIQUID PHASE EPITAXY. Acta Physica Sinica, 1989, 38(10): 1704-1709.doi:10.7498/aps.38.1704 |
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JIANG XIAO-MING, JIANG ZUI-MIN, LIU WEN-HAN, WU ZI-QIN.THE EFFECT OF ANNEALING ON THE X-RAY DIFFRACTION OF W/C PERIODIC MULTILAYERS. Acta Physica Sinica, 1988, 37(11): 1893-1899.doi:10.7498/aps.37.1893 |
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GUO CHANG-LIN.DIFFRACTION GEOMETRY OF MONOCHROMATIC X RAY QUADRUPLE FOCUSING CAMERA. Acta Physica Sinica, 1980, 29(9): 1217-1221.doi:10.7498/aps.29.1217 |
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